Performance
Measured performance can vary for a number of reasons. The major factors affecting
drive performance are the capacity of the drive and the interface of the host. Addition-
ally, overall system performance can affect the measured drive performance. When
comparing drives, it is recommended that all system variables are the same, and only
the drive being tested varies.
Performance numbers will vary depending on the host system configuration.
For SSDs designed for the client computing market, Micron specifies performance in
fresh-out-of-box (FOB) state. Data throughput measured in steady state may be lower
than FOB state, depending on the nature of the data workload.
For a description of these performance states and of Micron's best practices for per-
formance measurement, refer to Micron's technical marketing brief, Best Practices for
SSD Performance Measurement.
Table 1: Drive Performance
Capacity 256GB 512GB 1024GB 2048GB
UnitInterface Speed 6 Gb/s
PCMark vantage 84,000 84,000 84,000 84,000 HDD score
Sequential read (128KB transfer) 530 530 530 530 MB/s
Sequential write (128KB transfer) 500 500 500 500 MB/s
Random read (4KB transfer) 55,000 92,000 92,000 92,000 IOPS
Random write (4KB transfer) 83,000 83,000 83,000 83,000 IOPS
READ latency (TYP) 85 85 85 85 µs
WRITE latency (TYP) 40 40 40 40 µs
Notes:
1. Performance numbers are maximum values, except as noted.
2. Typical I/O performance numbers as measured using Iometer with a queue depth of 32
and write cache enabled. Fresh-out-of-box (FOB) state is assumed. For performance
measurement purposes, the SSD may be restored to FOB state using the SECURE ERASE
command.
3. Iometer measurements are performed on an 20GB span of logical block addresses
(LBAs).
4. 4KB transfers with a queue depth of 1 are used to measure READ/WRITE latency values
with write cache enabled.
5. System variations will affect measured results. For comparison, PCMark scores are meas-
ured with the SSD as a secondary drive in a two-drive system. When measured as an OS
drive, system overhead can cause lower scores.
1100 2.5-Inch and M.2 NAND Flash SSD
Performance
CCMTD-1725822587-10292
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.
Logical Block Address Configuration
The drive is set to report the number of logical block addresses (LBA) that will ensure
sufficient storage space for the specified capacity. Standard LBA settings, based on the
IDEMA standard (LBA1-03), are shown below.
Table 2: Standard LBA Settings
Capacity
Total LBA Max LBA
User Available
Bytes
Decimal Hexadecimal Decimal Hexadecimal (Unformatted)
256GB 500,118,192 1DCF32B0 500,118,191 1DCF32AF 256,060,514,304
512GB 1,000,215,216 3B9E12B0 1,000,215,215 3B9E12AF 512,110,190,592
1024GB 2,000,409,264 773BD2B0 2,000,409,263 773BD2AF 1,024,209,543,168
2048GB 4,000,797,360 EE7752B0 4,000,797,359 EE7752AF 2,048,408,248,320
1100 2.5-Inch and M.2 NAND Flash SSD
Logical Block Address Configuration
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.
Reliability
Micron’s SSDs incorporate advanced technology for defect and error management.
They use various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
Table 3: Uncorrectable Bit Error Rate
Uncorrectable Bit Error Rate Operation
<1 sector per 10
15
bits read READ
Mean Time To Failure
Mean time to failure (MTTF) for the SSD can be predicted based on the component reli-
ability data using the methods referenced in the Telcordia SR-332 reliability prediction
procedures for electronic equipment.
Table 4: MTTF
Capacity MTTF (Operating Hours)
1
256GB 1.5 million
512GB
1024GB
2048GB
Note:
1. The product achieves a mean time to failure (MTTF) of 1.5 million hours, based on popu-
lation statistics not relevant to individual units.
1100 2.5-Inch and M.2 NAND Flash SSD
Reliability
CCMTD-1725822587-10292
1100_ssd.pdf - Rev. C 12/16 EN
6
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.

MTFDDAK256TBN-1AR15FCYY

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Manufacturer:
Micron
Description:
Solid State Drives - SSD 1100 256GB 2.5in SSD
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New from this manufacturer.
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