FDMS3660S
www.onsemi.com
13
Following is a guideline, not a requirement which the
PCB designer should consider:
1. Input ceramic bypass capacitors C1 and C2 must
be placed close to the D1 and S2 pins of Power
Stage to help reduce parasitic inductance and high
frequency conduction loss induced by switching
operation. C1 and C2 show the bypass capacitors
placed close to the part between D1 and S2. Input
capacitors should be connected in parallel close to
the part. Multiple input caps can be connected
depending upon the application.
2. The PHASE copper trace serves two purposes; In
addition to being the current path from the Power
Stage package to the output inductor (L), it also
serves as heat sink for the lower FET in the Power
Stage package. The trace should be short and wide
enough to present a low resistance path for the
high current flow between the Power Stage and the
inductor. This is done to minimize conduction
losses and limit temperature rise. Please note that
the PHASE node is a high voltage and high
frequency switching node with high noise
potential. Care should be taken to minimize
coupling to adjacent traces. The reference layout
in Figure 31 shows a good balance between the
thermal and electrical performance of Power
Stage.
3. Output inductor location should be as close as
possible to the Power Stage device for lower
power loss due to copper trace resistance. A
shorter and wider PHASE trace to the inductor
reduces the conduction loss. Preferably the Power
Stage should be directly in line (as shown in
Figure 31) with the inductor for space savings and
compactness.
4. The PowerTrench
Technology MOSFETs used in
the Power Stage are effective at minimizing phase
node ringing. It allows the part to operate well
within the breakdown voltage limits. This
eliminates the need to have an external snubber
circuit in most cases. If the designer chooses to use
an RC snubber, it should be placed close to the
part between the PHASE pad and S2 pins to
dampen the high−frequency ringing.
5. The driver IC should be placed close to the Power
Stage part with the shortest possible paths for the
High Side gate and Low Side gates through a wide
trace connection. This eliminates the effect of
parasitic inductance and resistance between the
driver and the MOSFET and turns the devices on
and off as efficiently as possible. At
higher−frequency operation this impedance can
limit the gate current trying to charge the
MOSFET input capacitance. This will result in
slower rise and fall times and additional switching
losses. Power Stage has both the gate pins on the
same side of the package which allows for back
mounting of the driver IC to the board. This
provides a very compact path for the drive signals
and improves efficiency of the part.
6. S2 pins should be connected to the GND plane
with multiple vias for a low impedance grounding.
Poor grounding can create a noise transient offset
voltage level between S2 and driver ground. This
could lead to faulty operation of the gate driver
and MOSFET.
7. Use multiple vias on each copper area to
interconnect top, inner and bottom layers to help
smooth current flow and heat conduction. Vias
should be relatively large, around 8 mils to
10 mils, and of reasonable inductance. Critical
high frequency components such as ceramic
bypass caps should be located close to the part and
on the same side of the PCB. If not feasible, they
should be connected from the backside via a
network of low inductance vias.
FDMS3660S
www.onsemi.com
14
PACKAGE DIMENSIONS
PQFN8 5X6, 1.27P
CASE 483AJ
ISSUE O
3.16
2.80
C
L
L
C
PKG
PKG
5.10
4.90
6.25
5.90
C
3.81
1.02
0.82
TOP VIEW
SIDE VIEW
BOTTOM VIEW
1
4
8
5
123
4
8
0.10 C A B
0.05 C
2.25
2.05
5
0.65
0.38
(SCALE: 2X)
0.05
0.00
0.35
0.15
0.08 C
SEATING
PLANE
0.10 C
1.10
0.90
RECOMMENDED LAND PATTERN
0.65 TYP
1
2
3
4
5
6
7
8
1.27
1.34
1.12
A
0.10 C
(2X)
B
0.10
C
(2X)
0.00
0.00
1.60
2.52
1.21
2.31
1.18
1.27 TYP
2.00
2.15
0.63
0.63
0.59
3.18
4.00
C
L
C
L
0.65
0.38
2.13
3.15
0.45
0.25
0.70
0.36
4.08
3.70
0.44
0.24
(6X)
0.66±.05
4.16
0.61
0.31
KEEP OUT AREA
8X
PIN # 1
INDICATOR
5.10
SEE
DETAIL A
(8X)
FOR SAWN / PUNCHED TYPE
76
FDMS3660S
www.onsemi.com
15
PACKAGE DIMENSIONS
PQFN8 5X6, 1.27P
CASE 483AJ
ISSUE O
(SCALE: 2X)
0.35
0.15
0.28
0.08
10°
NOTES: UNLESS OTHERWISE SPECIFIED
A) PACKAGE STANDARD REFERENCE:
JEDEC REGISTRATION, MO*240, VARIATION AA.
B) ALL DIMENSIONS ARE IN MILLIMETERS.
C) DIMENSIONS DO NOT INCLUDE BURRS OR
MOLD FLASH. MOLD FLASH OR BURRS DOES
NOT EXCEED 0.10MM.
D) DIMENSIONING AND TOLERANCING PER
ASME Y14.5M−1994.
E) IT IS RECOMMENDED TO HAVE NO TRACES
OR VIAS WITHIN THE KEEP OUT AREA.
C
L
L
C
PKG
PKG
5.10
4.90
6.25
5.90
C
3.16
2.80
3.81
1.02
0.82
TOP VIEW
SIDE VIEW
1
4
8
5
1
4
87
6
0.10 C A B
0.05 C
5
0.65
0.38
SEE
DETAIL B
1.27
0.66±.05
1.34
1.12
(2X)
(2X)
0.65
0.38
0.45
0.25
0.70
0.36
4.08
3.70
0.44
0.24
(6X)
5.00
4.80
5.90
5.70
0.41
0.21
(8X)
2.25
2.05
0.61
0.31
0.10 C
1.10
0.90
0.35
0.15
SEATING
PLANE
8X
SEE
DETAIL C
(SCALE: 2X)
BOTTOM VIEW
(8X)
0.10
C
0.10 C
0.08 C
23

FDMS3660S

Mfr. #:
Manufacturer:
ON Semiconductor / Fairchild
Description:
MOSFET PowerStage Dual N-Ch PowerTrench MOSFET
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet