MT72HTS1G72PY-53EE1

PDF: 09005aef82d283a8/Source: 09005aef82d28271 Micron Technology, Inc., reserves the right to change products or specifications without notice.
HTS72C1Gx72.fm - Rev. A 8/07 EN
7 ©2007 Micron Technology, Inc. All rights reserved.
8GB (x72, ECC, QR) 240-Pin DDR2 SDRAM RDIMM
Electrical Specifications
Electrical Specifications
Stresses greater than those listed in Table 6 may cause permanent damage to the
module. This is a stress rating only, and functional operation of the module at these or
any other conditions outside those indicated in each devices data sheet is not implied.
Exposure to absolute maximum rating conditions for extended periods may adversely
affect reliability.
Notes: 1. The refresh rate is required to double when 85°C < T
C
95°C.
2. For further information, refer to technical note TN-00-08: Thermal Applications, available
on Micron’s Web site.
Input Capacitance
Micron encourages designers to simulate the performance of the module to achieve
optimum values. Simulations are significantly more accurate and realistic than a gross
estimation of module capacitance when inductance and delay parameters associated
with trace lengths are used in simulations. JEDEC modules are currently designed using
simulations to close timing budgets.
Component Timing and Operating Conditions
Recommended AC operating conditions are given in the DDR2 component data sheets.
Component specifications are available on Microns Web site. Module speed grades
correlate with component speed grades as shown in Table 7.
Table 6: Absolute Maximum Ratings
Symbol Parameter Min Max Units
V
DD/VDDQ
VDD/VDDQ supply voltage relative to VSS
–0.5 +2.3 V
V
IN, VOUT
Voltage on any pin relative to VSS
–0.5 +2.3 V
I
I
Input leakage current; Any input 0V VIN VDD;
V
REF input 0V VIN 0.95V (All other pins not
under test = 0V)
Address inputs
RAS#, CAS#, WE#, S#,
CKE, ODT, BA
–10 +10 µA
CK, CK#
–250 +250
I
OZ
Output leakage current; 0V VOUT VDDQ; DQs
and ODT are disabled
DQ, DQS, DQS#
–20 +20 µA
I
VREF
VREF leakage current; VREF = Valid VREF level
–144 +144 µA
T
A
Module ambient operating temperature Commercial
0+70°C
Industrial
–40 +85 °C
T
C
1
DDR2 SDRAM component case operating
temperature
2
Commercial
0+85°C
Industrial
–40 +95 °C
Table 7: Module and Component Speed Grades
Module Speed Grade Component Speed Grade
-667 -3
-53E -37E
-40E -5E
PDF: 09005aef82d283a8/Source: 09005aef82d28271 Micron Technology, Inc., reserves the right to change products or specifications without notice.
HTS72C1Gx72.fm - Rev. A 8/07 EN
8 ©2007 Micron Technology, Inc. All rights reserved.
8GB (x72, ECC, QR) 240-Pin DDR2 SDRAM RDIMM
Electrical Specifications
IDD Specifications
Table 8: DDR2 IDD Specifications and Conditions – 8GB
Values are shown for the MT47H512M4THN DDR2 SDRAM only and are computed from values specified in
the MT47H256M4 2Gb TwinDie™ component data sheet
Parameter/Condition Symbol -667 -53E -40E Units
Operating one bank active-precharge current:
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RAS =
t
RAS MIN (IDD); CKE is HIGH, S# is HIGH between valid
commands; Address bus inputs are switching; Data bus inputs are switching
ICDD0 2,592 2,322 2,232 mA
Operating one bank active-read-precharge current: I
OUT = 0mA;
BL = 4, CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RAS =
t
RAS MIN (IDD),
t
RCD =
t
RCD (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data pattern is same as
I
DD4W
I
CDD1 2,862 2,772 2,592 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (IDD);
CKE is LOW; Other control and address bus inputs are stable; Data bus
inputs are floating
ICDD2P 594 594 594 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (IDD);
CKE is HIGH, S# is HIGH; Other control and address bus inputs are stable;
Data bus inputs are floating
I
CDD2Q 1,782 1,782 1,602 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (IDD); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are switching; Data
