IKP06N60T
TrenchStop
®
Series p
IFAG IPC TD VLS
7 Rev. 2.4 12.06.2013
E, SWITCHING ENERGY LOSSES
0A 2A 4A 6A 8A 10A
0,0 mJ
0,1 mJ
0,2 mJ
0,3 mJ
0,4 mJ
0,5 mJ
0,6 mJ
E
ts
*
E
on
*
*) E
on
and E
ts
include losses
due to diode recovery
E
off
E, SWITCHING ENERGY LOSSES
   
0,0 mJ
0,1 mJ
0,2 mJ
0,3 mJ
0,4 mJ
E
ts
*
E
on
*
*) E
on
and E
ts
include losses
due to diode recovery
E
off
I
C
, COLLECTOR CURRENT R
G
, GATE RESISTOR
Figure
13
.
Typical switching energy losses
as a function of collector current
(inductive load, T
J
=175°C,
V
CE
=400V, V
GE
=0/15V, R
G
=23Ω,
Dynamic test circuit in Figure E)
F
igure
14
. Typical switching energy losses
as a function of gate resistor
(inductive load, T
J
=175°C,
V
CE
= 400V, V
GE
= 0/15V, I
C
= 6A,
Dynamic test circuit in Figure E)
E, SWITCHING ENERGY LOSSES
50°C 100°C 150°C
0,0mJ
0,1mJ
0,2mJ
0,3mJ
0,4mJ
E
ts
*
E
on
*
*) E
on
and E
ts
include losses
due to diode recovery
E
off
E, SWITCHING ENERGY LOSSES
200V 300V 400V 500V
0,0mJ
0,1mJ
0,2mJ
0,3mJ
0,4mJ
0,5mJ
E
ts
*
E
on
*
*) E
on
and E
ts
include losses
due to diode recovery
E
off
T
J
, JUNCTION TEMPERATURE V
CE
, COLLECTOR-EMITTER VOLTAGE
Figure
15
.
Typical switching energy losses
as a function of junction
temperature
(inductive load, V
CE
=400V,
V
GE
= 0/15V, I
C
= 6A, R
G
= 23Ω,
Dynamic test circuit in Figure E)
Figure
16
.
Typical switching energy losses
as a function of collector emitter
voltage
(inductive load, T
J
= 175°C,
V
GE
= 0/15V, I
C
= 6A, R
G
= 23Ω,
Dynamic test circuit in Figure E)
IKP06N60T
TrenchStop
®
Series p
IFAG IPC TD VLS
8 Rev. 2.4 12.06.2013
V
GE
, GATE-EMITTER VOLTAGE
0nC 10nC 20nC 30nC 40nC 50nC
0V
5V
10V
15V
480V
120V
c, CAPACITANCE
0V 10V 20V
10pF
100pF
1nF
C
rss
C
oss
C
iss
Q
GE
, GATE CHARGE V
CE
, COLLECTOR-EMITTER VOLTAGE
Figure
17
.
Typical gate charge
(I
C
= 6 A)
Figure
18
.
Typical capacitance as a function
of collector-emitter voltage
(V
GE
=0V, f = 1 MHz)
I
C(sc)
, short circuit COLLECTOR CURRENT
12V 14V 16V 18V
0A
20A
40A
60A
80A
t
SC
, SHORT CIRCUIT WITHSTAND TIME
10V 11V 12V 13V 14V
0µs
2µs
4µs
6µs
8µs
10µs
12µs
V
GE
, GATE-EMITTETR VOLTAGE V
GE
, GATE-EMITETR VOLTAGE
Figure
19
.
Typical short circuit collector
current as a function of gate-
emitter voltage
(V
CE
400V, T
j
150C)
Figure
20
.
Short circuit withstand time as a
function of gate-emitter voltage
(V
CE
=600V, start at T
J
=25°C,
T
Jmax
<150°C)
IKP06N60T
TrenchStop
®
Series p
IFAG IPC TD VLS
9 Rev. 2.4 12.06.2013
Z
thJC
, TRANSIENT THERMAL RESISTANCE
1µs
10µs
100µs
1ms
10ms
100ms
10
-2
K/W
10
-1
K/W
10
0
K/W
single pulse
0.01
0.02
0.05
0.1
0.2
D=0.5
Z
thJC
, TRANSIENT THERMAL RESISTANCE
1µs
10µs
100µs
1ms
10ms
100ms
10
-2
K/W
10
-1
K/W
10
0
K/W
single pulse
0.01
0.02
0.05
0.1
0.2
D=0.5
t
P
, PULSE WIDTH t
P
, PULSE WIDTH
Figure
21
.
IGBT transient thermal resistance
(D = t
p
/ T)
Figure
22
.
Diode transient thermal
impedance as a function of pulse
width
(D=t
P
/T)
t
rr
, REVERSE RECOVERY TIME
200A/µs 400A/µs 600A/µs 800A/µs
0ns
50ns
100ns
150ns
200ns
250ns
T
J
=2C
T
J
=175°C
Q
rr
, REVERSE RECOVERY CHARGE
200A/µs 400A/µs 600As 800As
0,0µC
0,1µC
0,2µC
0,3µC
0,4µC
0,5µC
T
J
=25°C
T
J
=175°C
di
F
/dt, DIODE CURRENT SLOPE di
F
/dt, DIODE CURRENT SLOPE
Figure
23
.
Typical reverse recovery time as
a function of diode current slope
(V
R
= 400V, I
F
= 6A,
Dynamic test circuit in Figure E)
Figure
24
.
Typical reverse recovery charge
as a function of diode current
slope
(V
R
=400V, I
F
=6 A,
Dynamic test circuit in Figure E)
R , ( K / W )
, ( s )
0.3837 5.047*10
-
2
0.4533 4.758*10
-
3
0.5877 4.965*10
-
4
0.2483
4.717*10
-
5
C
1
=
1
/
R
1
R
1
R
2
C
2
=
2
/
R
2
R , ( K / W )
, ( s )
0.2520 4.849*10
-
2
0.4578 1.014*10
-
2
1.054 1.309*10
-
3
0.7822
1.343*10
-
4
C
1
=
1
/
R
1
R
1
R
2
C
2
=
2
/
R
2

IKP06N60TXKSA1

Mfr. #:
Manufacturer:
Infineon Technologies
Description:
IGBT Transistors LOW LOSS DuoPack 600V 6A
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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