Electrical specifications VN5016AJ-E
10/32
Table 8. Logic input
Symbol Parameter Test conditions Min. Typ. Max. Unit
V
IL
Input low level voltage 0.9 V
I
IL
Low level input current V
IN
=0.9V 1 µA
V
IH
Input high level voltage 2.1 V
I
IH
High level input current V
IN
=2.1V 10 µA
V
I(hyst)
Input hysteresis voltage 0.25 V
V
ICL
Input clamp voltage
I
IN
=1mA
I
IN
=-1mA
5.5
-0.7
7V
V
V
CSDL
CS_DIS low level voltage 0.9 V
I
CSDL
Low level CS_DIS
current
V
CSD
=0.9V 1 µA
V
CSDH
CS_DIS high level
voltage
2.1 V
I
CSDH
High level CS_DIS
current
V
CSD
=2.1V 10 µA
V
CSD(hyst)
CS_DIS hysteresis
voltage
0.25 V
V
CSCL
CS_DIS clamp voltage
I
CSD
=1mA
I
CSD
=-1mA
5.5
-0.7
7V
V
Table 9. Protections and diagnostics
(1)
(1) To ensure long term reliability under heavy overload or short circuit conditions, protection and related
diagnostic signals must be used together with a proper software strategy. If the device is subjected to
abnormal conditions, this software must limit the duration and number of activation cycles.
Symbol Parameter Test conditions Min. Typ. Max. Unit
I
limH
DC short circuit current
V
CC
=13V
5V<V
CC
<36V
46 65 91
91
A
A
I
limL
Short circuit current
during thermal cycling
V
CC
=13V T
R
<T
j
<T
TSD
24 A
T
TSD
Shutdown temperature 150 175 200 °C
T
R
Reset temperature
T
R
S
+1 T
RS
+5 °C
T
RS
Thermal reset of
STATUS
135 °C
T
HYST
Thermal hysteresis
(T
TSD
-T
R
)
C
V
DEMAG
Turn-Off output voltage
clamp
I
OUT
=2A; V
IN
=0; L=6mH
V
CC
-41
V
CC
-46
V
CC
-52
V
V
ON
Output voltage drop
limitation
I
OUT
=0.3A;
T
j
= -40°C...+150°C
(see Figure 9)
25 mV
VN5016AJ-E Electrical specifications
11/32
Table 10. Current sense (8V<V
CC
<16V)
Symbol Parameter Test conditions Min. Typ. Max. Unit
K
0
I
OUT
/I
SENSE
I
OUT
=0.25A;
V
SENSE
=0.5V;V
CSD
=0V;
T
j
= -40°C...150°C
2760 5010 7240
K
1
I
OUT
/I
SENSE
I
OUT
=4A; V
SENSE
=0.5V;
V
CSD
=0V;
T
j
= -40°C...150°C
I
OUT
=4A; V
SENSE
=0.5V;
V
CSD
=0V;
T
j
= 25°C...150°C
3510
3770
4560
4560
5690
5350
dK
1
/K
1
(1)
Current sense ratio drift
I
OUT
=4A; V
SENSE
= 0.5V;
V
CSD
=0V;
T
J
=-40 °C to 150 °C
-8 +8 %
K
2
I
OUT
/I
SENSE
I
OUT
=10A; V
SENSE
=4V;
V
CSD
=0V;
T
j
=-40°C...150°C
I
OUT
=10A; V
SENSE
=4V;
V
CSD
=0V;
T
j
=25°C...150°C
4180
4250
4570
4570
5060
4890
dK
2
/K
2
(1)
Current sense ratio drift
I
OUT
=10A; V
SENSE
= 4V;
V
CSD
=0V;
T
J
=-40 °C to 150 °C
-4 +4 %
K
3
I
OUT
/I
SENSE
I
OUT
=25A; V
SENSE
=4V;
V
CSD
=0V;
T
j
= -40°C...150°C
I
OUT
=25A; V
SENSE
=4V;
V
CSD
=0V;
T
j
= 25°C...150°C
4360
4380
4500
4500
4700
4620
dK
3
/K
3
(1)
Current sense ratio drift
I
OUT
=25A; V
SENSE
= 4V;
V
CSD
=0V;
T
J
=-40 °C to 150 °C
-3 +3 %
I
SENSE0
Analog sense leakage
current
I
OUT
=0A; V
SENSE
=0V;
V
CSD
=5V; V
IN
=0V;
T
j
=-40°C...150°C
V
CSD
=0V; V
IN
=5V;
T
j
=-40°C...150°C
I
OUT
=2A; V
SENSE
=0V;
V
CSD
=5V; V
IN
=5V;
T
j
=-40°C...150°C
0
0
0
1
2
1
µA
µA
µA
I
OL
Openload ON state
current detection
threshold
V
IN
= 5V, I
SENSE
= 5 µA 10 45 mA
Electrical specifications VN5016AJ-E
12/32
V
SENSE
Max analog sense
output voltage
I
OUT
=15A; V
CSD
=0V; 5 V
V
SENSEH
Analog sense output
voltage in
overtemperature
condition
V
CC
=13V; R
SENSE
=3.9K 9V
I
SENSEH
Analog sense output
current in
overtemperature
condition
V
CC
=13V; V
SENSE
=5V 8 mA
t
DSENSE1H
Delay response time
from falling edge of
CS_DIS pin
V
SENSE
<4V, 1.5A<Iout<25A
I
SENSE
= 90% of I
SENSE
max
(see Figure 4)
50 100 µs
t
DSENSE1L
Delay response time
from rising edge of
CS_DIS pin
V
SENSE
<4V, 1.5A<Iout<25A
I
SENSE
= 10% of I
SENSE
max
(see Figure 4)
520µs
t
DSENSE2H
Delay response time
from rising edge of
INPUT pin
V
SENSE
<4V, 1.5A<Iout<25A
I
SENSE
= 90% of I
SENSE
max
(see Figure 4)
270 400 µs
t
DSENSE2H
Delay response time
between rising edge of
output current and rising
edge of current sense
V
SENSE
<4V,
I
SENSE
= 90% of I
SENSEMAX,
I
OUT
= 90% of I
OUTMAX
I
OUTMAX
=15A (see Figure 5)
280 µs
t
DSENSE2L
Delay response time
from falling edge of
INPUT pin
V
SENSE
<4V, 1.5A<Iout<25A
I
SENSE
=10% of I
SENSE
max
(see Figure 4)
100 250 µs
(1) Parameter guaranteed by design; it is not tested.
Table 10. Current sense (8V<V
CC
<16V) (continued)
Symbol Parameter Test conditions Min. Typ. Max. Unit

VN5016AJTR-E

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
Gate Drivers Sngl Ch HiSide Drivr
Lifecycle:
New from this manufacturer.
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