Data Sheet ADIS16240
Rev. C | Page 3 of 20
SPECIFICATIONS
T
A
= 25°C, V
DD
= 2.4 V to 3.6 V unless otherwise noted.
Table 1.
Parameter Conditions Axis Min Typ Max Unit
ACCELEROMETER
Dynamic Range ±16 ±19 g
Initial Sensitivity 51.4 mg/LSB
Sensitivity Temperature Coefficient 40°C to +85°C ±0.01 %
Sensitivity Change with Supply Voltage 2.4 V < V
DD
< 3.6 V X, Y 6 %
Nonlinearity
±2
% FS
Sensor-to-Sensor Alignment Error ±0.1 Degrees
Cross-Axis Sensitivity ±1 %
Initial Bias Error 2.7 +2.7 g
Bias Temperature Coefficient ±1 mg/°C
Output Noise
24
m
g
rms
Noise Density 480
µg/
Hz
Bandwidth No external capacitance X, Y 1600 Hz
No external capacitance Z 550 Hz
Sensor Resonant Frequency
5.5
kHz
Self-Test Change in Output Response X 10 21 39 LSB
Y +10 +21 +39 LSB
Z +10 +36 +65 LSB
TEMPERATURE SENSOR SCALE FACTOR TEMP_OUT = 0x0133 (307) at 25°C 0.244 °C/LSB
ADC INPUT
Input Range 0 V
DD
V
Resolution 10 Bits
Integral Nonlinearity, INL ±1 ±2 LSB
Differential Nonlinearity, DNL ±1 ±1.25 LSB
Offset Error ±1 ±2 LSB
Gain Error ±1 ±3 LSB
Input Capacitance 11 pF
LOGIC INPUTS
1
Input High Voltage, V
INH
2.0
V
Input Low Voltage, V
INL
0.8 V
Logic 1 Input Current, I
INH
V
IH
= V
DD
±0.2 ±1 µA
Logic 0 Input Current, I
INL
V
IL
= 0 V −40 −60 μA
Input Capacitance, C
IN
10 pF
DIGITAL OUTPUTS
Output High Voltage, V
OH
I
SOURCE
= 1.6 mA 2.4 V
Output Low Voltage, V
OL
I
SINK
= 1.6 mA 0.4 V
START-UP TIME
Initial, Reset Recovery 32 ms
FLASH MEMORY
Endurance
2
10,000 Cycles
Data Retention
3
T
J
= 85°C 20 Years
CONVERSION RATE SETTING
4096
SPS
POWER SUPPLY 2.4 3.6 V
Average Supply Current
4
SMPL_PRD = 0x1F, V
DD
= 2.5 V 1 mA
Sleep Mode Current 100 µA
1
Note that the inputs are 5 V tolerant.
2
Endurance is qualified as per JEDEC Standard 22, Method A117 and measured at 40°C, +25°C, +85°C, and +10C.
3
Retention lifetime equivalent at junction temperature (T
J
) of 55°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.
4
Instantaneous current has periodic peaks at the sample rate that can reach 30 mA.
ADIS16240 Data Sheet
Rev. C | Page 4 of 20
TIMING SPECIFICATIONS
T
A
= 25°C, V
DD
= 3.3 V, unless otherwise noted.
Table 2.
Parameter Description Min
1
Typ Max
1
Unit
f
SCLK
Serial clock rate
2
0.01 2.5 MHz
t
DATARATE
Chip select period
2
60 μs
t
CS
Chip select to clock edge 120 ns
t
DAV
Data output valid after SCLK edge 30 ns
t
DSU
Data input setup time before SCLK rising edge 20 ns
t
DHD
Data input hold time after SCLK rising edge 20 ns
t
DF
Data output fall time 10 25 ns
t
DR
Data output rise time 10 25 ns
t
SFS
CS
high after SCLK edge
430 ns
1
Guaranteed by design; typical specifications are not tested or guaranteed.
2
Based on sample rate selection.
Timing Diagrams
CS
S
CL
K
t
DATARATE
08133-002
Figure 2. SPI Chip Select Timing
CS
SCLK
DOUT
DIN
1 2 3 4 5 6 15 16
W/R A5A6 A4 A3 A2
D2
MSB DB14
D1 LSB
DB13 DB12 DB10DB11 DB2 LSBDB1
t
CS
t
SFS
t
DAV
t
DHD
t
DSU
08133-003
Figure 3. SPI Timing (Utilizing SPI Settings Typically Identified as Phase = 1, Polarity = 1)
Data Sheet ADIS16240
Rev. C | Page 5 of 20
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter
Rating
Acceleration
Any Axis, Unpowered 2000 g
Any Axis, Powered 2000 g
VDD to GND −0.3 V to +3.6 V
Digital Input Voltage to GND −0.3 V to V
DD
+ 0.3 V
Analog Inputs to GND −0.3 V to V
DD
+ 0.3 V
Operating Temperature Range −40°C to +85°C
Storage Temperature Range
−65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION

ADIS16240ABCZ

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Accelerometers Low Pwr Prgm Impact Sensor & Recorder
Lifecycle:
New from this manufacturer.
Delivery:
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