bus inputs are switching
ICDD2N 1,782 1,782 1,602 mA
Active power-down current: All device banks open;
t
CK =
t
CK (IDD); CKE is LOW; Other control and address bus
inputs are stable; Data bus inputs are floating
Fast PDN exit
MR[12] = 0
ICDD3P 1,008 1,008 1,008 mA
Slow PDN exit
MR[12] = 1
648 648 648 mA
Active standby current: All device banks open;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Other control and address bus inputs are switching; Data
bus inputs are switching
I
CDD3N 2,052 1,872 1,692 mA
Operating burst write current: All device banks open; Continuous burst
writes; BL = 4, CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between valid commands; Address
bus inputs are switching; Data bus inputs are switching
I
CDD4W 3,222 3,042 2,592 mA
Operating burst read current: All device banks open; Continuous burst
reads; I
OUT = 0mA; BL = 4, CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
I
CDD4R 3,222 3,042 2,592 mA
Burst refresh current:
t
CK =
t
CK (IDD); REFRESH command at every
t
RFC (IDD) interval; CKE is HIGH, S# is HIGH between valid commands; Other
control and address bus inputs are switching; Data bus inputs are switching
ICDD5 4,932 4,842 4,662 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and
address bus inputs are floating; Data bus inputs are floating
I
CDD6 594 594 594 mA
Operating bank interleave read current: All device banks interleaving
reads; I
OUT = 0mA; BL = 4, CL = CL (IDD), AL =
t
RCD (IDD) - 1 ×
t
CK (IDD);
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RRD =
t
RRD (IDD),
t
RCD =
t
RCD (IDD); CKE is
HIGH, S# is HIGH between valid commands; Address bus inputs are stable
during deselects; Data bus inputs are switching
I
CDD7 6,102 5,922 5,652 mA
PDF: 09005aef82d283a8/Source: 09005aef82d28271 Micron Technology, Inc., reserves the right to change products or specifications without notice.
HTS72C1Gx72.fm - Rev. A 8/07 EN
9 ©2007 Micron Technology, Inc. All rights reserved.
8GB (x72, ECC, QR) 240-Pin DDR2 SDRAM RDIMM
Register and PLL Specifications
Register and PLL Specifications
Notes: 1. Timing and switching specifications for the register listed above are critical for proper oper-
ation of the DDR2 SDRAM registered DIMMs. These are meant to be a subset of the param-
eters for the specific device used on the module. Detailed information for this register is
available in JEDEC standard JESD82.
Table 9: Register Specifications
SSTU32868 devices or equivalent JESD82-14
Parameter Symbol Pins Condition Min Max Units
DC high-level
input voltage
V
IH(DC) Address,
control,
command
SSTL_18 VREF(DC) + 125 VDDQ + 250 mV
DC low-level
input voltage
V
IL(DC) Address,
control,
command
SSTL_18 0 VREF(DC) - 125 mV
AC high-level
input voltage
V
IH(AC) Address,
control,
command
SSTL_18 VREF(DC) + 250 VDD mV
AC low-level
input voltage
V
IL(AC) Address,
control,
command
SSTL_18 0 VREF(DC) - 250 mV
Output high voltage
V
OH Parity output LVCMOS 1.2 V
Output low voltage
V
OL Parity output LVCMOS 0.5 V
Input current
I
I All pins VI = VDDQ or VSSQ–5 5µA
Static standby
I
DD All pins RESET# = VSSQ (IO = 0) 100 µA
Static operating
I
DD All pins RESET# = VSSQ;
VI = VIH(AC) or VIL(DC)
IO = 0
–80mA
Dynamic operating
(clock tree)
I
DDD n/a RESET# = VDD, VI = VIH(AC) or
VIL(AC), IO = 0; CK and CK#
switching 50 percent duty
cycle
–Varies by
manufacturer
µA
Dynamic operating
(per each input)
I
DDD n/a RESET# = VDD, VI = VIH(AC) or
VIL(AC), IO = 0; CK and CK#
switching 50 percent duty
cycle; One data input
switching at
t
CK/2, 50
percent duty cycle
–Varies by
manufacturer
µA
Input capacitance
(per device, per pin)
C
I All inputs
except RESET#
VI = VREF ±250mV;
VDDQ = 1.8V
2.5 4 pF
Input capacitance
(per device, per pin)
C
I RESET# VI = VDDQ or VSSQ–Varies by
manufacturer
pF

MT72HTS1G72PY-53EE1

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR2 SDRAM 8GB 240RDIMM
Lifecycle:
New from this manufacturer.
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