NX3L1T53 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 8 — 23 January 2013 8 of 24
NXP Semiconductors
NX3L1T53
Low-ohmic single-pole double-throw analog switch
[1] Typical values are measured at T
amb
= 25 C.
[2] Measured at identical V
CC
, temperature and input voltage.
[3] Flatness is defined as the difference between the maximum and minimum value of ON resistance measured at identical V
CC
and
temperature.
11.3 ON resistance test circuit and waveforms
R
ON
ON resistance mismatch
between channels
V
I
=GNDtoV
CC
;
I
SW
= 100 mA
[2]
V
CC
= 1.4 V - 0.04 0.3 - 0.3
V
CC
= 1.65 V - 0.04 0.2 - 0.3
V
CC
= 2.3 V - 0.02 0.08 - 0.1
V
CC
= 2.7 V - 0.02 0.075 - 0.1
V
CC
= 4.3 V - 0.02 0.075 - 0.1
R
ON(flat)
ON resistance (flatness) V
I
=GNDtoV
CC
;
I
SW
= 100 mA
[3]
V
CC
= 1.4 V - 1.0 3.3 - 3.6
V
CC
= 1.65 V - 0.5 1.2 - 1.3
V
CC
= 2.3 V - 0.15 0.3 - 0.35
V
CC
= 2.7 V - 0.13 0.3 - 0.35
V
CC
= 4.3 V - 0.2 0.4 - 0.45
Table 8. ON resistance …continued
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for graphs see Figure 9 to Figure 15.
Symbol Parameter Conditions 40 C to +85 C 40 C to +125 C Unit
Min Typ
[1]
Max Min Max
R
ON
= V
SW
/ I
SW
.
Fig 8. Test circuit for measuring ON resistance
S
E
Z
Y0
V
IL
or V
IH
V
CC
V
IL
switch
1
2V
IH
V
IL
S
V
IL
V
IL
E
V
I
V
001aah456
Y1
V
SW
switch
GND
1
2
I
SW
