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2548FS–AVR–03/2013
ATmega406
8.2 Rev. E
Voltage ADC not functional below 0°C
Voltage-ADC Common Mode Offset
Voltage Reference Spike
1. Voltage-ADC Failing at Low Temperatures
Voltage ADC not functional below 0°C. The voltage ADC has a very large error below 0°C,
and can not be used
Problem Fix/Workaround
Do not use this revision below 0 celsius.
2. Voltage-ADC Common Mode Offset
The cell conversion will have an Offset-error depending on the Common Mode (CM) level.
This means that the error of a cell is depending on the voltage of the lower cells. The CM
Offset is calibrated away in Atmel production when the cells are balanced. When the cells
get un-balanced the CM depending offset will reappear:
a. Cell 1 defines its own CM level, and will never be affected by the CM dependent
offset.
b. The CM level for Cell 2 will change if Cell 1 voltage deviates from Cell 2 voltage.
c. The CM level for Cell 3 will change if Cell 1 and/or Cell 2 voltage deviates from the
voltage at Cell 3. The worst-case error is when Cell 1 and 2 are balanced while Cell 3
voltage deviates from the voltage at Cell 1 and 2.
d. The CM level for Cell 4 will change if Cell 1, Cell 2 and/or Cell 3 deviate from the volt-
age at Cell 4. The worst-case error is when Cell 1, Cell 2 and Cell 3 are balanced
while Cell 4 voltage deviates from the voltage at Cell 1, 2 and 3.
Figure 8-1 on page 20, shows the error of Cell2, Cell3 and Cell4 with 5% and 10% unbal-
anced cells.
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2548FS–AVR–03/2013
ATmega406
Figure 8-3. CM Offset with unbalanced cells.
Problem Fix/Workaround
Avoid getting unbalanced cells by using the internal cell balancing FETs.
3. Voltage Reference Spike
The Voltage Reference, VREF, will spike each time a temperature measurement is started
with the Voltage-ADC.
Problem Fix/Workaround
An accurate temperature measurement could be obtained by doing 10 temperature conver-
sions immediately after each other. The first 9 results would be inaccurate, but the 10th
conversion will be correct.
Figure 8-4 on page 24 illustrates the spike on the Voltage Reference when doing 10 temper-
ature conversions in a row (external decoupling capacitor of 1F).
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ATmega406
Figure 8-4. Voltage Reference Spike
If the CC-ADC is doing current accumulation while the V-ADC is doing temperature mea-
surement, both the Instantaneous and the Accumulated conversion results will be affected.
The spike on VREF will be visible on 1 Accumulated Current (CADAC3…0) and 2 Instanta-
neous Current (CADIC1…0) conversion results.
8.3 Rev. D
Voltage ADC not functional below 0°C
Voltage-ADC Common Mode Offset
Voltage Reference Spike
Voltage Regulator Start-up sequence
V
REF
influenced by MCU state
EEPROM read from application code does not work in Lock Bit Mode 3
1. Voltage-ADC Failing at Low Temperatures
Voltage ADC not functional below 0°C. The voltage ADC has a very large error below 0°C,
and can not be used
Problem Fix/Workaround
1. Voltage-ADC Common Mode Offset
The cell conversion will have an Offset-error depending on the Common Mode (CM) level.
This means that the error of a cell is depending on the voltage of the lower cells. The CM
Offset is calibrated away in Atmel production when the cells are balanced. When the cells
get un-balanced the CM depending offset will reappear:
VREF
time
Voltage
t ~< 5ms
V~50mV
1.1 V
VADSC (10 VTEMP conversion in a row)
VADMUX3:0
XXX VTEMP

ATMEGA406-1AAU

Mfr. #:
Manufacturer:
Microchip Technology / Atmel
Description:
8-bit Microcontrollers - MCU AVR 40K FLSH 2K SRAM 512B EE-1MHZ 1.8V
Lifecycle:
New from this manufacturer.
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