NXP Semiconductors
SL3S4011_4021
UCODE I²C
SL3S4011_4021 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2018. All rights reserved.
Product data sheet Rev. 3.5 — 18 September 2018
COMPANY PUBLIC 204935 22 / 30
13 Limiting values
Table 17. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to
GND.
[1][2][3]
Symbol Parameter Conditions Min Max Unit
Die
V
max
maximum voltage on pin VDD, SDA,
SCL, GND
-0.3 3.6 V
T
stg
storage temperature -55 +125 °C
T
amb
ambient temperature -40 +85 °C
Human body
model; SNW-
FQ-302A
- ±2 kVV
ESD
electrostatic discharge
voltage
Charged device
model
- ±500 V
[1] Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or any conditions other than those described in the
Operating Conditions and Electrical Characteristics section of this specification is not implied.
[2] This product includes circuitry specifically designed for the protection of its internal devices from the damaging effects of
excessive static charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying greater
than the rated maxima.
[3] For ESD measurement, the die chip has been mounted into a CDIP8 package.
