LPC2210_2220_6 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 06 — 11 December 2008 35 of 50
NXP Semiconductors
LPC2210/2220
16/32-bit ARM microcontrollers
[1] Conditions: V
SSA
=0V, V
DDA(3V3)
= 3.3 V.
[2] The ADC is monotonic, there are no missing codes.
[3] The differential linearity error (E
D
) is the difference between the actual step width and the ideal step width. See Figure 5.
[4] The integral non-linearity (E
L(adj)
) is the peak difference between the center of the steps of the actual and the ideal transfer curve after
appropriate adjustment of gain and offset errors. See Figure 5.
[5] The offset error (E
O
) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the
ideal curve. See Figure 5.
[6] The gain error (E
G
) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset
error, and the straight line which fits the ideal transfer curve. See Figure 5.
[7] The absolute voltage error (E
T
) is the maximum difference between the center of the steps of the actual transfer curve of the
non-calibrated ADC and the ideal transfer curve. See Figure 5.
Table 12. ADC static characteristics
V
DDA(3V3)
= 2.5 V to 3.6 V; T
amb
=
−
40
°
C to +85
°
C unless otherwise specified. ADC frequency 4.5 MHz.
Symbol Parameter Conditions Min Typ Max Unit
V
IA
analog input voltage 0 - V
DDA(3V3)
V
C
ia
analog input capacitance - - 1 pF
E
D
differential linearity error
[1][2][3]
--±1 LSB
E
L(adj)
integral non-linearity
[1][4]
--±2 LSB
E
O
offset error
[1][5]
--±3 LSB
E
G
gain error
[1][6]
--±0.5 %
E
T
absolute error
[1][7]
--±4 LSB
