7©2016 Integrated Device Technology, Inc Revision A April 11, 2016
840S05I Data Sheet
AC Electrical Characteristics
Table 6A. AC Characteristics, V
DD
= V
DDO_REF
= V
DDO_A
= V
DDO_B
= 3.3V ± 5%, T
A
= -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. Device will meet specifications after thermal equilibrium has
been reached under these conditions.
NOTE 1: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V
DDO_A, _B, _REF
/2.
NOTE 2: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 3: Defined as skew within a bank of outputs at the same supply voltage and with equal load conditions.
NOTE 4: Characterized using a 25MHz Crystal input. REF_OUT is disabled.
NOTE 5: A slew rate of 2V/ns or greater should be selected for output frequencies of 100MHz and higher.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
OUT
Output
Frequency
QA[1:0] 33.33 166.67 MHz
QB[1:0] 33.33 166.67 MHz
tsk(o)
Output Skew;
NOTE 1, 2
QA[1:0] or
QB[1:0]
f
OUT
125MHz, 25MHz Crystal Input 180 ps
tsk(b)
Bank Skew;
NOTE 2, 3
QA[1:0] or
QB[1:0]
SLEW[1:0] = 00 35 ps
tjit(per) Period Jitter, RMS; NOTE 4
f
OUT
= 125MHz, SLEW[1:0] = 00 3.4 ps
f
OUT
= 125MHz, SLEW[1:0] = 01 3.4 ps
f
OUT
= 125MHz, SLEW[1:0] = 10 3.5 ps
f
OUT
= 125MHz, SLEW[1:0] = 11 4.6 ps
t
SLEW
Slew Rate;
NOTE 5
QA[1:0] or
QB[1:0]
SLEW[1:0] = 00,
Rise/Fall Time: 20% to 80%
3.5 5.0 V/ns
QA[1:0] or
QB[1:0]
SLEW[1:0] = 01,
Rise/Fall Time: 20% to 80%
2.6 3.8 V/ns
QA[1:0] or
QB[1:0]
SLEW[1:0] = 10,
Rise/Fall Time: 20% to 80%
1.8 2.7 V/ns
QA[1:0] or
QB[1:0]
SLEW[1:0] = 11,
Rise/Fall Time: 20% to 80%
1.0 1.7 V/ns
t
L
PLL Lock Time SLEW[1:0] = 00 20 ms
odc
Output Duty
Cycle
QA[1:0] or
QB[1:0]
25MHz Crystal Input,
SLEW[1:0] = 00
45 55 %