AMIS−30543
http://onsemi.com
3
Table 1. PIN LIST AND DESCRIPTION
Name Pin Description Type
Equivalent
Schematic
GND 1 Ground Supply
DI 2 SPI Data In Digital Input Type 2
CLK 3 SPI Clock Input Digital Input Type 2
NXT 4 Next micro−step input Digital Input Type 2
DIR 5 Direction input Digital Input Type 2
ERR 6 Error output (open drain) Digital Output Type 4
SLA 7 Speed load angle output Analog Output Type 5
/ 8 No function (to be left open in normal operation)
CPN 9 Negative connection of charge pump capacitor High Voltage
CPP 10 Positive connection of charge pump capacitor High Voltage
VCP 11 Charge pump filter−capacitor High Voltage
CLR 12 “Clear” = chip reset input Digital Input Type 1
CS 13 SPI chip select input Digital Input Type 2
VBB 14 High voltage supply Input Supply Type 3
MOTYP 15, 16 Negative end of phase Y coil output Driver Output
GND 17, 18 Ground, heat sink Supply
MOTYN 19, 20 Positive end of phase Y coil output Driver Output
MOTXN 21, 22 Positive end of phase X coil output Driver Output
GND 23, 24 Ground, heat sink Supply
MOTXP 25, 26 Negative end of phase X coil output Driver Output
VBB 27 High voltage supply input Supply Type 3
POR/WD 28 Power−on−reset and watchdog reset output (open drain) Digital Output Type 4
TST0 29 Test pin input (to be tied to ground in normal operation) Digital Input
/ 30 No function (to be left open in normal operation)
DO 31 SPI data output (open drain) Digital Output Type 4
VDD 32 Logic supply output (needs external decoupling capacitor) Supply Type 3
Table 2. ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Min Max Unit
V
BB
Analog DC supply voltage (Note 1) −0.3 +40 V
T
ST
Storage temperature −55 +160 °C
T
J
Junction Temperature under bias (Note 2) −50 +175 °C
V
ESD
Electrostatic discharges on component level, All pins (Note 3) −2 +2 kV
V
ESD
Electrostatic discharges on component level, HiV pins (Note 4) −8 +8 kV
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. For limited time < 0.5 s.
2. Circuit functionality not guaranteed.
3. Human body model (100 pF via 1.5 kW, according to JEDEC EIA−JESD22−A114−B).
4. HiV = High Voltage Pins MOTxx, V
BB
, GND; (100 pF via 1.5 kW, according to JEDEC EIA−JESD22−A114−B).
