MT89L86 Data Sheet
26
Zarlink Semiconductor Inc.
* Exceeding these values may cause permanent damage. Functional operation under these conditions is not implied.
‡ Typical figures are at 25
C and are for design aid only: not guaranteed and not subject to production testing.
‡ Typical figures are at 25
C and are for design aid only: not guaranteed and not subject to production testing.
Absolute Maximum Ratings*
Parameter Symbol Min. Max. Units
1 Supply Voltage -0.3 5.0 V
2 Voltage on any I/O pin (except supply pins) V
O
V
SS
-0.3 V
DD
+0.3 V
3 Current at Digital Outputs I
O
20 mA
4 Storage Temperature T
S
-55 +125 C
5 Package Power Dissipation P
D
1W
Recommended Operating Conditions
- Voltages are with respect to ground (V
SS
) unless otherwise stated.
Characteristics Sym. Min. Typ.
‡
Max. Units Test Conditions
1 Operating Temperature T
OP
-40 25 +85 C
2 Positive Supply V
DD
3.0 3.3 3.6 V
3 Input High Voltage V
IH
0.7V
DD
V
DD
V
4 Input High Voltage on 5 V
Tolerant Inputs
V
IH
5.5 V
5 Input Low Voltage V
IL
V
SS
0.3V
DD
V
DC Electrical Characteristics
- Voltages are with respect to ground (V
SS
) unless otherwise stated.
Characteristics Sym. Min. Typ.
‡
Max. Units Test Conditions
1
I
N
P
U
T
S
Supply Current I
DD
6 10 mA Outputs unloaded
2 Input High Voltage V
IH
0.7V
DD
V
3 Input Low Voltage V
IL
0.3V
DD
V
4 Input Leakage I
IL
5 AV
I
between V
SS
and V
DD
5 Input Pin Capacitance C
I
10 pF
6
O
U
T
P
U
T
S
Output High Voltage V
OH
0.8V
DD
VI
OH
= 10 mA
7 Output High Current I
OH
10 mA Sourcing. V
OH
=2.4 V
8 Output Low Voltage V
OL
0.4 V I
OL
= 5 mA
9 Output Low Current I
OL
5mASinking. V
OL
= 0.4 V
10 High Impedance Leakage I
OZ
5 AV
O
between V
SS
and V
DD
11 Output Pin Capacitance C
O
10 pF
AC Electrical Characteristics
_
Timing Parameter Measurement Voltage Levels
Characteristics Sym. Level Units Test Conditions
1 CMOS Threshold Voltage V
TT
0.5V
DD
V
2 CMOS Rise/Fall Threshold Voltage high V
HM
0.7V
DD
V
3 CMOS Rise/Fall Threshold Voltage low V
LM
0.3V
DD
V
