Functional Description
Mean Time to Failure
The mean time to failure (MTTF) for the device can be calculated based on the compo-
nent reliability data using the methods referenced in the Telcordia SR-322 reliability
prediction procedures for electronic equipment and measured during Reliability Dem-
onstration Test.
Table 3: MTTF
Capacity MTTF (Operating Hours)
All 2.0 million
Note:
1. Based on population statistics that are not relevant to individual units, 8760 power on
hours per year, 250 power on/off cycles per year, nominal voltages and an environment
that does not exceed specified case temperature.
Endurance
SSD endurance is dependent on many factors, including: usage conditions applied to
the drive, drive performance and capacity, formatted sector size, error correction codes
(ECCs) in use, internal NAND PROGRAM/ERASE cycles, write amplification factor,
wear-leveling efficiency of the drive, over-provisioning ratio, valid user data on the
drive, drive temperature, NAND process parameters, and data retention time.
The device is designed to operate under a wide variety of conditions, while delivering
the maximum performance possible and meeting enterprise market demands.
While actual endurance varies depending on conditions, the drive lifetime can be esti-
mated based on capacity, assumed fixed-use models, ECC, and formatted sector size.
Lifetime estimates for the device are shown in the following tables in total bytes written.
Table 4: Total Bytes Written
Model Capacity Sequential Writes Random Writes (4KB) Unit
7100 ECO
480GB 5.84 0.26
PB
960GB 11.6 0.52
1.92TB 23.3 1.05
7100 MAX
400GB 5.84 2.19
800GB 11.6 4.38
1.6TB 23.3 8.76
Note:
1. Values shown are based on system modeling.
7100 U.2 NVMe PCIe SSD
Functional Description
CCMTD-731836775-10498
7100_u2_nvme_pcie_ssd.pdf - Rev. G 03/17 EN
6
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