ML610Q435A-NNNTC0AGL Datasheet ML610Q435A-NNNTC0AGL, ML610Q435A-NNNTC03A7, ML610Q435 REFBOARD | P25-P27

FEDL610Q435-䋰2

LAPIS Semiconductor

ML610Q435/ML610Q436

25/35

V

DD

= 1.8 to 3.6V 200 30 2

V

DD

= 1.3 to 3.6V 200 30 -0.2

IIL2

VIL2 = V

SS

(when pulled-up)

V

DD

= 1.1 to 3.6V 20030 -0.01

IIH2Z VIH2 = V

DD

(in high-impedance state)   1

(P10–P11)

(P30–P35)

(P40–P47)

(PA0–PA7)

*1

IIL2Z VIL2 = V

SS

(in high-impedance state) 1  

*1: ML610Q435 only

*2: ML610Q436 only

DC CHARACTERISTICS (5/5))

(V

DD

= 1.1 to 3.6V, AV

DD

= 2.2 to 3.6V, V

SS

= AV

SS

= 0V, Ta = 20 to +70qC, unless otherwise specified) (5/5)

Rating

Parameter Symbol Condition

Min. Typ. Max.

Unit

Measuring

circuit

V

DD

= 1.3 to 3.6V

0.7

uV

DD

 V

DD

VIH1

V

DD

= 1.1 to 3.6V

0.7

uV

DD

 V

DD

V

DD

= 1.3 to 3.6V 0 

0.3

uV

DD

Input voltage 1

(RESET_N)

(TEST)

(NMI)

(P00–P03)

(P10–P11)

(P31–P35)

(P40–P43)

(P45–P47)

(PA0–PA7)

*1

VIL1

V

DD

= 1.1 to 3.6V 0 

0.2

uV

DD

V

DD

= 2.0 to 3.6V

0.05

uV

DD

0.18

uV

DD

0.4

uV

DD

Hysteresis width

(RESET_N)

(TEST_N)

(NMI)

(P00–P03)

(P10–P11)

(P31–P35)

(P40–P43)

(P45–P47)

(PA0–PA7)

*1

'VT

V

DD

= 1.1 to 3.6V

0.02

uV

DD

0.18

uV

DD

0.4

uV

DD

VIH2 

0.7

uV

DD

 V

DD

Input voltage 2

(P30, P44)

VIL2  0 

0.3

uV

DD

V 5

Input pin

capacitance

(NMI)

(P00–P03)

(P10–P11)

(P30–P35)

(P40–P47)

(PA0–PA7)

*1

CIN

f = 10kHz

V

rms

= 50mV

Ta = 25qC

  5 pF 

*1: ML610Q435 only

HYSTERESIS WIDTH

'V

T

Input signal

Internal signal

V

DD

V

SS

V

SS

V

DDL

FEDL610Q435-䋰2

LAPIS Semiconductor

ML610Q435/ML610Q436

26/35

MEASURING CIRCUITS

MEASURING CIRCUIT 1

MEASURING CIRCUIT 2

XT0

XT1

P10/OSC0

P11/OSC1

32.768kHz crystal

4.096MHz

crystal

C

GH

C

DH

A

V

DD

AV

DD

V

REF

V

DDL

V

DDX

C

L1

C

L0

C

X

V

L1

C

a

V

L2

C

b

V

L3

C

c

V

L4

C

d

V

SS

AV

SS

C4

C3

C2

C1

C

12

C

34

C

V

: 1

P

F

C

L0

: 1PF

C

L1

: 0.1PF

C

X

: 0.1PF

C

a

,C

b

,C

c

,C

d

: 1PF

C

12

,C

34

: 1PF

C

GH

: 24pF

C

DH

: 24pF

32.768kHz crystal:

C-001R (Epson Toyocom)

4.096MHz crystal:

HC49SFWB (Kyocera)

C

V

Input pins

V

DD

AV

DD

V

REF

V

DDL

V

DDX

V

L1

V

L2

V

L3

V

L4

V

SS

AV

SS

VIH

VIL

Output pins

(*1) Input logic circuit to determine the specified measuring conditions.

(*2) Measured at the specified output pins.

(*2)

(*1)

FEDL610Q435-䋰2

LAPIS Semiconductor

ML610Q435/ML610Q436

27/35

MEASURING CIRCUIT 3

MEASURING CIRCUIT 4

MEASURING CIRCUIT 5

Input pins

A

V

DD

AV

DD

V

REF

V

DDL

V

DDX

V

L1

V

L2

V

L3

V

L4

V

SS

AV

SS

Output pins

*3: Measured at the specified output pins.

(*3)

Input pins

V

DD

AV

DD

V

REF

V

DDL

V

DDX

V

L1

V

L2

V

L3

V

L4

V

SS

AV

SS

VIH

VIL

Output pins

*1: Input logic circuit to determine the specified measuring conditions.

(*1)

Waveform monitoring

Input pins

A

V

DD

AV

DD

V

REF

V

DDL

V

DDX

V

L1

V

L2

V

L3

V

L4

V

SS

AV

SS

VIH

VIL

Output pins

*1: Input logic circuit to determine the specified measuring conditions.

*2: Measured at the specified output pins.

(*2)

(*1)

ML610Q435A-NNNTC0AGL

ML610Q435A-NNNTC0AGL

Products related to this Datasheet