Data Sheet ADN2807
Rev. B | Page 9 of 21
DEFINITION OF TERMS
MAXIMUM, MINIMUM, AND TYPICAL
SPECIFICATIONS
Specifications for every parameter are derived from statistical
analyses of data taken on multiple devices from multiple wafer
lots. Typical specifications are the mean of the distribution of
the data for that parameter. If a parameter has a maximum (or a
minimum) value, that value is calculated by adding to (or
subtracting from) the mean six times the standard deviation of
the distribution. This procedure is intended to tolerate pro-
duction variations. If the mean shifts by 1.5 standard deviations,
the remaining 4.5 standard deviations still provide a failure rate
of only 3.4 parts per million. For all tested parameters, the test
limits are guardbanded to account for tester variation, and
therefore guarantee that no device is shipped outside of data
sheet specifications.
INPUT SENSITIVITY AND INPUT OVERDRIVE
Sensitivity and overdrive specifications for the quantizer involve
offset voltage, gain, and noise. The relationship between the
logic output of the quantizer and the analog voltage input is
shown in Figure 8. For sufficiently large positive input voltage,
the output is always Logic 1; similarly for negative inputs, the
output is always Logic 0. However, the transitions between
output Logic Levels 1 and 0 are not at precisely defined input
voltage levels, but occur over a range of input voltages. Within
this zone of confusion, the output may be either 1 or 0, or it
may even fail to attain a valid logic state. The width of this zone
is determined by the input voltage noise of the quantizer. The
center of the zone of confusion is the quantizer input offset
voltage. Input overdrive is the magnitude of signal required to
guarantee a correct logic level with a 1 × 10
10
confidence level.
0
1
INPUT (V p-p)
OUTPU
T
NOISE
SENSITIVITY
(2× OVERDRIVE)
OFFSET
OVERDRIVE
03877-0-008
Figure 8. Input Sensitivity and Input Overdrive
SINGLE-ENDED VS. DIFFERENTIAL
AC coupling typically drives the inputs to the quantizer. The
inputs are internally dc-biased to a common-mode potential of
~0.6 V. Driving the ADN2807 single-ended and observing the
quantizer input with an oscilloscope probe at the point
indicated in Figure 9 shows a binary signal with average value
equal to the common-mode potential and instantaneous values
both above and below the average value. It is convenient to
measure the peak-to-peak amplitude of this signal and call the
minimum required value the quantizer sensitivity. Referring to
Figure 8, since both positive and negative offsets need to be
accommodated, the sensitivity is twice the overdrive.
50 50
QUANTIZER
+
ADN2807
VREF
PIN
SCOPE
PROBE
VREF
10mV p-p
03877-0-007
Figure 9. Single-Ended Sensitivity Measurement
50 50
Q
UANTIZER
+
ADN2807
VREF
NIN
PIN
SCOP
E
PROBE
VREF
5mV p-p
03877-0-010
Figure 10. Differential Sensitivity Measurement
Driving the ADN2807 differentially (Figure 10), sensitivity
seems to improve by observing the quantizer input with an
oscilloscope probe. This is an illusion caused by the use of a
single-ended probe. A 5 mV p-p signal appears to drive the
ADN2807 quantizer. However, the single-ended probe
measures only half the signal. The true quantizer input signal is
twice this value since the other quantizer input is
complementary to the signal being observed.
ADN2807 Data Sheet
Rev. B | Page 10 of 21
LOS RESPONSE TIME
The LOS response time is the delay between the removal of the
input signal and indication of loss of signal (LOS) at SDOUT.
The ADN2807 response time is 300 ns typ when the inputs are
dc-coupled. In practice, the time constant of ac coupling at the
quantizer input determines the LOS response time.
JITTER SPECIFICATIONS
The ADN2807 CDR is designed to achieve the best bit-error-
rate (BER) performance, and has exceeded the jitter transfer,
generation, and tolerance specifications proposed for SONET/SDH
equipment defined in the Telcordia Technologies specification.
Jitter is the dynamic displacement of digital signal edges from
their long-term average positions measured in UI (unit intervals),
where 1 UI = 1 bit period. Jitter on the input data can cause
dynamic phase errors on the recovered clock sampling edge.
Jitter on the recovered clock causes jitter on the retimed data.
The following sections briefly summarize the specifications of
the jitter generation, transfer, and tolerance in accordance with
the Telcordia document (GR-253-CORE, Issue 3, September
2000) for the optical interface at the equipment level, and the
ADN2807 performance with respect to those specifications.
Jitter Generation
The jitter generation specification limits the amount of jitter
that can be generated by the device with no jitter and wander
applied at the input.
Jitter Transfer
The jitter transfer function is the ratio of the jitter on the output
signal to the jitter applied on the input signal versus the
frequency. This parameter measures the limited amount of jitter
on an input signal that can be transferred to the output signal
(Figure 11).
