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5T93GL101PFGI8

P1-P3P4-P6P7-P9P10-P12P13-P14
INDUSTRIAL TEMPERATURE RANGE
4
IDT5T93GL101
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
DC ELECTRICAL CHARACTERISTICS OVER RECOMMENDED OPERATING
RANGE FOR LVTTL
(1)
Symbol Parameter Test Conditions Min. Typ.
(2)
Max Unit
Input Characteristics
IIH Input HIGH Current VDD = 2.7V — — ±5 μA
IIL Input LOW Current VDD = 2.7V — — ±5
VIK Clamp Diode Voltage VDD = 2.3V, IIN = -18mA — - 0.7 - 1.2 V
VIN DC Input Voltage - 0.3 +3.6 V
VIH DC Input HIGH 1.7 — V
VIL DC Input LOW — 0.7 V
VTHI DC Input Threshold Crossing Voltage — VDD /2 — V
V
REF Single-Ended Reference Voltage
(3)
3.3V LVTTL — 1.65 — V
2.5V LVTTL — 1.25 —
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. Typical values are at VDD = 2.5V, +25°C ambient.
3. For A[1:2] single-ended operation, A[1:2] is tied to a DC reference voltage.
DC ELECTRICAL CHARACTERISTICS OVER RECOMMENDED OPERATING
RANGE FOR DIFFERENTIAL INPUTS
(1)
Symbol Parameter Test Conditions Min. Typ.
(4)
Max Unit
Input Characteristics
IIH Input HIGH Current VDD = 2.7V — — ±5 μA
IIL Input LOW Current VDD = 2.7V — — ±5
VIK Clamp Diode Voltage VDD = 2.3V, IIN = -18mA — - 0.7 - 1.2 V
VIN DC Input Voltage - 0.3 +3.6 V
VDIF DC Differential Voltage
(2)
0.1 — V
VCM DC Common Mode Input Voltage
(3)
0.05 VDD V
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. VDIF specifies the minimum input differential voltage (VTR - VCP) required for switching where VTR is the "true" input level and VCP is the "complement" input level. The DC differential
voltage must be maintained to guarantee retaining the existing HIGH or LOW input. The AC differential voltage must be achieved to guarantee switching to a new state.
3. VCM specifies the maximum allowable range of (VTR + VCP) /2.
4. Typical values are at VDD = 2.5V, +25°C ambient.
DC ELECTRICAL CHARACTERISTICS OVER RECOMMENDED OPERATING
RANGE FOR LVDS
(1)
Symbol Parameter Test Conditions Min. Typ.
(2)
Max Unit
Output Characteristics
VOT(+) Differential Output Voltage for the True Binary State 247 — 454 mV
VOT(-) Differential Output Voltage for the False Binary State 247 — 454 mV
ΔVOT Change in VOT Between Complementary Output States — — 50 mV
VOS Output Common Mode Voltage (Offset Voltage) 1.125 1.2 1.375 V
ΔVOS Change in VOS Between Complementary Output States — — 50 mV
IOS Outputs Short Circuit Current VOUT + and VOUT - = 0V — 12 24 mA
I
OSD Differential Outputs Short Circuit Current VOUT + = VOUT -—612mA
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. Typical values are at VDD = 2.5V, +25°C ambient.
INDUSTRIAL TEMPERATURE RANGE
IDT5T93GL101
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
5
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR LVEPECL (2.5V) AND
LVPECL (3.3V)
Symbol Parameter Value Units
VDIF Input Signal Swing
(1)
732 mV
VX Differential Input Signal Crossing Point
(2)
LVEPECL 1082 mV
LVPECL 1880
DH Duty Cycle 50 %
VTHI Input Timing Measurement Reference Level
(3)
Crossing Point V
t
R, tF Input Signal Edge Rate
(4)
2 V/ns
NOTES:
1. The 732mV peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. 1082mV LVEPECL (2.5V) and 1880mV LVPECL (3.3V) crossing point levels are specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment.
This device meets the VX specification under actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR eHSTL
Symbol Parameter Value Units
VDIF Input Signal Swing
(1)
1V
VX Differential Input Signal Crossing Point
(2)
900 mV
DH Duty Cycle 50 %
VTHI Input Timing Measurement Reference Level
(3)
Crossing Point V
t
R, tF Input Signal Edge Rate
(4)
2 V/ns
NOTES:
1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. A 900mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR HSTL
Symbol Parameter Value Units
VDIF Input Signal Swing
(1)
1V
VX Differential Input Signal Crossing Point
(2)
750 mV
DH Duty Cycle 50 %
VTHI Input Timing Measurement Reference Level
(3)
Crossing Point V
t
R, tF Input Signal Edge Rate
(4)
2 V/ns
NOTES:
1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. A 750mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the V
X specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
INDUSTRIAL TEMPERATURE RANGE
6
IDT5T93GL101
2.5V LVDS 1:10 GLITCHLESS CLOCK BUFFER TERABUFFER II
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR LVDS
Symbol Parameter Value Units
VDIF Input Signal Swing
(1)
400 mV
VX Differential Input Signal Crossing Point
(2)
1.2 V
DH Duty Cycle 50 %
VTHI Input Timing Measurement Reference Level
(3)
Crossing Point V
t
R, tF Input Signal Edge Rate
(4)
2 V/ns
NOTES:
1. The 400mV peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. A 1.2V crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
AC DIFFERENTIAL INPUT SPECIFICATIONS
(1)
Symbol Parameter Min. Typ. Max Unit
VDIF AC Differential Voltage
(2)
0.1 — 3.6 V
VIX Differential Input Crosspoint Voltage 0.05 — VDD V
VCM Common Mode Input Voltage Range
(3)
0.05 — VDD V
V
IN Input Voltage - 0.3 +3.6 V
NOTES:
1. The output will not change state until the inputs have crossed and the minimum differential voltage defined by VDIF has been met or exceeded.
2. VDIF specifies the minimum input voltage (VTR - VCP) required for switching where VTR is the "true" input level and VCP is the "complement" input level. The AC differential voltage
must be achieved to guarantee switching to a new state.
3. VCM specifies the maximum allowable range of (VTR + VCP) /2.
POWER SUPPLY CHARACTERISTICS FOR LVDS OUTPUTS
(1)
Symbol Parameter Test Conditions Typ. Max Unit
IDDQ Quiescent VDD Power Supply Current VDD = Max., All Input Clocks = LOW
(2)
— 295 mA
Outputs enabled
ITOT Total Power VDD Supply Current VDD = 2.7V., FREFERENCE CLOCK = 450MHz — 305 mA
IPD Total Power Down Supply Current PD = LOW — 5 mA
NOTES:
1. These power consumption characteristics are for all the valid input interfaces and cover the worst case conditions.
2. The true input is held LOW and the complementary input is held HIGH.
P1-P3P4-P6P7-P9P10-P12P13-P14

5T93GL101PFGI8

Mfr. #:
Buy 5T93GL101PFGI8
Manufacturer:
IDT
Description:
Clock Buffer 450 MHz 2.5V LVDS 1:10 Clock
Lifecycle:
New from this manufacturer.
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