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SCANPSC110FSC

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P25
www.fairchildsemi.com 16
SCANPSC110F
Special Features (Continued)
This moves the local chain TAP Controllers to the synchro-
nization state (Run-Test/Idle), where they stay until syn-
chronization occurs. If the next state of the SCANPSC110F
TAP Controller is Run-Test/Idle, TMS
L
is connected to
TMS
B
and the local TAP Controllers are synchronized to
the SCANPSC110F TAP Controller as shown in Figure 12.
If the next state after Update-IR were Select-DR, TMS
L
would remain LOW and synchronization would not occur
until the SCANPSC110F TAP Controller entered the Run-
Test/Idle state, as shown in Figure 11.
Each local port has its own Local Scan Port Controller. This
is necessary because the LSPN can be configured in any
one of eight (8) possible combinations. Either one, some,
or all of the local ports can be accessed simultaneously.
Configuring the LSPN is accomplished with the mode reg-
ister, in conjunction with the UNPARK instruction.
The LSPN can be unparked in one of seven different con-
figurations, as specified by bits 0-2 of the mode register.
Using multiple ports presents not only the task of synchro-
nizing the SCANPSC110F TAP Controller with the TAP
Controllers of an individual local port, but also of synchro-
nizing the individual local ports to one another.
When multiple local ports are selected for access, it is pos-
sible that two ports are parked in different states. This
could occur when previous operations accessed the two
ports separately and parked them in the two different
states. The LSP Controllers handle this situation gracefully.
Figure 12 shows the UNPARK instruction being used to
access LSP
1
, LSP
2
, and LSP
3
in series (mode register =
“XXX0X111” binary). LSP
1
and LSP
2
become active as the
SCANPSC110F controller is sequenced through the Run-
Test/Idle state. LSP
3
remains parked in the Pause-DR
state until the SCANPSC110F TAP Controller is sequenced
through the Pause-DR state. At that point, all three local
ports are synchronized for access via the active scan
chain.
FIGURE 12. Synchronization of the Three Local Scan Ports (LSP
1
, LSP
2
, and LSP
3
)
17 www.fairchildsemi.com
SCANPSC110F
Absolute Maximum Ratings(Note 5) Recommended Operating
Conditions
Note 5: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, with-
out exception, to ensure that the system design is reliable over its power
supply temperature, and output/input loading variables. Fairchild does not
recommended operation of SCAN outside of recommended operation con-
ditions.
DC Electrical Characteristics
Supply Voltage (V
CC
) −0.5V to +7.0V
DC Input Diode Current (I
IL
)
V
I
= −0.5V −20 mA
V
I
= V
CC
+0.5V +20 mA
DC Input Voltage (V
I
) −0.5V to V
CC
+0.5V
DC Output Diode Current (I
OK
)
V
O
= −0.5V −20 mA
V
O
= V
CC
+0.5V +20 mA
DC Output Voltage (V
O
) −0.5V to V
CC
+0.5V
DC Output Source/Sink Current (I
O
) ±50 mA
DC V
CC
or Ground Current
per Output Pin
±50 mA
DC Latchup Source or Sink Current
±300 mA
Junction Temperature
+140°C
Storage Temperature
−65°C to +150°C
ESD Last Passing Voltage (Min) 4000V
Supply Voltage (V
CC
) 4.5V to 5.5V
Input Voltage (V
I
)0V to V
CC
Output Voltage (V
O
)0V to V
CC
Operating Temperature (T
A
) −40°C to +85°C
Minimum Input Edge Rate
∆V/∆t
SCAN “F” Series Devices 125 mV/ns
V
IN
from 0.8V to 2.0V
V
CC
@ 4.5V, 5.5V
Symbol Parameter
V
CC
T
A
= 25°CT
A
= −40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
IH
Minimum HIGH 4.5 1.5 2.0 2.0
V
V
OUT
= 0.1V or
Input Voltage 5.5 1.5 2.0 2.0 V
CC
−0.1V
V
IL
Maximum LOW 4.5 1.5 0.8 0.8
V
V
OUT
= 0.1V or
Input Voltage 5.5 1.5 0.8 0.8 V
CC
−0.1V
V
OH
Minimum HIGH 4.5 4.49 4.4 4.4
V
I
OUT
= −50 µA
(TCK
Ln
, TMS
Ln
, TDO
Ln
) Output Voltage 5.5 5.49 5.4 5.4 V
IN
(TDI
B
, TMS
B
, TCK
B
) = V
IH
V
OH
Minimum HIGH 4.5 3.86 3.76 I
OUT
= −24 mA
(TCK
