R8C/1A Group, R8C/1B Group 5. Electrical Characteristics
Rev.1.40 Dec 08, 2006 Page 26 of 45
REJ03B0144-0140
NOTES:
1. V
CC = 2.7 to 5.5 V at Topr = 0 to 60 °C, unless otherwise specified.
2. Definition of programming/erasure endurance
The programming and erasure endurance is defined on a per-block basis.
If the programming and erasure endurance is n (n = 100 or 10,000), each block can be erased n times. For example, if 1,024
1-byte writes are performed to block A, a 1 Kbyte block, and then the block is erased, the programming/erasure endurance
still stands at one. However, the same address must not be programmed more than once per erase operation (overwriting
prohibited).
3. Endurance to guarantee all electrical characteristics after program and erase. (1 to Min. value can be guaranteed).
4. If emergency processing is required, a suspend request can be generated independent of this characteristic. In that case the
normal time delay to suspend can be applied to the request. However, we recommend that a suspend request with an
interval of less than 650 µs is only used once because, if the suspend state continues, erasure cannot operate and the
incidence of erasure error rises.
5. In a system that executes multiple programming operations, the actual erasure count can be reduced by writing to sequential
addresses in turn so that as much of the block as possible is used up before performing an erase operation. For example,
when programming groups of 16 bytes, the effective number of rewrites can be minimized by programming up to 128 groups
before erasing them all in one operation. In addition, averaging the number of erase operations between block A and block B
can further reduce the effective number of rewrites. It is also advisable to retain data on the erase count of each block and
limit the number of erase operations to a certain number.
6. If an error occurs during block erase, attempt to execute the clear status register command, then execute the block erase
command at least three times until the erase error does not occur.
7. Customers desiring programming/erasure failure rate information should contact their Renesas technical support
representative.
8. The data hold time includes time that the power supply is off or the clock is not supplied.
Table 5.4 Flash Memory (Program ROM) Electrical Characteristics
Symbol Parameter Conditions
Standard
Unit
Min. Typ. Max.
Program/erase endurance
(2)
R8C/1A Group
100
(3)
−−times
R8C/1B Group
1,000
(3)
−−times
Byte program time 50 400 µs
Block erase time 0.4 9 s
t
d(SR-SUS) Time delay from suspend request until
suspend
−−97+CPU clock
× 6 cycles
µs
Interval from erase start/restart until
following suspend request
650 −−µs
Interval from program start/restart until
following suspend request
0 −−ns
Time from suspend until program/erase
restart
−−3+CPU clock
× 4 cycles
µs
Program, erase voltage 2.7 5.5 V
Read voltage 2.7 5.5 V
Program, erase temperature 0 60 °C
Data hold time
(8)
Ambient temperature = 55 °C20 −−year
R8C/1A Group, R8C/1B Group 5. Electrical Characteristics
Rev.1.40 Dec 08, 2006 Page 27 of 45
REJ03B0144-0140
NOTES:
1. V
CC = 2.7 to 5.5 V at Topr = 20 to 85 °C / 40 to 85 °C, unless otherwise specified.
2. Definition of programming/erasure endurance
The programming and erasure endurance is defined on a per-block basis.
If the programming and erasure endurance is n (n = 100 or 10,000), each block can be erased n times. For example, if 1,024
1-byte writes are performed to block A, a 1 Kbyte block, and then the block is erased, the programming/erasure endurance
still stands at one. However, the same address must not be programmed more than once per erase operation (overwriting
prohibited).
3. Endurance to guarantee all electrical characteristics after program and erase. (1 to Min. value can be guaranteed).
4. If emergency processing is required, a suspend request can be generated independent of this characteristic. In that case the
normal time delay to suspend can be applied to the request. However, we recommend that a suspend request with an
interval of less than 650 µs is only used once because, if the suspend state continues, erasure cannot operate and the
incidence of erasure error rises.
