ICS83940DYI REVISION C May 19, 2016 7 ©2016 Integrated Device Technology, Inc.
ICS83940DI Data Sheet LOW SKEW, 1-TO-18 LVPECL-TO-LVCMOS/LVTTL FANOUT BUFFER
Table 5B. AC Characteristics, V
DD
= 3.3V ± 5%, V
DDO
= 2.5V ± 5%, T
A
= -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE: All parameters measured at 200MHz unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the output V
DDO
/2.
NOTE 2: Measured from V
DD
/2 to V
DDO
/2.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V
DDO
/2.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature and with equal load
conditions. Using the same type of inputs on each device, the outputs are measured at V
DDO
/2.
NOTE 5: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 6: Defined as skew between outputs on different devices, across temperature and voltage ranges, and with equal load conditions. Using
the same type of inputs on each device, the outputs are measured at V
DDO
/2.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
MAX
Output Frequency 250 MHz
t
PLH
Propagation
Delay
PCLK, nPCLK; NOTE 1, 5 ƒ 150MHz 1.7 3.2 ns
LVCMOS_CLK; NOTE 2, 5 ƒ 150MHz 1.7 3.0 ns
Propagation
Delay
PCLK, nPCLK; NOTE 1, 5 ƒ > 150MHz 1.6 3.4 ns
LVCMOS_CLK; NOTE 2, 5 ƒ > 150MHz 1.8 3.3 ns
tsk(o)
Output Skew;
NOTE 3, 5
PCLK, nPCLK
Measured on the Rising Edge
@ V
DDO
/2
150 ps
LVCMOS_CLK 150 ps
tsk(pp)
Part-to-Part Skew;
NOTE 6
PCLK, nPCLK ƒ 150MHz 1.5 ns
LVCMOS_CLK ƒ 150MHz 1.3 ns
Part-to-Part Skew;
NOTE 6
PCLK, nPCLK ƒ > 150MHz 1.8 ns
LVCMOS_CLK ƒ > 150MHz 1.5 ns
Part-to-Part Skew;
NOTE 4, 5
PCLK, nPCLK
Measured on the Rising Edge
@ V
DDO
/2
850 ps
LVCMOS_CLK 750 ps
t
R
/ t
F
Output Rise/Fall Time 0.5V to 1.8V 0.3 1.2 ns
odc Output Duty Cycle ƒ < 134MHz 45 50 55 %
ICS83940DYI REVISION C May 19, 2016 8 ©2016 Integrated Device Technology, Inc.
ICS83940DI Data Sheet LOW SKEW, 1-TO-18 LVPECL-TO-LVCMOS/LVTTL FANOUT BUFFER
Table 5C. AC Characteristics, V
DD
= V
DDO
= 2.5V ± 5%, T
A
= -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE: All parameters measured at 200MHz unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the output V
DDO
/2.
NOTE 2: Measured from V
DD
/2 to V
DDO
/2.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V
DDO
/2.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature and with equal load
conditions. Using the same type of inputs on each device, the outputs are measured at V
DDO
/2.
NOTE 5: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 6: Defined as skew between outputs on different devices, across temperature and voltage ranges, and with equal load conditions. Using
the same type of inputs on each device, the outputs are measured at V
DDO
/2.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
MAX
Output Frequency 200 MHz
t
PLH
Propagation
Delay
PCLK, nPCLK; NOTE 1, 5 ƒ 150MHz 1.2 3.8 ns
LVCMOS_CLK; NOTE 2, 5 ƒ 150MHz 1.5 3.2 ns
Propagation
Delay
PCLK, nPCLK; NOTE 1, 5 ƒ > 150MHz 1.5 3.7 ns
LVCMOS_CLK; NOTE 2, 5 ƒ > 150MHz 2.0 3.6 ns
tsk(o)
Output Skew;
NOTE 3, 5
PCLK, nPCLK
Measured on the Rising Edge
@ V
DDO
/2
200 ps
LVCMOS_CLK 200 ps
tsk(pp)
Part-to-Part Skew;
NOTE 6
PCLK, nPCLK ƒ 150MHz 2.6 ns
LVCMOS_CLK ƒ 150MHz 1.7 ns
Part-to-Part Skew;
NOTE 6
PCLK, nPCLK ƒ > 150MHz 2.2 ns
LVCMOS_CLK ƒ > 150MHz 1.7 ns
Part-to-Part Skew;
NOTE 4, 5
PCLK, nPCLK
Measured on the Rising Edge
@ V
DDO
/2
1.2 ns
LVCMOS_CLK 1.0 ns
t
R
/ t
F
Output Rise/Fall Time 0.5V to 1.8V 0.3 1.2 ns
odc Output Duty Cycle ƒ < 134MHz 45 55 %
ICS83940DYI REVISION C May 19, 2016 9 ©2016 Integrated Device Technology, Inc.
ICS83940DI Data Sheet LOW SKEW, 1-TO-18 LVPECL-TO-LVCMOS/LVTTL FANOUT BUFFER
Parameter Measurement Information
3.3V Core/3.3V LVCMOS Output Load AC Test Circuit
3.3V Core/2.5V LVCMOS Output Load AC Test Circuit
Part-to-Part Skew
2.5V Core/2.5V LVCMOS Output Load AC Test Circuit
Differential Input Level
Output Skew
SCOPE
Qx
GND
V
DD,
1.65V±5%
-1.65V±5%
V
DDO
SCOPE
Qx
GND
V
DD
-1.25V±5%
1.25V±5%
2.05V±5%
V
DDO
tsk(pp)
V
DDO
2
V
DDO
2
Part 1
Part 2
Qx
Qy
SCOPE
Qx
GND
V
DD,
1.25V±5%
-1.25V±5%
V
DDO
V
DD
GND
PCLK
nPCLK
V
CMR
Cross Points
V
PP
Qx
Qy

83940DYILFT

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Description:
Clock Drivers & Distribution 18 LVCMOS OUT BUFFER
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