MT18HVS25672PKZ-80EH2

DRAM Operating Conditions
Recommended AC operating conditions are given in the DDR2 component data sheets.
Component specifications are available on Micron's Web site. Module speed grades cor-
relate with component speed grades.
Table 8: Module and Component Speed Grades
DDR2 components may exceed the listed module speed grades; module may not be available in all listed speed grades
Module Speed Grade Component Speed Grade
-1GA -187E
-80E -25E
-800 -25
-667 -3
-53E -37E
-40E -5E
Design Considerations
Simulations
Micron memory modules are designed to optimize signal integrity through carefully de-
signed terminations, controlled board impedances, routing topologies, trace length
matching, and decoupling. However, good signal integrity starts at the system level. Mi-
cron encourages designers to simulate the signal characteristics of the system's memo-
ry bus to ensure adequate signal integrity of the entire memory system.
Power
Operating voltages are specified at the DRAM, not at the edge connector of the module.
Designers must account for any system voltage drops at anticipated power levels to en-
sure the required supply voltage is maintained.
2GB, 4GB (x72, ECC, DR) 244-Pin DDR2 VLP Mini-RDIMM
DRAM Operating Conditions
PDF: 09005aef83d94997
hvs18c256_512x72pkz.pdf - Rev. E 4/14 EN
10
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2010 Micron Technology, Inc. All rights reserved.
I
DD
Specifications
Table 9: DDR2 I
DD
Specifications and Conditions – 2GB (Die Revision H)
Values are shown for the MT47H256M8 DDR2 SDRAM only and are computed from values specified in the 2Gb TwinDie
(256 Meg x 8) component data sheet
Parameter Symbol
-80E/
-800 -667 Units
Operating one bank active-precharge current:
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address
bus inputs are switching; Data bus inputs are switching
I
CDD0
648 603 mA
Operating one bank active-read-precharge current: I
OUT
= 0mA; BL = 4, CL =
CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
),
t
RCD =
t
RCD
(I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus inputs are
switching; Data pattern is same as I
DD4W
I
CDD1
738 693 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
LOW; Other control and address bus inputs are stable; Data bus inputs are floating
I
CDD2P
126 126 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are stable; Data bus inputs
are floating
I
CDD2Q
279 279 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is HIGH, S#
is HIGH; Other control and address bus inputs are switching; Data bus inputs are
switching
I
CDD2N
315 279 mA
Active power-down current: All device banks open;
t
CK =
t
CK
(I
DD
); CKE is LOW; Other control and address bus inputs are stable;
Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
CDD3P
243 198 mA
Slow PDN exit
MR[12] = 1
153 153
Active standby current: All device banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX
(I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Other con-
trol and address bus inputs are switching; Data bus inputs are switching
I
CDD3N
360 333 mA
Operating burst write current: All device banks open; Continuous burst writes;
BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
);
CKE is HIGH, S# is HIGH between valid commands; Address bus inputs are switch-
ing; Data bus inputs are switching
I
CDD4W
1188 1098 mA
Operating burst read current: All device banks open; Continuous burst read,
I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP
=
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus inputs
are switching; Data bus inputs are switching
I
CDD4R
1143 1053 mA
Burst refresh current:
t
CK =
t
CK (I
DD
); REFRESH command at every
t
RFC (I
DD
) inter-
val; CKE is HIGH, S# is HIGH between valid commands; Other control and address
bus inputs are switching; Data bus inputs are switching
I
CDD5
1368 1323 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and address bus
inputs are floating; Data bus inputs are floating
I
CDD6
126 126 mA
Operating bank interleave read current: All device banks interleaving reads,
I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD (I
DD
) - 1 ×
t
CK (I
DD
);
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH between val-
id commands; Address bus inputs are stable during deselects; Data bus inputs are
switching
I
CDD7
1953 1728 mA
2GB, 4GB (x72, ECC, DR) 244-Pin DDR2 VLP Mini-RDIMM
I
DD
Specifications
PDF: 09005aef83d94997
hvs18c256_512x72pkz.pdf - Rev. E 4/14 EN
11
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2010 Micron Technology, Inc. All rights reserved.
Table 10: DDR2 I
DD
Specifications and Conditions – 2GB (Die Revision M)
Values are shown for the MT47H256M8 DDR2 SDRAM only and are computed from values specified in the 2Gb TwinDie
(256 Meg x 8) component data sheet
Parameter Symbol
-80E/
-800 -667 Units
Operating one bank active-precharge current:
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address
bus inputs are switching; Data bus inputs are switching
I
CDD0
720 675 mA
Operating one bank active-read-precharge current: I
OUT
= 0mA; BL = 4, CL =
CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
),
t
RCD =
t
RCD
(I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus inputs are
switching; Data pattern is same as I
DD4W
I
CDD1
810 765 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
LOW; Other control and address bus inputs are stable; Data bus inputs are floating
I
CDD2P
180 180 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are stable; Data bus inputs
are floating
I
CDD2Q
306 306 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is HIGH, S#
is HIGH; Other control and address bus inputs are switching; Data bus inputs are
switching
I
CDD2N
387 351 mA
Active power-down current: All device banks open;
t
CK =
t
CK
(I
DD
); CKE is LOW; Other control and address bus inputs are stable;
Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
CDD3P
360 342 mA
Slow PDN exit
MR[12] = 1
270 270
Active standby current: All device banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX
(I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Other con-
trol and address bus inputs are switching; Data bus inputs are switching
I
CDD3N
432 405 mA
Operating burst write current: All device banks open; Continuous burst writes;
BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
);
CKE is HIGH, S# is HIGH between valid commands; Address bus inputs are switch-
ing; Data bus inputs are switching
I
CDD4W
1260 1170 mA
Operating burst read current: All device banks open; Continuous burst read,
I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP
=
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus inputs
are switching; Data bus inputs are switching
I
CDD4R
1215 1125 mA
Burst refresh current:
t
CK =
t
CK (I
DD
); REFRESH command at every
t
RFC (I
DD
) inter-
val; CKE is HIGH, S# is HIGH between valid commands; Other control and address
bus inputs are switching; Data bus inputs are switching
I
CDD5
1530 1485 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and address bus
inputs are floating; Data bus inputs are floating
I
CDD6
126 126 mA
Operating bank interleave read current: All device banks interleaving reads,
I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD (I
DD
) - 1 ×
t
CK (I
DD
);
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH between val-
id commands; Address bus inputs are stable during deselects; Data bus inputs are
switching
I
CDD7
2025 1800 mA
2GB, 4GB (x72, ECC, DR) 244-Pin DDR2 VLP Mini-RDIMM
I
DD
Specifications
PDF: 09005aef83d94997
hvs18c256_512x72pkz.pdf - Rev. E 4/14 EN
12
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2010 Micron Technology, Inc. All rights reserved.

MT18HVS25672PKZ-80EH2

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR2 SDRAM 2GB 244MRDIMM
Lifecycle:
New from this manufacturer.
Delivery:
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Payment:
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