CYRS1542AV18
CYRS1544AV18
Document Number: 001-60006 Rev. *M Page 22 of 34
Maximum Ratings
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage temperature ................................ –65 °C to +150 °C
Case temperature under power ............... –55 °C to +125 °C
Junction temperature under power ........... –55 °C to +150°C
Supply voltage on V
DD
relative to GND .......–0.5 V to +2.9 V
Supply voltage on V
DDQ
relative to GND ...... –0.5 V to +V
DD
DC applied to outputs in high Z ........–0.5 V to V
DDQ
+ 0.5 V
DC input voltage
[18]
...........................–0.5 V to V
DD
+ 0.5 V
Current into outputs (LOW) ........................................20 mA
Static discharge voltage
(MIL-STD-883, TM. 3015) ......................................> 2001 V
Latch up current .....................................................> 200 mA
Operating Range
Range
Case Temperature
(T
c
) V
DD
[19]
V
DDQ
[19]
Military –55 °C to +125 °C 1.8 ± 0.1 V 1.4 V to V
DD
Electrical Characteristics
Over the Operating Range
DC Electrical Characteristics
Over the Operating Range
Parameter
[20]
Description Test Conditions Min Typ Max Unit
V
DD
Power supply voltage 1.7 1.8 1.9 V
V
DDQ
I/O supply voltage 1.4 1.5 V
DD
V
V
OH
Output high voltage Note 21 V
DDQ
/2 – 0.12 V
DDQ
/2 + 0.12 V
V
OL
Output low voltage Note 22 V
DDQ
/2 – 0.12 V
DDQ
/2 + 0.12 V
V
OH(LOW)
Output high voltage I
OH
=0.1 mA, nominal impedance V
DDQ
– 0.2 V
DDQ
V
V
OL(LOW)
Output low voltage I
OL
= 0.1 mA, nominal impedance V
SS
0.2 V
V
IH
Input high voltage V
REF
+ 0.1 V
DDQ
+ 0.3 V
V
IL
Input low voltage –0.3 V
REF
– 0.1 V
I
X
Input leakage current GND V
I
V
DDQ
20 20 A
I
OZ
Output leakage current GND V
I
V
DDQ,
output disabled 20 20 A
V
REF
Input reference voltage
[23]
Typical value = 0.75 V 0.68 0.75 0.95 V
I
DD
[24]
V
DD
operating supply V
DD
= Max,
I
OUT
= 0 mA,
T
J
=125 °C,
f = f
MAX
= 1/t
CYC
250 MHz (× 18) –1700mA
(× 36) 1700
I
SB1
Automatic power down
current
Max V
DD
,
Both ports deselected,
V
IN
V
IH
or V
IN
V
IL
,
f = f
MAX
= 1/t
CYC
,
T
J
= 125 °C,
Inputs static
250 MHz (× 18) 660 mA
(× 36) 660
Notes
18. Overshoot: V
IH(AC)
< V
DDQ
+ 0.85 V (Pulse width less than t
CYC
/2), Undershoot: V
IL(AC)
> 1.5 V (Pulse width less than t
CYC
/2).
19. Power up: Assumes a linear ramp from 0 V to V
DD(min)
within 200 ms. During this time V
IH
< V
DD
and V
DDQ
< V
DD
.
20. All Voltage referenced to ground.
21. Output are impedance controlled. I
OH
= (V
DDQ
/2)/(RQ/5) for values of 175 < RQ < 350 .
22. Output are impedance controlled. I
OL
= (V
DDQ
/2)/(RQ/5) for values of 175 < RQ < 350 .
23. V
REF(min)
= 0.68 V or 0.46 V
DDQ
, whichever is larger, V
REF(max)
= 0.95 V or 0.54 V
DDQ
, whichever is smaller.
24. The operation current is calculated with concurrent read and write cycles.
CYRS1542AV18
CYRS1544AV18
Document Number: 001-60006 Rev. *M Page 23 of 34
AC Electrical Characteristics
Over the Operating Range
Parameter
[25, 26]
Description Test Conditions Min Typ Max Unit
V
IH
Input high voltage V
REF
+ 0.2 V
V
IL
Input low voltage V
REF
– 0.2 V
Radiation Performance
Parameter Test Conditions Limits Unit
Total dose T
A
= 25 °C, V
DD
= V
DDQ
= 1.8 V 300 Krad Rads(Si) Co60
Soft error rate T
A
= 25 °C to 125 °C, V
DD
= V
DDQ
= 1.8 V with EDAC 1.0 × 10^
-10
Upsets/bit-day
Transient dose
rate upset
Pulse width (FWHM) = 50 ns, X-Ray, T
C
= 25 °C, V
DD
= V
DDQ
= 1.8 V 2.0 × 10
9
Rads(Si)/s
Neutron fluence 1 MeV equivalent energy, Unbiased T
A
= 25 C 2e14 N/cm
2
Latch up
immunity
T
A
= 125 °C, V
DD
= V
DDQ
= 1.9 V 110 MeVcm
2
/mg
Capacitance
Parameter
[27]
Description Test Conditions Max Unit
C
IN
Input capacitance T
A
= 25 °C, f = 1 MHz, V
DD
= 1.8 V, V
DDQ
= 1.5 V 10 pF
C
CLK
Clock input capacitance 10 pF
C
O
Output capacitance 10 pF
Thermal Resistance
Parameter
[27]
Description Test Conditions
165-ball CCGA
Package
Unit
JC
Thermal resistance
(Junction to case)
Test conditions follow standard test methods and procedures
for measuring thermal impedance, in accordance with
EIA/JESD51.
8.9 °C/W
Notes
25. Overshoot: V
IH(AC)
< V
DDQ
+ 0.85 V (Pulse width less than t
CYC
/2), Undershoot: V
IL(AC)
> 1.5 V (Pulse width less than t
CYC
/2).
26. Power up: Assumes a linear ramp from 0 V to V
DD(min)
within 200 ms. During this time V
IH
< V
DD
and V
DDQ
< V
DD
.
27. Tested initially and after any design or process change that may affect these parameters.
CYRS1542AV18
CYRS1544AV18
Document Number: 001-60006 Rev. *M Page 24 of 34
AC Test Loads and Waveforms
Figure 5. AC Test Loads and Waveforms
1.25 V
0.25 V
R = 50
5pF
INCLUDING
JIG AND
SCOPE
ALL INPUT PULSES
DEVICE
R
L
= 50
Z
0
= 50
V
REF
= 0.75 V
V
REF
= 0.75 V
[28]
0.75 V
UNDER
TEST
0.75 V
DEVICE
UNDER
TEST
OUTPUT
0.75 V
V
REF
V
REF
OUTPUT
ZQ
ZQ
(a)
SLEW RATE= 2 V/ns
RQ =
250
(b)
RQ =
250
Note
28. Unless otherwise noted, test conditions are based on signal transition time of 2 V/ns, timing reference levels of 0.75 V, Vref = 0.75 V, RQ = 250 , V
DDQ
= 1.5 V, input
pulse levels of 0.25 V to 1.25 V, and output loading of the specified I
OL
/I
OH
and load capacitance shown in (a) of Figure 5.

CYPT1542AV18-250GCMB

Mfr. #:
Manufacturer:
Cypress Semiconductor
Description:
SRAM 72Mb 1.8V 250Mhz 4M x 18 QDR II SRAM
Lifecycle:
New from this manufacturer.
Delivery:
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