AD7796/AD7797 Data Sheet
Rev. B | Page 4 of 24
Parameter AD7796B/AD7797B
1
Unit Test Conditions/Comments
INTERNAL/EXTERNAL CLOCK
Internal Clock
Frequency
2
64 ± 3% kHz min/max
Duty Cycle 50:50 % typ
External Clock
Frequency 64 kHz nom
A 128 kHz clock can be used if the divide by 2
function is used (Bit CLK1 = CLK0 = 1)
Duty Cycle 45:55 to 55:45 % typ
Applies for external 64 kHz clock (a 128 kHz
clock can have a less stringent duty cycle)
LOGIC INPUTS
CS
2
Input Low Voltage, V
INL
0.8 V max DV
DD
= 5 V
0.4 V max DV
DD
= 3 V
Input High Voltage, V
INH
2.0 V min DV
DD
= 3 V or 5 V
SCLK, CLK, and
DIN (Schmitt-Triggered Input)
2
V
T
(+) 1.4/2 V min/V max DV
DD
= 5 V
V
T
(–) 0.8/1.7 V min/V max DV
DD
= 5 V
V
T
(+) − V
T
(–) 0.1/0.17 V min/V max DV
DD
= 5 V
V
T
(+) 0.9/2 V min/V max DV
DD
= 3 V
V
T
(–) 0.4/1.35 V min/V max DV
DD
= 3 V
V
T
(+) V
T
(–)
0.06/0.13 V min/V max DV
DD
= 3 V
Input Currents ±10 µA max V
IN
= DV
DD
or GND
Input Capacitance 10 pF typ All digital inputs
LOGIC OUTPUTS (INCLUDING CLK)
Output High Voltage, V
OH
2
DV
DD
− 0.6 V min DV
DD
= 3 V, I
SOURCE
= 100 µA
4 V min DV
DD
= 5 V, I
SOURCE
= 200 µA
Output Low Voltage, V
OL
2
0.4 V max DV
DD
= 3 V, I
SINK
= 100 µA
0.4 V max
DV
DD
= 5 V, I
SINK
= 1.6 mA (DOUT/RDY)/800 µA (CLK)
Floating-State Leakage Current ±10 µA max
Floating-State Output Capacitance
10
pF typ
Data Output Coding Offset Binary
SYSTEM CALIBRATION
2
Full-Scale Calibration Limit
+1.05 × FS
V max
Zero-Scale Calibration Limit 1.05 × FS V min
Input Span 0.8 × FS V min
2.1 × FS V max
POWER REQUIREMENTS
7
Power Supply Voltage
AV
DD
GND 2.7/5.25 V min/max
DV
DD
GND 2.7/5.25 V min/max
Power Supply Currents
I
DD
Current 325 µA max 250 µA typ at AV
DD
= 3 V, 280 µA typ at AV
DD
= 5 V
I
DD
(Power-Down Mode) 1 µA max
1
Temperature range is40°C to +85°C.
2
Specification is not production tested, but is supported by characterization data at initial product release.
3
Following a calibration, this error is in the order of the noise for the update rate selected.
4
Recalibration at any temperature removes these errors.
5
Full-scale error applies to both positive and negative full-scale and applies at the factory calibration conditions (AV
DD
= 4 V, T
A
= 25°C).
6
FS[3:0] are the four bits used in the mode register to select the output word rate.
7
Digital inputs equal to DV
DD
or GND.
Data Sheet AD7796/AD7797
Rev. B | Page 5 of 24
TIMING CHARACTERISTICS
AV
DD
= 2.7 V to 5.25 V, DV
DD
= 2.7 V to 5.25 V, GND = 0 V, Input Logic 0 = 0 V, Input Logic 1 = DV
DD
, unless otherwise noted.
Table 2.
Parameter
1, 2
Limit at T
MIN
, T
MAX
(B Version) Unit Test Conditions/Comments
t
3
100 ns min SCLK high pulse width
t
4
100 ns min SCLK low pulse width
Read Operation
t
1
0 ns min
CS falling edge to DOUT/RDY active time
60 ns max DV
DD
= 4.75 V to 5.25 V
80 ns max DV
DD
= 2.7 V to 3.6 V
t
2
3
0 ns min SCLK active edge to data valid delay
4
60 ns max DV
DD
= 4.75 V to 5.25 V
80 ns max DV
DD
= 2.7 V to 3.6 V
t
5
5, 6
10 ns min
Bus relinquish time after
CS inactive edge
80 ns max
t
6
0 ns min
SCLK inactive edge to
CS inactive edge
t
7
10
ns min
SCLK inactive edge to DOUT/RDY high
Write Operation
t
8
0 ns min
CS falling edge to SCLK active edge setup time
4
t
9
30 ns min Data valid to SCLK edge setup time
t
10
25 ns min Data valid to SCLK edge hold time
t
11
0 ns min
CS rising edge to SCLK edge hold time
1
Sample tested during initial release to ensure compliance. All input signals are specified with t
R
= t
F
= 5 ns (10% to 90% of DV
DD
) and timed from a voltage level of 1.6 V.
2
See Figure 3 and Figure 4.
3
These numbers are measured with the load circuit of Figure 2 and defined as the time required for the output to cross the V
OL
or V
OH
limits.
4
SCLK active edge is falling edge of SCLK.
5
These numbers are derived from the measured time taken by the data output to change 0.5 V when loaded with the circuit of Figure 2. The measured number is then
extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that the times quoted in the timing characteristics are the true bus
relinquish times of the devices and, as such, are independent of external bus loading capacitances.
6
RDY
returns high after a read of the ADC. In single conversion mode and continuous conversion mode, the same data can be read again, if required, while
RDY
is high.
Care should be taken to ensure that subsequent reads do not occur close to the next output update. In continuous read mode, the digital word can be read only once.
I
S
IN
K
(1.6mA WITH DV
DD
= 5V,
100µA W
ITH
DV
D
D
=
3V)
I
SOURCE
(
200µA WI
TH DV
DD
=
5V,
100
µA W
ITH
DV
DD
= 3V)
1.6V
T
O
OUTPUT
PI
N
50p
F
06083-002
Figure 2. Load Circuit for Timing Characterization
AD7796/AD7797 Data Sheet
Rev. B | Page 6 of 24
TIMING DIAGRAMS
t
2
t
3
t
4
t
1
t
6
t
5
t
7
C
S
(I
)
D
O
U
T
/
RD
Y (O)
SCLK (I)
I = INPUT, O = OUTPUT
MSB LSB
06083-003
Figure 3. Read Cycle Timing Diagram
I =
I
NP
UT
CS (
I)
S
CL
K (
I
)
DIN (I)
MSB L
SB
t
8
t
9
t
10
t
11
06083-004
Figure 4. Write Cycle Timing Diagram

AD7796BRUZ

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Analog to Digital Converters - ADC Low Power 16-Bit
Lifecycle:
New from this manufacturer.
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