Data Sheet ADuCM322
Rev. 0 | Page 3 of 23
GENERAL DESCRIPTION
The ADuCM322 is a fully integrated, single package device that
incorporates high performance analog peripherals together
with digital peripherals controlled by an 80 MHz ARM®
Cortex™-M3 processor and integral flash for code and data.
The ADC on the ADuCM322 provides 12-bit, 1 MSPS data
acquisition on up to 16 input balls. Additionally, chip temperature
and supply voltages can be measured.
The ADC input voltage range is 0 V to VREF. A sequencer is
provided, which allows a user to select a set of ADC channels to
measure in sequence without software involvement during the
sequence. The sequence can optionally repeat automatically at a
user selectable rate. Up to eight VDACs are provided with
output ranges that are programmable to one of two voltage
ranges.
The ADuCM322 can be configured so that the digital and analog
outputs retain their output voltages through a watchdog or software
reset sequence. Thus, a product can remain functional even
while the ADuCM322 is resetting itself.
The ADuCM322 has a low power ARM Cortex-M3 processor and
a 32-bit RISC machine that offers up to 100 MIPS peak perfor-
mance. Also integrated on-chip are 2 × 128 kB Flash/EE memory
blocks and 32 kB of SRAM. The flash comprises two separate
128 kB blocks supporting execution from one flash block and
simultaneous writing/erasing of the other flash block.
The ADuCM322 operates from an on-chip oscillator or a 16 MHz
external crystal and a PLL at 80 MHz. This clock can optionally
be divided down to reduce current consumption. Additional low
power modes can be set via software. In normal operating mode,
the ADuCM322 digital core consumes about 300 µA per MHz.
The device includes an MDIO interface capable of operating at
up to 4 MHz. The capability to simultaneously execute from
one flash block and write/erase the other flash block makes the
ADuCM322 ideal for 10G, 40G, and 100G optical applications.
In addition, the nonerasable kernel code plus flags in user flash
provide assistance by allowing user code to robustly switch
between the two blocks of user flash code and data spaces.
The ADuCM322 integrates a range of on-chip peripherals that
can be configured under software control, as required in the
application. These peripherals include 1 × UA RT, 2 × I
2
C, and 2 ×
SPI serial input/output communication controllers, GPIO,
32-element PLA, three general-purpose timers, plus a wake-up
timer and system watchdog timer. A
16-bit PWM with seven output channels is also provided.
GPIO balls on the device power up in high impedance input
mode. In output mode, the software chooses between open-
drain mode and push-pull mode. The pull-up resistors can be
disabled and enabled in software. In GPIO output mode, the
inputs can remain enabled to monitor the balls. The GPIO balls
can also be programmed to handle digital or analog peripheral
signals; in such cases, the ball characteristics are matched to the
specific requirement.
A large support ecosystem is available for the ARM Cortex-M3
processor to ease product development of the ADuCM322
. Access
is via the ARM serial wire debug port (SW-DP). On-chip factory
firmware supports in-circuit serial download via MDIO. These
features are incorporated into a QuickStartdevelopment system,
supporting this precision analog microcontroller family.
ADuCM322 Data Sheet
Rev. 0 | Page 4 of 23
SPECIFICATIONS
MICROCONTROLLER ELECTRICAL SPECIFICATIONS
AVDD = IOVDD = VDD1 = 2.9 V to 3.6 V (see Figure 12), maximum difference between supplies = 0.3 V, VREF = 2.5 V internal reference,
f
CORE
= 80 MHz, T
A
= −40°C to +105°C, unless otherwise noted. The power-up sequence must be VDD1, IOVDDx, and AVDDx, but no
delays in the sequence are required.
Table 1.