Ln
, TMS
Ln
, TDO
Ln
) Output Voltage 5.5 4.86 4.76 V V
IN
on S
(0-5)
and TDl
(1–3)
= V
IH
, V
IL
All Outputs Loaded
V
OH
Minimum HIGH 4.5 3.15 3.15
VI
OUT
= −50 µA
(TDO
B
) Output Voltage 5.5 4.15 4.15
V
OH
Minimum HIGH 4.5 2.4 2.4
V
I
OUT
= −32 mA
(TDO
B
) Output Voltage 5.5 2.4 2.4 All Outputs Loaded
V
OH
Minimum HIGH 4.5 2.4
V
I
OUT
= −24 mA
(TDO
B
) Output Voltage 5.5 2.4 All Outputs Loaded
V
OL
Maximum LOW 4.5 0.001 0.1 0.1
V
I
OUT
= +50 µA
(TCK
Ln
,TMS
Ln
, TDO
Ln
) Output Voltage 5.5 0.001 0.1 0.1 V
IN
(TDI
B
, TMS
B
, TCK
B
) = V
IL
V
OL
Maximum LOW 4.5 0.36 0.44 I
OUT
= +24 mA
(TCK
Ln
,TMS
Ln
, TDO
Ln
) Output Voltage 5.5 0.36 0.44 V V
IN
on S
(0–5)
and TDI
(1–3)
= V
IH
, V
IL
All Outputs Loaded
V
OL
Maximum LOW 4.5 0.1 0.1
VI
OUT
= +50 µA
(TDO
B
) Output Voltage 5.5 0.1 0.1
V
OL
Maximum LOW 4.5 0.55
V
I
OUT
= +48 mA
(TDO
B
) Output Voltage 5.5 0.55 All Outputs Loaded
V
OL
Maximum LOW 4.5 0.55 0.55
V
I
OUT
= +64 mA
(TDO
B
) Output Voltage 5.5 0.55 0.55 All Outputs Loaded
I
IN
(OE, Maximum Input
5.5 ±0.1 ±1.0 µA
V
IN
= V
CC
or
TCK
B
,S
(0–5)
) Leakage Current V
IN
= GND
I
IN, MAX
Maximum Input
5.5 2.8 3.6 µAV
IN
= V
CC
(TRST, TDI
Ln
, TDI
B
, TMS
B
) Leakage Current
I
IN, MAX
Maximum Input
5.5 −385 −385 µAV
IN
= GND
(TRST, TDI
Ln
, TDI
B
, TMS
B
) Leakage Current
www.fairchildsemi.com 18
SCANPSC110F
DC Electrical Characteristics (Continued)
Note 6: Maximum test duration of 2 ms. One output loaded at a time.
Note 7: Maximum test duration not to exceed 1 second.
Noise Specifications
Note 8: Maximum number of outputs that can switch simultaneously is n. (n−1) outputs are switched LOW and one output held LOW.
Note 9: Maximum number of outputs that can switch simultaneously is n. (n−1) outputs are switched HIGH and one output held HIGH.
Note 10: Maximum number of data inputs (n) switching. (n−1) input switching 0V to 3V. Input under test switching 3V to threshold (V
ILD
).
Symbol Parameter
V
CC
T
A
= 25°CT
A
= −40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
I
IN, MIN
Minimum Input
5.5 −160 −160 µAV
IN
= GND
(TDI
B
, TMS
B
, TRST, TDI
Ln
) Leakage Current
I
CCT
Maximum I
CC
/Input 5.5 0.6 1.5 mA V
IN
= V
CC
−2.1V
I
CCT
Maximum I
CC
/Input
5.5 0.6 1.65 mA
V
IN
= V
CC
−2.1V
(TDI
B
, TMS
B
, TRST, TDI
L
) Test one at a time with others floating
I
CC
Maximum Quiescent
5.5 16 88 µA
TDI
B
, TMS
B
, TRST,
Supply Current TDI
L
= V
CC
I
CC, MAX
Maximum Quiescent
5.5 2.35 2.4 mA
TDI
B
, TMS
B
, TRST,
Supply Current TDI
L
= GND
I
OLD
Minimum Dynamic
5.5 75 mA
V
OLD
= 1.65V max
(TCK
Ln
, TMS
Ln
, TDO
Ln
) Output Current V
IN
(OE) = V
IL
(Note 6)
I
OLD
Minimum Dynamic
5.5 94 94 mA
V
OLD
= 0.8V
(TDO
B
) Output Current V
IN
(TRST) = V
IH
(Note 6)
I
OHD
Minimum Dynamic
5.5 −75 mA
V
OHD
= 3.85V max
(TCK
Ln
, TMS
Ln
, TDO
Ln
) Output Current (Note 6)
I
OHD
Minimum Dynamic
5.5 −40 −40 mA
V
OHD
= 2.0V max
(TDO
B
) Output Current (Note 6)
I
OZ
Maximum 3-STATE V
IN
(OE) = V
IH
Leakage Current 5.5 ±0.5 ±5.0 µAV
IN
(TRST) = V
IL
V
O
= V
CC
, GND
I
OS
Output Short
5.5 −100 −100
mA V
O
= 0.0V
(TDO
B
) Circuit Current min (Note 7)
Symbol Parameter
V
CC
T
A
= +25°CT
A
= −40°C to +85°C
Units Conditions
(V) Type Guaranteed Limits
V
OLP
Quiet Output Figure 14
Maximum Dynamic 5.0 0.3 0.6 V (Note 8)
V
OL
V
OLV
Quiet Output Figure 14
Minimum Dynamic 5.0 0.3 −0.6 V (Note 8)
V
OL
V
OHP
Quiet Output Figure 14
Maximum Dynamic 5.0 V
OH
+ 0.5 V
OH
+ 1.0 V (Note 9)
V
OH
V
OHV
Quiet Output Figure 14
Minimum Dynamic 5.0 V
OH
− 0.7 V
OH
− 1.2 V (Note 9)
V
OH
V
IHD
Minimum HIGH
Dynamic Input 5.5 1.9 2.2 2.2 V (Note 10)
Voltage Level
V
ILD
Maximum LOW
Dynamic Input 5.5 1.4 0.8 0.8 V (Note 10)
Voltage Level
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SCANPSC110FSC

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Manufacturer:
ON Semiconductor / Fairchild
Description:
Specialty Function Logic SCAN JTAG Port
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