KAF−16200
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15
DEFECT DEFINITIONS
Operating Conditions
Bright defect tests performed at T = 25°C
Dark defect tests performed at T = 25°C
Table 6. SPECIFICATIONS
Classification Points Clusters Columns
Class 1 ≤ 2,000 ≤ 40 0
Class 2 ≤ 2,000 ≤ 40 ≤ 15
Point Defects
A pixel that deviates by more than 9 mV above
neighboring pixels under non−illuminated conditions.
−or−
A pixel that deviates by more than 7% above or 11%
below neighboring pixels under illuminated conditions.
Cluster Defect
A grouping of not more than 10 adjacent point defects.
Cluster defects are separated by no less than 4 good pixels
in any direction.
Column Defect
A grouping of more than 10 point defects along a single
column
−or−
A column that deviates by more than 1.2 mV above or
below neighboring columns under non−illuminated
conditions.
−or−
A column that deviates by more than 1.5% above or below
neighboring columns under illuminated conditions.
Column and cluster defects are separated by at least 4
good columns in the x direction. No multiple column defects
(double or more) will be permitted.
Saturated Columns
A column that deviates by more than 100 mV above
neighboring columns under non−illuminated conditions. No
saturated columns are allowed.
