Data Sheet ADuM1100
Rev. K | Page 9 of 20
Parameter Symbol Min Typ Max Unit Test Conditions
Pulse Width Distortion, |t
PLH
− t
PHL
|
5
PWD
5 V/3 V Operation 0.5 2 ns C
L
= 15 pF, CMOS signal levels
3 V/5 V Operation 0.5 3 ns C
L
= 15 pF, CMOS signal levels
Change in Pulse Width Distortion vs.
Temperature
6
5 V/3 V Operation 3 ps/°C C
L
= 15 pF, CMOS signal levels
3 V/5 V Operation 10 ps/°C C
L
= 15 pF, CMOS signal levels
Propagation Delay Skew (Equal
Temperature)
5, 7
t
PSK1
5 V/3 V Operation 12 ns C
L
= 15 pF, CMOS signal levels
3 V/5 V Operation 15 ns C
L
= 15 pF, CMOS signal levels
Propagation Delay Skew (Equal
Temperature, Supplies)
5, 7
t
PSK2
5 V/3 V Operation 9 ns C
L
= 15 pF, CMOS signal levels
3 V/5 V Operation 12 ns C
L
= 15 pF, CMOS signal levels
Output Rise/Fall Time (10% to 90%) t
R
, t
F
3 ns C
L
= 15 pF, CMOS signal levels
Common-Mode Transient Immunity at
Logic Low/High Output
8
|CM
L
|,
|CM
H
|
25 35 kV/µs V
I
= 0 V or V
DD1
, V
CM
= 1000 V,
transient magnitude = 800 V
Refresh Rate f
r
5 V/3 V Operation 1.2 Mbps
3 V/5 V Operation 1.1 Mbps
Input Dynamic Supply Current
9
C
PD1
5 V/3 V Operation 0.09 mA/Mbps
3 V/5 V Operation 0.08 mA/Mbps
Output Dynamic Supply Current
9
C
PD2
5 V/3 V Operation 0.04 mA/Mbps
3 V/5 V Operation 0.02 mA/Mbps
1
Output supply current values are with no output load present. See Figure 5 and Figure 6 for information on supply current variation with logic signal frequency. See
the Power Consumption section for guidance on calculating the input and output supply currents for a given data rate and output load.
2
The minimum pulse width is the shortest pulse width at which the specified pulse width distortion is guaranteed.
3
The maximum data rate is the fastest data rate at which the specified pulse width distortion is guaranteed.
4
t
PHL
is measured from the 50% level of the falling edge of the V
I
signal to the 50% level of the falling edge of the V
O
signal. t
PLH
is measured from the 50% level of the
rising edge of the V
I
signal to the 50% level of the rising edge of the V
O
signal.
5
Because the input thresholds of the ADuM1100 are at voltages other than the 50% level of typical input signals, the measured propagation delay and pulse width
distortion can be affected by slow input rise/fall times. See the Propagation Delay-Related Parameters section and Figure 14 through Figure 18 for information on the
impact of given input rise/fall times on these parameters.
6
Pulse width distortion change vs. temperature is the absolute value of the change in pulse width distortion for a 1°C change in operating temperature.
7
t
PSK1
is the magnitude of the worst-case difference in t
PHL
and/or t
PLH
that is measured between units at the same operating temperature and output load within the
recommended operating conditions. t
PSK2
is the magnitude of the worst-case difference in t
PHL
and/or t
PLH
that is measured between units at the same operating
temperature, supply voltages, and output load within the recommended operating conditions.
8
CM
H
is the maximum common-mode voltage slew rate that can be sustained while maintaining V
O
> 0.8 V
DD2
. CM
L
is the maximum common-mode voltage slew rate
that can be sustained while maintaining V
O
< 0.8 V. The common-mode voltage slew rates apply to both rising and falling edges. The transient magnitude is the range
over which the common mode is slewed.
9
Dynamic supply current is the incremental amount of supply current required for a 1 Mbps increase in signal data rate. See Figure 5 and Figure 6 for information on
supply current variation with logic signal frequency. See the Power Consumption section for guidance on calculating the input and output supply currents for a given
data rate and output load.
ADuM1100 Data Sheet
Rev. K | Page 10 of 20
PACKAGE CHARACTERISTICS
Table 4.
Parameter Symbol Min Typ Max Unit Test Conditions
Resistance (Input-to-Output)
1
R
I-O
10
12
Capacitance (Input-to-Output)
1
C
I-O
1.0 pF f = 1 MHz
Input Capacitance
2
C
I
4.0 pF
IC Junction-to-Case Thermal Resistance, Side 1 θ
JCI
46 °C/W Thermocouple located at
center of package underside
IC Junction-to-Case Thermal Resistance, Side 2 θ
JCO
41 °C/W
Package Power Dissipation P
PD
240 mW
1
The device is considered a 2-terminal device; Pin 1, Pin 2, Pin 3, and Pin 4 are shorted together, and Pin 5, Pin 6, Pin 7, and Pin 8 are shorted together.
2
Input capacitance is measured at Pin 2 (V
I
).
REGULATORY INFORMATION
The ADuM1100 is approved by the following organizations.
Table 5.
