MT36HTS51272Y-53EA2

PDF: 09005aef822553c2/Source: 09005aef822553af Micron Technology, Inc., reserves the right to change products or specifications without notice.
HT36HTJ51272.fm - Rev. B 7/06 EN
10 ©2003 Micron Technology, Inc. All rights reserved.
4GB (x72, ECC, DR) 240-Pin DDR2 SDRAM RDIMM
Serial Presence-Detect
Notes: 1. PLL specifications are critical for proper operation of the DDR2 DIMM. This is a subset of
parameters for the specific PLL used. Detailed PLL information is available in JEDEC Stan-
dard JESD82.
2. Static phase offset does not include jitter.
3. Period jitter and half-period jitter specifications are separate specifications that must be
met independently of each other.
4. Design target is 60ps, unless it is not achievable.
5. VOX specified at the DRAM clock input, or the test load.
6. The output slew rate is determined from the IBIS model:
Serial Presence-Detect
Table 11: PLL Clock Driver Timing Requirements and Switching Characteristics
Note: 1
Parameter Symbol
0°C T
OPR
+55°C
VDD = +1.8V ±0.1V
UnitsMin Max
Stabilization time
t
L–15µs
Input clock slew rate
t
LS
I
1.0 4 V/ns
SSC modulation frequency
30 33 KHz
SSC clock input frequency deviation
0.0 –0.50 %
PLL loop bandwidth (–3dB from unity gain)
2.0 MHz
Table 12: Serial Presence-Detect EEPROM DC Operating Conditions
All voltages referenced to VSS; VDDSPD = +1.7V to +3.6V
Parameter/Condition Symbol Min Max Units
Supply voltage
V
DDSPD 1.7 3.6 V
Input high voltage: Logic 1; All inputs
V
IH VDDSPD × 0.7 VDDSPD + 0.5 V
Input low voltage: Logic 0; All inputs
V
IL –0.6 VDDSPD × 0.3 V
Output low voltage: I
OUT = 3mA
V
OL –0.4V
Input leakage current: V
IN = GND to VDD
ILI 0.10 3 µA
Output leakage current: V
OUT = GND to VDD
ILO 0.05 3 µA
Standby current
I
SB 1.6 4 µA
Power supply current, READ: SCL clock frequency = 100 KHz
I
CC
R
0.4 1 mA
Power supply current, WRITE: SCL clock frequency = 100 KHz
I
CC
W
23mA
V
DD
GND
V
DD
CU877
R = 60
R = 60
V
CK
V
CK
2
PDF: 09005aef822553c2/Source: 09005aef822553af Micron Technology, Inc., reserves the right to change products or specifications without notice.
HT36HTJ51272.fm - Rev. B 7/06 EN
11 ©2003 Micron Technology, Inc. All rights reserved.
4GB (x72, ECC, DR) 240-Pin DDR2 SDRAM RDIMM
Serial Presence-Detect
Notes: 1. To avoid spurious start and stop conditions, a minimum delay is placed between SCL = 1 and
the falling or rising edge of SDA.
2. This parameter is sampled.
3. For a restart condition, or following a WRITE cycle.
4. The SPD EEPROM WRITE cycle time (
t
WRC) is the time from a valid STOP condition of a write
sequence to the end of the EEPROM internal ERASE/PROGRAM cycle. During the WRITE
cycle, the EEPROM bus interface circuit is disabled, SDA remains HIGH due to the pull-up
resistor, and the EEPROM does not respond to its slave address.
Table 13: Serial Presence-Detect EEPROM AC Operating Conditions
All voltages referenced to VSS; VDDSPD = +1.7V to +3.6V
Parameter/Condition Symbol Min Max Units Notes
SCL LOW to SDA data-out valid
t
AA 0.2 0.9 µs 1
Time the bus must be free before a new transition can start
t
BUF 1.3 µs
Data-out hold time
t
DH 200 ns
SDA and SCL fall time
t
F–300ns2
Data-in hold time
t
HD:DAT 0 µs
Start condition hold time
t
HD:STA 0.6 µs
Clock HIGH period
t
HIGH 0.6 µs
Noise suppression time constant at SCL, SDA inputs
t
I–50ns
Clock LOW period
t
LOW 1.3 µs
SDA and SCL rise time
t
R–0.3µs2
SCL clock frequency
f
SCL 400 KHz
Data-in setup time
t
SU:DAT 100 ns
Start condition setup time
t
SU:STA 0.6 µs 3
Stop condition setup time
t
SU:STO 0.6 µs
WRITE cycle time
t
WRC 10 ms 4
PDF: 09005aef822553c2/Source: 09005aef822553af Micron Technology, Inc., reserves the right to change products or specifications without notice.
HT36HTJ51272.fm - Rev. B 7/06 EN
12 ©2003 Micron Technology, Inc. All rights reserved.
4GB (x72, ECC, DR) 240-Pin DDR2 SDRAM RDIMM
Serial Presence-Detect
Table 14: Serial Presence-Detect Matrix
“1”/“0”: serial data, “driven to HIGH”/“driven to LOW”
Byte Description Entry (Version) MT36HTJ51272(P)
0
Number of SPD bytes used by Micron
128 80
1
Total number of bytes in SPD device
256 08
2
Fundamental memory type
DDR2 SDRAM 08
3
Number of row addresses on SDRAM
14 0E
4
Number of column addresses on SDRAM
11 0B
5
DIMM height and module ranks
30mm, dual rank 61
6
Module data width
72 48
7
Reserved
000
8
Module voltage interface levels
SSTL 1.8V 05
9
SDRAM cycle time,
t
CK
(CL = MAX value, see byte 18)
-667
-53E
-40E
30
3D
50
10
SDRAM access from clock,
t
AC
(CL = MAX value, see byte 18)
-667
-53E
-40E
45
50
60
11
Module configuration type
ECC
ECC and parity (P)
02
06
12
Refresh rate/type
7.81µs/SELF 82
13
SDRAM device width (primary SDRAM)
404
14
Error-checking SDRAM data width
404
15
Reserved
00
16
Burst lengths supported
4, 8 0C
17
Number of banks on SDRAM device
808
18
CAS latencies supported
-667 (5, 4, 3)
-53E/-40E (4, 3)
38
18
19
Module thickness
03
20
DDR2 DIMM type
Registered DIMM 01
21
SDRAM module attributes
1 PLL, 2 Registers 05
22
SDRAM device attributes: weak driver (01) or, weak driver
and 50Ω ODT (03)
-667
-53E/-40E
03
01
23
SDRAM cycle time,
t
CK, MAX CL - 1
-667
-53E/-40E
3D
50
24
SDRAM access from CK,
t
AC, MAX CL - 1
-667
-53E
-40E
45
50
60
25
SDRAM cycle time,
t
CK, MAX CL - 2
-667
-53E/-40E(N/S)
50
00
26
SDRAM access from CK,
t
AC, MAX CL - 2
-667
-53E/-40E(N/S)
45
00
27
MIN row precharge time,
t
RP
-667/
-53E/-40E
3C
3C
28
MIN row active-to-row active,
t
RRD
1E
29
MIN RAS#-to-CAS# delay,
t
RCD
-667/
-53E/-40E
3C
3C
30
MIN RAS# pulse width,
t
RAS
-667/-53E
-40E
2D
28
31
Module rank density
2GB 02

MT36HTS51272Y-53EA2

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR2 SDRAM 4GB 240FBDIMM
Lifecycle:
New from this manufacturer.
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