–3–
REV. B
AD7851
A Grade: f
CLKIN
= 7 MHz (–40C to +85C), f
SAMPLE
= 333 kHz; K Grade: f
CLKIN
= 6 MHz (0C to 85C), f
SAMPLE
= 285 kHz; A and K Grade: f
CLKIN
= 5 MHz
(to 125C), f
SAMPLE
= 238 kHz; (AV
DD
= DV
DD
= 5.0 V 5%, REF
IN
/REF
OUT
= 4.096 V External Reference; SLEEP = Logic High; T
A
= T
MIN
to T
MAX
,
unless otherwise noted.)
Parameter Version A
1
Version K
1
Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
Signal-to-Noise + Distortion Ratio
3
(SNR) 77 78 dB min Typically SNR Is 79.5 dB.
V
IN
= 10 kHz, Sine Wave, f
SAMPLE
= 333 kHz.
Total Harmonic Distortion (THD) –86 –86 dB max V
IN
= 10 kHz, Sine Wave, f
SAMPLE
= 333 kHz,
typically –96 dB.
Peak Harmonic or Spurious Noise –87 –87 dB max V
IN
= 10 kHz, f
SAMPLE
= 333 kHz.
Intermodulation Distortion (IMD)
Second-Order Terms –86 –90 dB typ fa = 9.983 kHz, fb = 10.05 kHz, f
SAMPLE
= 333 kHz.
Third-Order Terms –86 –90 dB typ fa = 9.983 kHz, fb = 10.05 kHz, f
SAMPLE
= 333 kHz.
Full Power Bandwidth 20 20 MHz typ @ 3 dB.
DC ACCURACY
Resolution 14 14 Bits
Integral Nonlinearity ±2 ±1 LSB max
Differential Nonlinearity ±2 ±1 LSB max Guaranteed No Missed Codes to 14 Bits
Unipolar Offset Error ±10 ±10 LSB max Review: Adjusting the Offset Calibration
Positive Full-Scale Error ± 10 ±10 LSB max Register in the Calibration Registers section.
Negative Full-Scale Error ±10 ±10 LSB typ
Bipolar Zero Error ±1 ±1 LSB typ
ANALOG INPUT
Input Voltage Ranges 0 V to V
REF
0 V to V
REF
V AIN(+) – AIN(–) = 0 V to V
REF
, AIN(–) can be
biased up but AIN(+) cannot go below AIN(–).
±V
REF
/2 ±V
REF
/2 V AIN(+) – AIN(–) = –V
REF
/2 to +V
REF
/2, AIN(–)
should be biased up and AIN(+) can go below
AIN(–) but cannot go below 0 V.
Leakage Current ±1 ±1 µA max
Input Capacitance 20 20 pF typ
REFERENCE INPUT/OUTPUT
REF
IN
Input Voltage Range 4/V
DD
4/V
DD
V min/max Functional from 1.2 V.
Input Impedance 150 150 k typ Resistor Connected to Internal Reference Node.
REF
OUT
Output Voltage 3.696/4.496 3.696/4.496 V min/max
REF
OUT
Temperature Coefficient 50 50 ppm/°C typ
LOGIC INPUTS
Input High Voltage, V
INH
V
DD
– 1.0 V
DD
– 1.0 V min
Input Low Voltage, V
INL
0.4 0.4 V max
Input Current, I
IN
±10 ±10 µA max V
IN
= 0 V or V
DD
.
Input Capacitance, C
IN
4
10 10 pF max
LOGIC OUTPUTS
Output High Voltage, V
OH
V
DD
– 0.4 V
DD
– 0.4 V min I
SOURCE
= 200 µA.
Output Low Voltage, V
OL
0.4 0.4 V max I
SINK
= 0.8 mA.
Floating State Leakage Current ± 10 ±10 µA max
Floating State Output Capacitance
4
10 10 pF max
Output Coding Straight (Natural) Binary Unipolar Input Range.
Twos Complement Bipolar Input Range.