UL CSA CQC VDE
Recognized Under
1577 Component
Recognition
Program
1
Approved under CSA
Component Acceptance
Notice 5A
Approved under
CQC11-471543-2012
Certified according to
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12
2
Single/Basic Insulation,
2500 V rms Isolation
Voltage
Basic insulation per
CSA 60950-1-03 and IEC
60950-1, 400 V rms
(565 V peak) maximum
working voltage
Basic insulation per GB4943.1-
2011 400 V rms (588 V peak)
maximum working voltage,
tropical climate, altitude
5000 meters
Reinforced insulation, 560 V peak
File E214100 File 205078 File CQC14001117247 File 2471900-4880-0001
1
In accordance with UL 1577, each ADuM1100 is proof tested by applying an insulation test voltage ≥3000 V rms for 1 sec (current leakage detection limit = 5 µA).
2
In accordance with DIN V VDE V 0884-10, each ADuM1100 is proof tested by applying an insulation test voltage ≥1050 V peak for 1 sec (partial discharge detection
limit = 5 pC). The * marking branded on the component designates DIN V VDE V 0884-10
approval.
INSULATION AND SAFETY-RELATED SPECIFICATIONS
Table 6.
Parameter Symbol Value Unit Conditions
Minimum External Air Gap (Clearance) L(I01) 4.90 min mm Measured from input terminals to output terminals,
shortest distance through air
Minimum External Tracking (Creepage) L(I02) 4.01 min mm Measured from input terminals to output terminals,
shortest distance path along body
Minimum Internal Gap (Internal Clearance) 0.016 min mm Insulation distance through insulation
Tracking Resistance (Comparative Tracking Index) CTI >400 V DIN IEC 112/VDE 0303 Part 1
Isolation Group II Material Group (DIN VDE 0110, 1/89, Table I)
Maximum Working Voltage Compatible with
50 Years Service Life
V
IORM
565 V peak Continuous peak voltage across the isolation barrier
Data Sheet ADuM1100
Rev. K | Page 11 of 20
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 INSULATION CHARACTERISTICS
This isolator is suitable for reinforced isolation only within the safety limit data. Maintenance of the safety data is ensured by means of
protective circuits. The asterisk (*) marking on the package denotes DIN V VDE V 0884-10 approval for 560 V peak working voltage.
Table 7.
Description Conditions Symbol Characteristic Unit
Installation Classification per DIN VDE 0110
For Rated Mains Voltage ≤ 150 V rms I to IV
For Rated Mains Voltage ≤ 300 V rms I to III
For Rated Mains Voltage ≤ 400 V rms I to II
Climatic Classification 40/105/21
Pollution Degree per DIN VDE 0110, Table 1 2
Maximum Working Insulation Voltage V
IORM
560 V peak
Input-to-Output Test Voltage, Method B1
V
IORM
× 1.875 = V
PR
, 100% production test,
t
m
= 1 sec, partial discharge < 5 pC
V
PR
1050
V peak
Input-to-Output Test Voltage, Method A V
IORM
× 1.6 = V
PR
, t
m
= 60 sec, partial
discharge < 5 pC
V
PR
After Environmental Tests Subgroup 1 896 V peak
After Input and/or Safety Test Subgroup 2 and Subgroup 3 V
IORM
× 1.2 = V
PR
, t
m
= 60 sec, partial
discharge < 5 pC
672 V peak
Highest Allowable Overvoltage Transient overvoltage, t
TR
= 10 seconds V
TR
4000 V peak
Safety-Limiting Values Maximum value allowed in the event of
a failure (see
Figure 2)
Case Temperature T
S
150 °C
Side 1 Current I
S1
160 mA
Side 2 Current I
S2
170 mA
Insulation Resistance at T
S
V
IO
= 500 V R
S
>10
9
CASE TEMPERATURE (°C)
180
0
SAFETY-LIMITING CURRENT (mA)
100
80
0
50 100 150 200
120
160
140
20
40
60
INPUT CURRENT
OUTPUT CURRENT
02462-002
Figure 2. Thermal Derating Curve, Dependence of Safety-Limiting Values
with Case Temperature per DIN V VDE V 0884-10
RECOMMENDED OPERATING CONDITIONS
Table 8.
Parameter Symbol Min Max Unit
Operating Temperature
ADuM1100AR/ADuM1100BR
T
A
−40
+105
°C
ADuM1100UR T
A
40 +125 °C
Supply Voltages
1
V
DD1
,
V
DD2
3.0 5.5 V
Logic High Input Voltage,
5 V Operation
1, 2
(See Figure 11 and Figure 12)
V
IH
2.0 V
DD1
V
Logic Low Input Voltage,
5 V Operation
1, 2
(See Figure 11 and Figure 12)
V
IL
0.0 0.8 V
Logic High Input Voltage,
3.3 V Operation
1, 2
(See Figure 11 and Figure 12)
V
IH
1.5 V
DD1
V
Logic Low Input Voltage,
3.3 V Operation
1, 2
(See Figure 11 and Figure 12)
V
IL
0.0 0.5 V
Input Signal Rise and Fall Times 1.0 ms
1
All voltages are relative to their respective ground.
2
Input switching thresholds have 300 mV of hysteresis. See the Method of
Operation, DC Correctness, and Magnetic Field Immunity section, Figure 19,
and Figure 20 for information on immunity to external magnetic fields.

ADUM1100UR-RL7

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Digital Isolators Digital SGL CH
Lifecycle:
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