15
1
3
2
4
8
6
7
5
C
LEDP
C
LEDN
1
3
2
4
8
6
7
5
C
LEDP
C
LEDN
SHIELD
C
LEDO1
C
LEDO2
LED Drive Circuit Considerations for Ultra High CMR Perfor-
mance.
Without a detector shield, the dominant cause of op-
tocoupler CMR failure is capacitive coupling from the
input side of the optocoupler, through the package, to
the detector IC as shown in Figure 29. The ACPL-312U
improves CMR performance by using a detector IC with
an optically transparent Faraday shield, which diverts the
capacitively coupled current away from the sensitive IC
circuitry. However, this shield does not eliminate the ca-
pacitive coupling between the LED and optocoupler pins
5-8 as shown in Figure 30. This capacitive coupling causes
perturbations in the LED current during common mode
transients and becomes the major source of CMR failures
for a shielded optocoupler. The main design objective of
a high CMR LED drive circuit becomes keeping the LED in
the proper state (on or o) during common mode tran-
sients. For example, the recommended application circuit
(Figure 25), can achieve 25 kV/μs CMR while minimizing
component complexity. Techniques to keep the LED in the
proper state are discussed in the next two sections.
Figure 29. Optocoupler input to output
capacitance model for unshielded opto-
couplers.
Figure 30. Optocoupler input to output
capacitance model for shielded opto-
couplers.
1
3
2
4
8
6
7
5
C
LEDP
C
LEDN
1
3
2
4
8
6
7
5
C
LEDP
C
LEDN
SHIELD
C
LEDO1
C
LEDO2
CMR with the LED On (CMRH).
A high CMR LED drive circuit must keep the LED on during
common mode transients. This is achieved by overdriv-
ing the LED current beyond the input threshold so that
it is not pulled below the threshold during a transient.
A minimum LED current of 10 mA provides adequate
margin over the maximum IFLH of 5 mA to achieve 25 kV/
μs CMR. CMR with the LED O (CMRL). A high CMR LED
drive circuit must keep the LED o (V
F
≤ V
F(OFF)
) during
common mode transients. For example, during a -dV
cm
/dt
transient in Figure 31, the current owing through C
LEDP
also ows through the R
SAT
and V
SAT
of the logic gate. As
long as the low state voltage developed across the logic
gate is less than V
F(OFF)
, the LED will remain o and no
common mode failure will occur. The open collector drive
circuit, shown in Figure 32, cannot keep the LED o during
a +dV
cm
/dt transient, since all the current owing through
C
LEDN
must be supplied by the LED, and it is not recom-
mended for applications requiring ultra high CMRL per-
formance. Figure 33 is an alternative drive circuit which,
like the recommended application circuit (Figure 25), does
achieve ultra high CMR performance by shunting the LED
in the o state.
Rg
1
3
V
SAT
2
4
8
6
7
5
+
V
CM
I
LEDP
C
LEDP
C
LEDN
SHIELD
* THE ARROWS INDICATE THE DIRECTION
OF CURRENT FLOW DURING –dV
CM
/dt.
+5 V
+
–
V
CC
= 18 V
• • •
• • •
0.1
µF
+
–
–
1
3
2
4
8
6
7
5
C
LEDP
C
LEDN
SHIELD
+5 V
1
3
2
4
8
6
7
5
C
LEDP
C
LEDN
SHIELD
+5 V
Q1
I
LEDN
Figure 31. Equivalent circuit for gure 25 during common mode transient.
Figure 33. Recommended LED drive circuit for ultra-high CMR.
Rg
1
3
V
SAT
2
4
8
6
7
5
+
V
CM
I
LEDP
C
LEDP
C
LEDN
SHIELD
* THE ARROWS INDICATE THE DIRECTION
OF CURRENT FLOW DURING –dV
CM
/dt.
+5 V
+
–
V
CC
= 18 V
• • •
• • •
0.1
µF
+
–
–
1
3
2
4
8
6
7
5
C
LEDP
C
LEDN
SHIELD
+5 V
1
3
2
4
8
6
7
5
C
LEDP
C
LEDN
SHIELD
+5 V
Q1
I
LEDN
Figure 32. Not recommended open collector drive
circuit.
Rg
1
3
V
SAT
2
4
8
6
7
5
+
V
CM
I
LEDP
C
LEDP
C
LEDN
SHIELD
* THE ARROWS INDICATE THE DIRECTION
OF CURRENT FLOW DURING –dV
CM
/dt.
+5 V
+
–
V
CC
= 18 V
• • •
• • •
0.1
µF
+
–
–
1
3
2
4
8
6
7
5
C
LEDP
C
LEDN
SHIELD
+5 V
1
3
2
4
8
6
7
5
C
LEDP
C
LEDN
SHIELD
+5 V
Q1
I
LEDN