CONVERSION RATE
Conversion Time 2.78 3.25 µs max 19.5 CLKIN Cycles.
Conversion + Track-and-Hold
Acquisition Time 3.0 3.5 µs max 21 CLKIN Cycles Throughput Rate.
SPECIFICATIONS
1, 2
AD7851
–4–
REV. B
Parameter Version A
1
Version K
1
Unit Test Conditions/Comments
POWER PERFORMANCE
AV
DD,
DV
DD
4.75/5.25 4.75/5.25 V min/max
I
DD
Normal Mode
4
17 17 mA max AV
DD
= DV
DD
= 4.75 V to 5.25 V. Typically
12 mA.
Sleep Mode
5
With External Clock On 20 20 µA typ Full Power-Down. Power management bits
in control register set as PMGT1 = 1, PMGT0 = 0.
600 600 µA typ Partial Power-Down. Power management bits in
control register set as PMGT1 = 1, PMGT0 = 1.
With External Clock Off 10 10 µA max Typically 1 µA. Full Power-Down. Power
management bits in control register set as
PMGT1 = 1, PMGT0 = 0.
300 300 µA typ Partial Power-Down. Power management bits in
control register set as PMGT1 = 1, PMGT0 = 1.
Normal Mode Power Dissipation 89.25 89.25 mW max V
DD
= 5.25 V: Typically 63 mW; SLEEP = V
DD
.
Sleep Mode Power Dissipation
With External Clock On 105 105 µW typ V
DD
= 5.25 V; SLEEP = 0 V.
With External Clock Off 52.5 52.5 µW max V
DD
= 5.25 V; Typically 5.25 µW; SLEEP = 0 V.
SYSTEM CALIBRATION
Offset Calibration Span
6
+0.05 × V
REF
/–0.05 × V
REF
V max/min Allowable Offset Voltage Span for Calibration.
Gain Calibration Span
6
+1.025 × V
REF
/–0.975 × V
REF
V max/min Allowable Full-Scale Voltage Span for Calibratio
n.
NOTES
1
Temperature ranges as follows: A Version, –40°C to +125°C; K Version, 0°C to 125°C.
2
Specifications apply after calibration.
3
SNR calculation includes distortion and noise components.
4
All digital inputs at DGND except for CONVST, SLEEP, CAL, and SYNC at DV
DD
. No load on the digital outputs. Analog inputs at AGND.
5
CLKIN at DGND when external clock off. All digital inputs at DGND except for CONVST, SLEEP, CAL, and SYNC at DV
DD
. No load on the digital outputs.
Analog inputs at AGND.
6
The offset and gain calibration spans are defined as the range of offset and gain errors that the AD7851 can calibrate. Note also that these are voltage spans and are
not absolute voltages (i.e., the allowable system offset voltage presented at AIN(+) for the system offset error to be adjusted out will be AIN(–) ± 0.05 × V
REF
, and the
allowable system full-scale voltage applied between AIN(+) and AIN(–) for the system full-scale voltage error to be adjusted out will be V
REF
± 0.025 × V
REF
). This is
explained in more detail in the Calibration section of the data sheet.
Specifications subject to change without notice.
–5–
REV. B
AD7851
Descriptions that refer to SCLK (rising) or SCLK (falling) edges are with the POLARITY pin HIGH. For the POLARITY pin
LOW, then the opposite edge of SCLK will apply.
