DRAM Operating Conditions
Recommended AC operating conditions are given in the DDR2 component data sheets.
Component specifications are available on Micron's Web site. Module speed grades cor-
relate with component speed grades.
Table 9: Module and Component Speed Grades
DDR2 components may exceed the listed module speed grades; module may not be available in all listed speed grades
Module Speed Grade Component Speed Grade
-1GA -187E
-80E -25E
-800 -25
-667 -3
-53E -37E
-40E -5E
Design Considerations
Simulations
Micron memory modules are designed to optimize signal integrity through carefully de-
signed terminations, controlled board impedances, routing topologies, trace length
matching, and decoupling. However, good signal integrity starts at the system level. Mi-
cron encourages designers to simulate the signal characteristics of the system's memo-
ry bus to ensure adequate signal integrity of the entire memory system.
Power
Operating voltages are specified at the DRAM, not at the edge connector of the module.
Designers must account for any system voltage drops at anticipated power levels to en-
sure the required supply voltage is maintained.
1GB, 2GB, 4GB (x64, DR) 200-Pin DDR2 SDRAM SODIMM
DRAM Operating Conditions
PDF: 09005aef8339ef97
htf16c128_256_512x64hz.pdf - Rev. D 4/14 EN
10
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2008 Micron Technology, Inc. All rights reserved.
IDD Specifications
Table 10: DDR2 I
DD
Specifications and Conditions – 1GB (Die Revision G)
Values shown for MT47H64M8 DDR2 SDRAM only and are computed from values specified in the 512Mb (64 Meg x 8) com-
ponent data sheet
Parameter Symbol
-80E/
-800 -667 Units
Operating one bank active-precharge current:
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus inputs are
switching; Data bus inputs are switching
I
DD0
1
576 536 mA
Operating one bank active-read-precharge current: I
OUT
= 0mA; BL = 4, CL = CL
(I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE
is HIGH, S# is HIGH between valid commands; Address bus inputs are switching; Data
pattern is same as I
DD4W
I
DD1
1
656 616 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is LOW;
Other control and address bus inputs are stable; Data bus inputs are floating
I
DD2P
2
112 112 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is HIGH,
S# is HIGH; Other control and address bus inputs are stable; Data bus inputs are floating
I
DD2Q
2
384 352 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is HIGH, S# is
HIGH; Other control and address bus inputs are switching; Data bus inputs are switching
I
DD2N
2
448 400 mA
Active power-down current: All device banks open;
t
CK
=
t
CK (I
DD
); CKE is LOW; Other control and address bus in-
puts are stable; Data bus inputs are floating
Fast PDN exit MR[12] = 0 I
DD3P
2
288 240 mA
Slow PDN exit MR[12] = 1 144 144
Active standby current: All device banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Other control and ad-
dress bus inputs are switching; Data bus inputs are switching
I
DD3N
2
528 480 mA
Operating burst write current: All device banks open; Continuous burst writes; BL =
4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is
HIGH, S# is HIGH between valid commands; Address bus inputs are switching; Data bus
inputs are switching
I
DD4W
1
1056 976 mA
Operating burst read current: All device banks open; Continuous burst read, I
OUT
=
0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
);
CKE is HIGH, S# is HIGH between valid commands; Address bus inputs are switching; Da-
ta bus inputs are switching
I
DD4R
1
1016 936 mA
Burst refresh current:
t
CK =
t
CK (I
DD
); REFRESH command at every
t
RFC (I
DD
) interval;
CKE is HIGH, S# is HIGH between valid commands; Other control and address bus inputs
are switching; Data bus inputs are switching
I
DD5
2
816 776 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and address bus in-
puts are floating; Data bus inputs are floating
I
DD6
2
112 112 mA
Operating bank interleave read current: All device banks interleaving reads; I
OUT
=
0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD (I
DD
) - 1 ×
t
CK (I
DD
);
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Address bus inputs are stable during deselects; Data bus inputs are switching
I
DD7
1
1256 1176 mA
Notes:
1. Value calculated as one module rank in this operating condition; all other module ranks
in I
DD2P
(CKE LOW) mode.
