ADV7842
Rev. B | Page 9 of 28
TIMING CHARACTERISTICS
Data and I
2
C Timing Characteristic
Table 5.
Parameter
1
Symbol Test Conditions/Comments Min Typ Max Unit
CLOCK AND CRYSTAL
Crystal Frequency, XTAL 28.63636 MHz
Crystal Frequency Stability ±50 ppm
Horizontal Sync Input Frequency 10 110 kHz
LLC Frequency Range 12.825 170 MHz
I
2
C PORTS
SCL Frequency 400 kHz
SCL Minimum Pulse Width High t
1
600 ns
SCL Minimum Pulse Width Low t
2
1.3 µs
Start Condition Hold Time t
3
600 ns
Start Condition Setup Time t
4
600 ns
SDA Setup Time t
5
100 ns
SCL and SDA Rise Time t
6
1000 ns
SCL and SDA Fall Time t
7
300 ns
Stop Condition Setup Time t
8
0.6 µs
TTX I
2
C PORTS
SCL Frequency 3.4 MHz
SCL Minimum Pulse Width High t
1
60 ns
SCL Minimum Pulse Width Low t
2
160 ns
Start Condition Hold Time t
3
160 ns
Start Condition Setup Time t
4
160 ns
SDA Setup Time t
5
10 ns
SCL and SDA Rise Time t
6
10 80 ns
SCL and SDA Fall Time t
7
10 80 ns
Stop Condition Setup Time t
8
160 ns
RESET FEATURE
Reset Pulse Width 5 ms
CLOCK OUTPUTS
LLC Mark-Space Ratio t
9
:t
10
45:55 55:45 % duty cycle
DATA AND CONTROL OUTPUTS
2
Data Output Transition Time SDR (SDP) t
11
End of valid data to negative clock edge 2.9 4.6 ns
Data Output Transition Time SDR (SDP) t
12
Negative clock edge to start of valid data 0.2 0.6 ns
Data Output Transition Time SDR (CP) t
13
End of valid data to negative clock edge 1.5 2.2 ns
Data Output Transition Time SDR (CP) t
14
Negative clock edge to start of valid data 0.1 0.3 ns
I
2
S PORT, MASTER MODE
SCLK Mark-Space Ratio t
15
:t
16
45:55 55:45 % duty cycle
LRCLK Data Transition Time t
17
End of valid data to negative SCLK edge 10 ns
LRCLK Data Transition Time t
18
Negative SCLK edge to start of valid data 10 ns
I2Sx Data Transition Time t
19
End of valid data to negative SCLK edge 5 ns
I2Sx Data Transition Time t
20
Negative SCLK edge to start of valid data 5 ns
1
Guaranteed by characterization.
2
With the DLL block on output clock bypassed.
ADV7842
Rev. B | Page 10 of 28
TIMING DIAGRAMS
08849-003
SDA
SCL
t
5
t
3
t
4
t
8
t
6
t
7
t
2
t
1
t
3
Figure 3. I
2
C Timing
08849-004
t
9
LLC
P0 TO P35, HS/CS,
VS/FIELD, FIELD/DE
t
11
t
12
t
10
Figure 4. Pixel Port and Control SDR Output Timing (SDP)
08849-005
t
9
LLC
P0 TO P35, VS/FIELD,
HS/CS, FIELD/DE
t
13
t
14
t
10
Figure 5. Pixel Port and Control SDR Output Timing (CP)
SCLK
LRCLK
I2Sx
LEFT-JUSTIFIED
MODE
I2Sx
RIGHT-JUSTIFIED
MODE
I2Sx
I
2
S MODE
MSB MSB – 1
t
15
t
16
t
17
t
19
t
20
t
18
MSB
MSB – 1
LSBMSB
t
19
t
20
t
19
t
20
NOTES
1. THE SUFFIX x REFERS TO 0, 1, 2, AND 3 ENDING PIN NAMES.
2. LRCLK IS A SIGNAL ACCESSIBLE VIA AP5 PIN.
3. I2Sx ARE SIGNALS ACCESSIBLE VIA AP1 TO AP4 PINS.
08849-006
Figure 6. I
2
S Timing
ADV7842
Rev. B | Page 11 of 28
ABSOLUTE MAXIMUM RATINGS
Table 6.
Parameter Rating
AVDD to GND 2.2 V
VDD to GND 2.2 V
PVDD to GND 2.2 V
DVDDIO to GND 4.0 V
VDD_SDRAM to GND 4.0 V
CVDD to GND 2.2 V
TVDD to GND 4.0 V
AVDD to PVDD −0.3 V to +0.3 V
AVDD to VDD −0.3 V to +0.3 V
TVDD to CVDD −0.3 V to +2.2 V
DVDDIO to VDD_SDRAM −0.3 V to +3.3 V
VDD_SDRAM to AVDD −0.3 V to +2 V
VDD_SDRAM to VDD −0.3 V to +2 V
Digital Inputs Voltage to GND −0.3 V to DVDDIO + 0.3 V
Digital Outputs Voltage to GND −0.3 V to DVDDIO + 0.3 V
5 V Tolerant Digital Inputs to GND
1
5.5 V
Analog Inputs to GND −0.3 V to AVDD + 0.3 V
XTALN and XTALP to GND −0.3 V to PVDD + 0.3 V
Maximum Junction Temperature
(T
J MAX
)
125°C
Storage Temperature Range −65°C to +150°C
Infrared Reflow Soldering (20 sec) 260°C
1
The following inputs are 3.3 V inputs but are 5 V tolerant: HS_IN1/TRI5,
HS_IN2/TRI7, VS_IN1/TRI6, VS_IN2/TRI8, DDCA_SCL, DDCA_SDA, DDCB_SCL
and DDCB_SDA.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
PACKAGE THERMAL PERFORMANCE
To reduce power consumption when using the ADV7842, the
user is advised to turn off unused sections of the part.
Due to PCB metal variation, and therefore variation in PCB
heat conductivity, the value of θ
JA
may differ for various PCBs.
The most efficient measurement solution is obtained using the
package surface temperature to estimate the die temperature
because this eliminates the variance associated with the θ
JA
value.
The maximum junction temperature (T
J
MAX
) of 125°C must not be
exceeded. The following equation calculates the junction tempera-
ture using the measured package surface temperature and applies
only when no heat sink is used on the device under test (DUT):
( )
TOTALJT
S
J
WΨTT
×+=
where:
T
S
is the package surface temperature (°C).
Ψ
JT
= 0.5°C/W for the 256-ball BGA.
W
TOTAL
= (PVDD × I
PVDD
) + (0.4 × TVDD × I
TVDD
) +
(CVDD × I
CVDD
) + (AVDD × I
AVDD
) + (VDD × I
VDD
) +
(A × DVDDIO × I
DVDDIO
) + (VDD_SDRAM × I
VDD_SDRAM
)
where:
0.4 reflects the 40% of TVDD power that is dissipated on the
part itself.
A = 0.5 when the output pixel clock is >74 MHz.
A = 0.75 when the output pixel clock is ≤74 MHz.
ESD CAUTION

EVAL-ADV7842-7511P

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Video IC Development Tools Require HDMI license see product comment
Lifecycle:
New from this manufacturer.
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