Philips Semiconductors Product data
PCA9504AGlue chip 4
2004 May 11
9
SYMBOL UNIT
LIMITS
TEST CONDITIONPARAMETER
SYMBOL UNITT
amb
= 0 °C to +70 °CTEST CONDITIONPARAMETER
SYMBOL UNIT
MAXTYPMIN
TEST CONDITIONPARAMETER
A20M / GP1_INB
V
IH
HIGH-level input voltage FLUSH mode 1.5 V
V
IL
LOW-level input voltage FLUSH mode 0.4 V
I
IL
Input leakage FLUSH mode –1 1 µA
VCCP_V
ref
Bias voltage FLUSH mode 0.95 1.1 V
V
IH
HIGH-level input voltage GP mode 2.4 V
V
IL
LOW-level input voltage GP mode 0.8 V
I
L
Input leakage GP mode –1 1 µA
VCCP_V
ref
Bias voltage GP mode 1.95 2.1 V
CLK_IN
V
IH
HIGH-level input voltage 2.2 V
V
IL
LOW-level input voltage 0.8 V
Hys Input hysteresis 250 mV
I
L
Input leakage –1 1 µA
SEL_33_66
V
IH
HIGH-level input voltage 2.0 V
V
IL
LOW-level input voltage 0.8 V
Hys Input hysteresis 400 mV
I
IH
Input leakage –1 1 µA
I
IL
Input leakage V
IL
= 0 V –88 –26 µA
SLP_S3
V
IH
HIGH-level input voltage 2.2 V
V
IL
LOW-level input voltage 0.8 V
Hys Input hysteresis 400 mV
I
L
Input leakage –1 1 µA
SLP_S5
V
IH
HIGH-level input voltage 2.2 V
V
IL
LOW-level input voltage 0.8 V
Hys Input hysteresis 400 mV
I
L
Input leakage –1 1 µA
CPU_PRESENT
V
IH
HIGH-level input voltage 2.0 V
V
IL
LOW-level input voltage 0.8 V
Hys Input hysteresis 400 mV
I
IH
Input leakage V
IH
= 3VSB –1 1 µA
I
IL
Input leakage V
IL
= 0 V –88 –26 µA
TEST_EN
V
IH
HIGH-level input voltage 0.7*5VSB V
V
IL
LOW-level input voltage 0.2*5VSB V
Hys Input hysteresis 400 mV
I
IH
Input leakage V
IL
= 0 V –1 1 µA
I
IL
Input leakage V
IH
= 5VSB 20 88 µA