2. Value calculated reflects all module ranks in this operating condition.
1GB, 2GB, 4GB (x64, DR) 200-Pin DDR2 SDRAM SODIMM
IDD Specifications
PDF: 09005aef8339ef97
htf16c128_256_512x64hz.pdf - Rev. D 4/14 EN
11
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2008 Micron Technology, Inc. All rights reserved.
Table 11: DDR2 I
DD
Specifications and Conditions – 2GB (Die Revision H)
Values shown for MT47H128M8 DDR2 SDRAM only and are computed from values specified in the 1Gb (128 Meg x 8) com-
ponent data sheet
Parameter Symbol -1GA
-80E/
-800 -667 Units
Operating one bank active-precharge current:
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address
bus inputs are switching; Data bus inputs are switching
I
DD0
1
656 576 536 mA
Operating one bank active-read-precharge current: I
OUT
= 0mA; BL = 4, CL =
CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
),
t
RCD =
t
RCD
(I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus inputs are
switching; Data pattern is same as I
DD4W
I
DD1
1
736 656 616 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
LOW; Other control and address bus inputs are stable; Data bus inputs are float-
ing
I
DD2P
2
112 112 112 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are stable; Data bus inputs
are floating
I
DD2Q
2
448 384 384 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is HIGH,
S# is HIGH; Other control and address bus inputs are switching; Data bus inputs
are switching
I
DD2N
2
544 448 384 mA
Active power-down current: All device banks open;
t
CK =
t
CK (I
DD
); CKE is LOW; Other control and address
bus inputs are stable; Data bus inputs are floating
Fast PDN exit MR[12] = 0 I
DD3P
2
368 320 240 mA
Slow PDN exit MR[12] = 1 160 160 160
Active standby current: All device banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS
MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Oth-
er control and address bus inputs are switching; Data bus inputs are switching
I
DD3N
2
640 528 480 mA
Operating burst write current: All device banks open; Continuous burst writes;
BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
);
CKE is HIGH, S# is HIGH between valid commands; Address bus inputs are switch-
ing; Data bus inputs are switching
I
DD4W
1
1216 1056 976 mA
Operating burst read current: All device banks open; Continuous burst read,
I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus in-
puts are switching; Data bus inputs are switching
I
DD4R
1
1176 1016 936 mA
Burst refresh current:
t
CK =
t
CK (I
DD
); REFRESH command at every
t
RFC (I
DD
) in-
terval; CKE is HIGH, S# is HIGH between valid commands; Other control and ad-
dress bus inputs are switching; Data bus inputs are switching
I
DD5
2
1296 1216 1176 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and address
bus inputs are floating; Data bus inputs are floating
I
DD6
2
112 112 112 mA
Operating bank interleave read current: All device banks interleaving reads;
I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD (I
DD
) - 1 ×
t
CK (I
DD
);
t
CK =
t
CK (I
DD
),
t
RC
=
t
RC (I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are stable during deselects; Data bus inputs
are switching
I
DD7
1
1816 1736 1536 mA
Notes:
1. Value calculated as one module rank in this operating condition; all other module ranks
in I
DD2P
(CKE LOW) mode.
1GB, 2GB, 4GB (x64, DR) 200-Pin DDR2 SDRAM SODIMM
IDD Specifications
PDF: 09005aef8339ef97
htf16c128_256_512x64hz.pdf - Rev. D 4/14 EN
12
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2008 Micron Technology, Inc. All rights reserved.

MT16HTF25664HZ-800M1

Mfr. #:
Manufacturer:
Micron
Description:
Memory Modules DDR2 2GB SODIMM
Lifecycle:
New from this manufacturer.
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