5. In a system that executes multiple programming operations, the actual erasure count can be reduced by writing to sequential
addresses in turn so that as much of the block as possible is used up before performing an erase operation. For example,
when programming groups of 16 bytes, the effective number of rewrites can be minimized by programming up to 128 groups
before erasing them all in one operation. It is also advisable to retain data on the erase count of each block and limit the
number of erase operations to a certain number.
6. If an error occurs during block erase, attempt to execute the clear status register command, then execute the block erase
command at least three times until the erase error does not occur.
7. Customers desiring programming/erasure failure rate information should contact their Renesas technical support
representative.
8. -40 °C for D version.
9. The data hold time includes time that the power supply is off or the clock is not supplied.
Table 5.5 Flash Memory (Data flash Block A, Block B) Electrical Characteristics
Symbol Parameter Conditions
Standard
Unit
Min. Typ. Max.
Program/erase endurance
(2)
10,000
(3)
−−times
Byte program time
(Program/erase endurance 1,000 times)
50 400 µs
Byte program time
(Program/erase endurance > 1,000 times)
65 −µs
Block erase time
(Program/erase endurance 1,000 times)
0.2 9 s
Block erase time
(Program/erase endurance > 1,000 times)
0.3 s
t
d(SR-SUS) Time Delay from suspend request until
suspend
−−97+CPU clock
× 6 cycles
µs
Interval from erase start/restart until
following suspend request
650 −−µs
Interval from program start/restart until
following suspend request
0 −−ns
Time from suspend until program/erase
restart
−−3+CPU clock
× 4 cycles
µs
Program, erase voltage 2.7 5.5 V
Read voltage 2.7 5.5 V
Program, erase temperature
-20
(8)
85 °C
Data hold time
(9)
Ambient temperature = 55 °C20 −−year
R8C/1A Group, R8C/1B Group 5. Electrical Characteristics
Rev.1.40 Dec 08, 2006 Page 28 of 45
REJ03B0144-0140
Figure 5.2 Transition Time to Suspend
NOTES:
1. The measurement condition is V
CC = 2.7 V to 5.5 V and Topr = -40°C to 85 °C.
2. Necessary time until the voltage detection circuit operates when setting to 1 again after setting the VCA26 bit in the VCA2
register to 0.
3. Ensure that V
det2 > Vdet1.
NOTES:
1. The measurement condition is V
CC = 2.7 V to 5.5 V and Topr = -40°C to 85 °C.
2. Time until the voltage monitor 2 interrupt request is generated after the voltage passes V
det2.
3. Necessary time until the voltage detection circuit operates when setting to 1 again after setting the VCA27 bit in the VCA2
register to 0.
4. Ensure that V
det2 > Vdet1.
Table 5.6 Voltage Detection 1 Circuit Electrical Characteristics
Symbol Parameter Condition
Standard
Unit
Min. Typ. Max.
V
det1
Voltage detection level
(3)
2.70 2.85 3.00 V
Voltage detection circuit self power consumption VCA26 = 1, V
CC = 5.0 V 600 nA
t
d(E-A) Waiting time until voltage detection circuit operation
starts
(2)
−−100 µs
Vccmin MCU operating voltage minimum value 2.7 −−V
Table 5.7 Voltage Detection 2 Circuit Electrical Characteristics
Symbol Parameter Condition
Standard
Unit
Min. Typ. Max.
V
det2
Voltage detection level
(4)
3.00 3.30 3.60 V
Voltage monitor 2 interrupt request generation time
(2)
40 −µs
Voltage detection circuit self power consumption VCA27 = 1, V
CC = 5.0 V 600 nA
t
d(E-A) Waiting time until voltage detection circuit operation
starts
(3)
−−100 µs
FMR46
Suspend request
(maskable interrupt request)
Fixed time (97 µs)
td(SR-SUS)
Clock-
dependent time
Access restart

R5F211A2DSP#U0

Mfr. #:
Manufacturer:
Renesas Electronics
Description:
16-bit Microcontrollers - MCU MCU 3/5V 8K I-Temp Pb-Free 20-SSOP
Lifecycle:
New from this manufacturer.
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