Symbol
Min
Typ
Max
Unit
Test Conditions/Comments
ADC BASIC SPECIFICATIONS Single-ended mode, unless
otherwise stated
ADC Power-Up Time 5 µs
f
SAMPLE
1
MSPS
DC Accuracy
1
12 Bits 1 LSB = 2.5 V/2
12
Resolution
1
16 Bits Number of data bits
Integral Nonlinearity INL ±1.75 LSB 2.5 V internal reference; 1 LSB =
2.5 V/2
12
±1.75 LSB 2.5 V external reference; 1 LSB =
2.5 V/2
12
Differential Nonlinearity DNL 0.99 ±0.75 +1.5 LSB 2.5 V internal reference; 1 LSB =
2.5 V/2
12
±0.75 LSB 2.5 V external reference; 1 LSB =
2.5 V/2
12
DC Code Distribution ±3 LSB ADC input 1.25 V; 1 LSB = 2.5 V/2
12
ADC ENDPOINT ERRORS
Offset Error ±200 µV
Drift
1
3.92 0.3 +1.21 µV/°C Using 2.5 V external reference
Match ±1 LSB Matching compared to AIN8
Full-Scale Error ±400 µV
Gain Drift
1
−4 +5 µV/°C Full-scale error drift minus offset
error drift
Match
±1 LSB
ADC DYNAMIC PERFORMANCE f
IN
= 665.25 Hz sine wave, f
SAMPLE
=
100 kSPS; input filter = 15 Ω, C
L
= 2 nF
Signal-to-Noise Ratio SNR 80 dB Includes distortion and noise
components
Total Harmonic Distortion THD −86 dB
Peak Harmonic or Spurious Noise −88 dB
Channel-to-Channel Crosstalk −90 dB Measured on adjacent channels
ADC INPUT
Input Voltage Ranges
Single-Ended Mode
1
AGND VREF
Compliance
1
AGND4 AVDD4
Leakage Current ±1.5 nA
Input Current ±9 µA/V At 1 MSPS
±6 µA/V ≤800 kSPS
±4 µA/V 500 kSPS, ADCCNVC, Bits[25:16] =
0x1E
Input Capacitance 20 pF During ADC acquisition
2.51
V
0.47 µF from VREF_1V2 to AGND4;
reference is measured with all ADC
and VDACs enabled
±5
mV
T
A
= 25°C
Reference Temperature Coefficient
1
±15 ppm/°C
Power Supply Rejection Ratio PSRR 60 dB
Internal V
REF
Power-On Time 50 ms
Data Sheet ADuCM322
Rev. 0 | Page 5 of 23
Parameter Symbol Min Typ Max Unit Test Conditions/Comments
EXTERNAL REFERENCE INPUT
Range
1
1.8 2.5 V ADC
Input Current 200 µA
BUFFERED REFFERNCE OUTPUT
Output Voltage 2.504 V
Accuracy ±8 mV T
A
= 25°C, load = 1.2 mA
Reference Temperature Coefficient
1
±15 µV/°C 100 nF from BUF_VREF2V5 to AGND4
Output Impedance 10 T
A
= 25°C
Load Current
1
1.2 mA
VDAC CHANNEL SPECIFICATIONS R
L
= 5 kΩ, C
L
= 100 pF
2
DC Accuracy
1
12 Bits 1 LSB = 2.5 V/2
12
Resolution
1
12 Bits Number of data bits
Relative Accuracy
3
INL ±4 LSB 1 LSB = 2.5 V/2
12
Differential Nonlinearity
3
DNL −0.99 +1 LSB Guaranteed monotonic, 1 LSB =
2.5 V/2
12
Offset Error ±3 ±15 mV 2.5 V internal reference,
DAC Output Code 0
Drift ±18 µV/°C
Gain Error
4
±0.3 ±0.85 % 0 V to internal V
REF
range
±0.4 ±1 % 0 V to AVDD range
Drift 6.5 ppm/°C Excluding reference drift
Mismatch 0.1 % % of full scale on DAC0
Analog Outputs
Output Voltage Range 1
1
0.15 2.5 V
Output Voltage Range 2
1
0.15 AVDDx − 0.15 V
Output Impedance 2
DAC AC Characteristics
Output Settling Time
10
µs
Settled to ±1 LSB
Glitch Energy
±20
nV-sec 1 LSB change when the maximum
number of bits changes simultane-
ously in the DACxDAT register
COMPARATOR
Input
Offset Voltage ±10 mV
Bias Current 1 nA
Voltage Range
1
AGNDx AVDDx − 1.2 V
Capacitance 7 pF
Hysteresis
1
8.5 15 mV When enabled in software
Response Time 7 µs AFECOMP, Bits[2:1] = 0
TEMPERATURE SENSOR Indicates die temperature, see
Figure 9
Resolution 0.5 °C When precision calibrated by the
user
5
Accuracy
1
1.34 1.43 V ADC measured voltage for
temperature sensor channel without
calibration, T
A
= 25°C
POWER-ON RESET POR 2.85 2.9 V
WATCHDOG TIMER WDT
Timeout Period 32 sec Default at power-up
FLASH/EE MEMORY
Endurance
1
10,000 Cycles
Data Retention
1
20
Years
T
J
= 85°C

ADUCM322BBCZ-RL

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
ARM Microcontrollers - MCU 80Mhz Cortex M3
Lifecycle:
New from this manufacturer.
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