AMIS−30511
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3
Table 1. Pin List and Descriptions
Name Pin Description
DO 1 SPI data output (open drain)
VDD 2 Logic Supply Input (needs external decoupling capacitor)
GND 3 Ground
DI 4 SPI data in
CLK 5 SPI clock input
NXT 6 Next micro−step input
DIR 7 Direction input
ERR 8 Error Output (open drain)
SLA 9 Speed Load Angle Output
CPN 10 Negative connection of charge pump capacitor
CPP 11 Positive connection of charge pump capacitor
VCP 12 Charge−pump filter−capacitor
CLR 13 “Clear” = Chip Reset input
CS 14 SPI chip select input
VBB 15 High Voltage Supply Input
MOTYP 16 Negative end of phase Y coil output
GND 17 Ground
MOTYN 18 Positive end of phase Y coil output
MOTXN 19 Positive end of phase X coil output
GND 20 Ground
MOTXP 21 Negative end of phase X coil output
VBB 22 High Voltage Supply Input
/ 23 No Function (to be left open in normal operation)
TST0 24 Test pin (to be tied to ground in normal operation) input
Table 2. Absolute Maximum Ratings
Symbol Parameter Min. Max. Units
V
BB
Analog DC supply voltage (Note 1) −0.3 +40 V
V
DD
Logic supply voltage −0.3 +7.0 V
Tstrg Storage temperature −55 +160 °C
Tamb Ambient temperature under bias −50 +150 °C
V
ESD
Electrostatic discharges on component level (Note 2) −2 +2 kV
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. For limited time < 0.5 s.
2. Human body model (100 pF via 1.5 kW, according to JEDEC EIA−JESD22−A114−B).
Table 3. Recommended Operating Conditions
Symbol Parameter Min. Max. Units
V
BB
Analog DC supply +6 +30 V
V
DD
Logic supply voltage 4.75 5.25 V
T
a
Ambient temperature V
BB
≤ +18 −40 +125 °C
T
a
Ambient temperature V
BB
≤ +30 −40 +85 °C
T
j
Junction temperature +160 °C
NOTE: Operating ranges define the limits for functional operation and parametric characteristics of the device. Note that the functionality
of the chip outside these operating ranges is not guaranteed. Operating outside the recommended operating ranges for extended
periods of time may affect device reliability.