SLOPE =
–20dB/DECADE
JITTER FREQ
UENCY (kHz)
0.1
JITTER GAIN (dB)
f
C
ACCEPTABLE
RANGE
03877-0-011
Figure 11. Jitter Transfer Curve
Jitter Tolerance
The jitter tolerance is defined as the peak-to-peak amplitude of
the sinusoidal jitter applied on the input signal that causes a
1 dB power penalty. This is a stress test intended to ensure that
no additional penalty is incurred under the operating
conditions (Figure 12).
SLOPE = –20dB/DECADE
f
0
f
1
f
2
f
3
f
4
JITTER FREQUENCY (Hz)
15
1.5
0.15
INPUT JITTER AMPLITUDE (UI)
03877-0-012
Figure 12. SONET Jitter Tolerance Mask
Table 4. Jitter Transfer and Tolerance: SONET Specifications vs. ADN2807
Jitter Transfer Jitter Tolerance
Rate
SONET
Spec (f
C
)
ADN2807
(kHz)
Implementation
Margin
Mask Corner
Frequency (kHz) ADN2807
SONET Spec
(UI p-p)
ADN2807
(UI p-p)
Implementation
Margin
1
OC-12 500 kHz 140 3.6 250 kHz 4.8 MHz 0.15 1.0 6.67
OC-3 130 kHz 48 2.7 65 kHz 600 kHz 0.15 1.0 6.67
1
Jitter tolerance measurements are limited by test equipment capabilities.
Data Sheet ADN2807
Rev. B | Page 11 of 21
THEORY OF OPERATION
The ADN2807 is a delay-locked and phase-locked loop circuit
for clock recovery and data retiming from an NRZ encoded data
stream. The phase of the input data signal is tracked by two
separate feedback loops that share a common control voltage.
A high speed delay-locked loop path uses a voltage controlled
phase shifter to track the high frequency components of the input
jitter. A separate phase control loop, comprised of the VCO, tracks
the low frequency components of the input jitter. The initial
frequency of the VCO is set by a third loop, which compares the
VCO frequency with the reference frequency and sets the coarse
tuning voltage. The jitter tracking phase-locked loop controls
the VCO by the fine tuning control. The delay- and phase-locked
loops together track the phase of the input data signal. For example,
when the clock lags input data, the phase detector drives the VCO
to a higher frequency and also increases the delay through the
phase shifter. Both of these actions serve to reduce the phase error
between the clock and data. The faster clock picks up phase while
the delayed data loses phase. Since the loop filter is an integrator,
the static phase error will be driven to zero.
Another view of the circuit is that the phase shifter implements
the zero required for the frequency compensation of a second-
order phase-locked loop. This zero is placed in the feedback path
and, therefore, does not appear in the closed-loop transfer function.
Jitter peaking in a conventional second-order phase-locked loop
is caused by the presence of this zero in the closed-loop transfer
function. Since this circuit has no zero in the closed-loop transfer,
jitter peaking is minimized.
The delay- and phase-locked loops together simultaneously
provide wideband jitter accommodation and narrow-band jitter
filtering. The linearized block diagram in Figure 13 shows that
the jitter transfer function, Z(s)/X(s), is a second-order low-pass
providing excellent filtering. Note that the jitter transfer has no
zero, unlike an ordinary second-order phase-locked loop. This
means the main phase-locked loop has low jitter peaking
(Figure 14), which makes this circuit ideal for signal regenerator
applications where jitter peaking in a cascade of regenerators can
contribute to hazardous jitter accumulation.
d/sc
o/s
psh
1/n
e(s)
X(s)
INPUT
DATA
Z(s)
RECOVERED
CLOCK
d = PHASE DETECTOR GAIN
o = VCO GAIN
c = LOOP INTEGRATOR
psh = PHASE SHIFTER GAIN
n = DIVIDE RATIO
JITTERTRANSFER FUNCTION
Z(s)
X(s)
1
s
2
+ s +1
cn
do
n psh
o
=
TRACKING ERRORTRANSFER FUNCTION
e(s)
X(s)
s
2
s
2
+ s +
do
cn
d psh
c
=
03877-0-013
Figure 13. Phase-Locked Loop/Delay-Locked Loop Architecture
The error transfer, e(s)/X(s), has the same high-pass form as an
ordinary phase-locked loop. This transfer function is free to be
optimized to give excellent wideband jitter accommodation since
the jitter transfer function, Z(s)/X(s), provides the narrow-band
jitter filtering. See Table 4 for error transfer bandwidths and jitter
transfer bandwidths at the various data rates. The delay-locked
and phase-locked loops contribute to overall jitter accommodation.
At low frequencies of input jitter on the data signal, the integrator
in the loop filter provides high gain to track large jitter amplitudes
with small phase error. In this case, the VCO is frequency
modulated, and jitter is tracked as in an ordinary phase-locked
loop. The amount of low frequency jitter that can be tracked is a
function of the VCO tuning range. A wider tuning range gives
larger accommodation of low frequency jitter. The internal loop
control voltage remains small for small phase errors, so the phase
shifter remains close to the center of the range and thus
contributes little to the low frequency jitter accommodation.

ADN2807ACPZ-RL

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Timers & Support Products 155/622Mbps CDR w/ PA Low Power I.C
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