© Semiconductor Components Industries, LLC, 2010 www.onsemi.com
FOD8316 Rev. 2 17
FOD8316 — 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection and Isolated Fault Sensing
Test Circuits (Continued)
Figure 40. Low Level Output Current During Fault Conditions (I
OLF
), Blanking Capacitor Charge Current (I
CHG
),
Bl
anking Capacitor Discharging Current (I
DSCHG
) and DESAT Threshold (V
DESAT
) Test Circuit
Figure 41. Under Voltage Lockout Threshold (V
UVLO
) Test Circuit
Fi
gure 42. Propagation Delay (t
PLH
, t
PHL
), Pulse Width Distortion (PWD),
Ri
se Time (t
R
) and Fall Time (t
F
) Test Circuit
1
2
3
4
5
6
7
8
V
IN+
V
IN–
V
DD1
GND1
RESET
FAULT
V
LED1+
V
LED1-
*
V
E
V
LED2+
DESAT
V
DD2
V
S
V
O
V
SS
V
SS
16
15
14
13
12
11
10
9
FOD8316
V
E
V
DESAT
V
O
I
CHG/DSCHG
I
OLF
0.1 µF
RL
0.1 µF
10 nF
0.1 µF
5 V
30 V
+
–
+
–
+
–
+
–
V
RL
FOD8316
0.1 µF
0.1 µF
5 V
DC Sweep
0 to 15 V
(100 steps)
Parameter
Analyzer
+
–
+
–
FOD8316
0.1 µF
0.1 µF
10 nF
0.1 µF
RL
5 V
30 V
+
–
+
–
+
–
F = 10 kHz
DC = 50%
+
–
3 kΩ
3 kΩ
FOD8316
0.1 µF
RL
0.1 µF
10 nF
0.1 µ
F
5 V
30 V
+
–
+
–
+
–
+
–
1
2
3
4
5
6
7
8
V
IN+
V
IN–
V
DD1
GND1
RESET
FAULT
V
LED1+
V
LED1-
*
V
E
V
LED2+
DESAT
V
DD2
V
S
V
O
V
SS
V
SS
16
15
14
13
12
11
10
9
FOD8316
V
O
0.1 µF
0.1 µF
5 V
DC Sweep
0 to 15 V
(100 steps)
Parameter
Analyzer
+
–
+
–
FOD8316
0.1 µ
F
0.1 µF
10 nF
0.1 µF
RL
5 V
30 V
+
–
+
–
+
–
F = 10 kHz
DC = 50%
+
–
3 kΩ
3 kΩ
FOD8316
0.1 µ
F
RL
0.1 µ
F
10 nF
0.1 µ
F
5 V
30 V
+
–
+
–
+
–
+
–
FOD8316
0.1 µ
F
0.1 µ
F
5 V
DC Sweep
0 to 15 V
(100 steps)
Parameter
Analyzer
+
–
+
–
1
2
3
4
5
6
7
8
V
IN+
V
IN–
V
DD1
GND1
RESET
FAULT
V
LED1+
V
LED1-
*
V
E
V
LED2+
DESAT
V
DD2
V
S
V
O
V
SS
V
SS
16
15
14
13
12
11
10
9
FOD8316
V
E
V
O
0.1 µF
0.1 µF
10 nF
0.1 µF
RL
5 V
30 V
+
–
+
–
+
–
F = 10 kHz
DC = 50%
+
–
V
CL
3 kΩ
3 kΩ