Limit at T
MIN
, T
MAX
Parameter (A, K Versions) Unit Description
f
CLKIN
2
500 kHz min Master Clock Frequency
7 MHz max
f
SCLK
3
10 MHz max Interface Modes 1, 2, 3 (External Serial Clock)
f
CLK IN
MHz max Interface Modes 4, 5 (Internal Serial Clock)
t
1
4
100 ns min CONVST Pulse Width
t
2
50 ns max CONVST to BUSY Propagation Delay
t
CONVERT
3.25 µs max Conversion Time = 20 t
CLKIN
t
3
–0.4 t
SCLK
ns min SYNC to SCLK Setup Time (Noncontinuous SCLK Input)
±0.4 t
SCLK
ns min/max SYNC to SCLK Setup Time (Continuous SCLK Input)
t
4
0.6 t
SCLK
ns min SYNC to SCLK Setup Time, Interface Mode 4 Only
t
5
5
30 ns max Delay from SYNC until DOUT Three-State Disabled
t
5A
5
30 ns max Delay from SYNC until DIN Three-State Disabled
t
6
5
45 ns max Data Access Time after SCLK
t
7
30 ns min Data Setup Time prior to SCLK
t
8
20 ns min Data Valid to SCLK Hold Time
t
9
6
0.4 t
SCLK
ns min SCLK High Pulse Width (Interface Modes 4 and 5)
t
10
6
0.4 t
SCLK
ns min SCLK Low Pulse Width (Interface Modes 4 and 5)
t
11
30 ns min SCLK to SYNC Hold Time (Noncontinuous SCLK)
30/0.4 t
SCLK
ns min/max (Continuous SCLK) Does Not Apply to Interface Mode 3
t
11A
50 ns max SCLK to SYNC Hold Time
t
12
7
50 ns max Delay from SYNC until DOUT Three-State Enabled
t
13
90 ns max Delay from SCLK to DIN Being Configured as Output
t
14
8
50 ns max Delay from SCLK to DIN Being Configured as Input
t
15
2.5 t
CLKIN
ns max CAL to BUSY Delay
t
16
2.5 t
CLKIN
ns max CONVST to BUSY Delay in Calibration Sequence
t
CAL
9
41.7 ms typ Full Self-Calibration Time, Master Clock Dependent
(250026 t
CLKIN
)
t
CAL1
9
37.04 ms typ Internal DAC Plus System Full-Scale Calibration Time, Master Clock
Dependent (222228 t
CLKIN
)
t
CAL2
9
4.63 ms typ System Offset Calibration Time, Master Clock Dependent
(27798 t
CLKIN
)
t
DELAY
65 ns max Delay from CLK to SCLK
NOTES
1
Sample tested at 25°C to ensure compliance. All input signals are specified with tr = tf = 5 ns (10% to 90% of V
DD
) and timed from a voltage level of 1.6 V. See
Table X and timing diagrams for different interface modes and calibration.
2
Mark/space ratio for the master clock input is 40/60 to 60/40.
3
For Interface Modes 1, 2, 3, the SCLK maximum frequency will be 10 MHz. For Interface Modes 4 and 5, the SCLK will be an output and the frequency will be f
CLKIN
.
4
The CONVST pulse width will only apply for normal operation. When the part is in power-down mode, a different CONVST pulse width will apply (see Power-
Down section).
5
Measured with the load circuit of Figure 1 and defined as the time required for the output to cross 0.8 V or 2.4 V.
6
For self-clocking mode (Interface Modes 4, 5), the nominal SCLK high and low times will be 0.5 t
SCLK
= 0.5 t
CLKIN
.
7
The time t
12
is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 1. The measured number is then
extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that t
12
as quoted in the timing characteristics is the true bus
relinquish time of the part and is independent of the bus loading.
8
The time t
14
is derived form the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 1. The measured number is then
extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that the time quoted in the timing characteristics is the true
delay of the part in turning off the output drivers and configuring the DIN line as an input. Once this time has elapsed , the user can drive the DIN line knowing
that a bus conflict will not occur.
9
The typical time specified for the calibration times is for a master clock of 6 MHz.
Specifications subject to change without notice.
TIMING SPECIFICATIONS
1
(AV
DD
= DV
DD
= 5.0 V 5%; f
CLKIN
= 6 MHz, T
A
= T
MIN
to T
MAX
, unless otherwise noted.)

AD7851KNZ

Mfr. #:
Manufacturer:
Description:
Analog to Digital Converters - ADC 14B 333kSPS Serial Sampling
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