MAX1304–MAX1306/MAX1308–MAX1310/MAX1312–MAX1314
8-/4-/2-Channel, 12-Bit, Simultaneous-Sampling ADCs
with ±10V, ±5V, and 0 to +5V Analog Input Ranges
______________________________________________________________________________________ 31
3-Phase Power-Monitoring System
The 8-channel devices are well suited for use in
3-phase power monitoring (Figure 16). The simultane-
ously sampled eight channels eliminate the need for
complicated DSP algorithms that realign sequentially
sampled data into a simultaneous sample set.
12-BIT
ADC
MICROCONTROLLER
LOAD
I
P1
I
P2
I
P3
V
P2
PHASE 1
NEUTRAL
PHASE 2
PHASE 3
V
P1
V
NEUTRAL
V
P3
BUFFERS
AND INPUT
PROTECTION
I
Pn
T/H
CURRENT
TRANSFORMER
CURRENT
TRANSFORMER
CURRENT
TRANSFORMER
CURRENT
TRANSFORMER
POWER
GRID
MAX1312
LOAD
LOAD
Figure 16. 3-Phase Power Monitoring
MAX1304–MAX1306/MAX1308–MAX1310/MAX1312–MAX1314
8-/4-/2-Channel, 12-Bit, Simultaneous-Sampling ADCs
with ±10V, ±5V, and 0 to +5V Analog Input Ranges
32 ______________________________________________________________________________________
Layout, Grounding, and Bypassing
For best performance use PC boards. Board layout must
ensure that digital and analog signal lines are separated
from each other. Do not run analog and digital lines paral-
lel to one another (especially clock lines), and do not run
digital lines underneath the ADC package.
Figure 17 shows the recommended system ground con-
nections. Establish an analog ground point at AGND and
a digital ground point at DGND. Connect all analog
grounds to the analog ground point. Connect all digital
grounds to the digital ground point. For lowest noise
operation, make the power-supply ground returns as low
impedance and as short as possible. Connect the analog
ground point to the digital ground point at one location.
High-frequency noise in the power supplies degrades
the ADC’s performance. Bypass the analog power
plane to the analog ground plane with a 2.2µF capaci-
tor within one inch of the device. Bypass each AVDD to
AGND pair of pins with a 0.1µF capacitor as close to
the device as possible. AVDD to AGND pairs are pin 1
to pin 2, pin 14 to pin 15, and pin 16 to pin 17.
Likewise, bypass the digital power plane to the digital
ground plane with a 2.2µF capacitor within one inch of
the device. Bypass each DVDD to DGND pair of pins
with a 0.1µF capacitor as close to the device as possi-
ble. DVDD to DGND pairs are pin 24 to pin 25, and pin
38 to pin 39. If a supply is very noisy use a ferrite bead
as a lowpass filter as shown in Figure 17.
Definitions
Integral Nonlinearity (INL)
INL is the deviation of the values on an actual transfer
function from a straight line. For these devices, this
straight line is drawn between the endpoints of the
transfer function, once offset and gain errors have
been nullified.
Differential Nonlinearity (DNL)
DNL is the difference between an actual step width and
the ideal value of 1 LSB. For these devices, the DNL of
each digital output code is measured and the worst-
case value is reported in the
Electrical Characteristics
table. A DNL error specification of less than ±1 LSB
guarantees no missing codes and a monotonic
transfer function.
Offset Error
Offset error is a figure of merit that indicates how well
the actual transfer function matches the ideal transfer
function at a single point. Typically the point at which
offset error is specified is either at or near the zero-
scale point of the transfer function or at or near the mid-
scale point of the transfer function.
For the unipolar devices (MAX1304/MAX1305/
MAX1306), the ideal zero-scale transition from 0x000 to
0x001 occurs at 1 LSB above AGND (Figure 12, Table 5).
Unipolar offset error is the amount of deviation between
the measured zero-scale transition point and the ideal
zero-scale transition point.
For the bipolar devices (MAX1308/MAX1309/MAX1310/
MAX1312/MAX1313/MAX1314), the ideal midscale tran-
sition from 0xFFF to 0x000 occurs at MSV (Figures 14
and 13, Tables 7 and 6). The bipolar offset error is the
amount of deviation between the measured midscale
transition point and the ideal midscale transition point.
ANALOG SUPPLY
AVDD
AGND DVDD
DATA
DGND
DIGITAL
CIRCUITRY
OPTIONAL
FERRITE
BEAD
+5V RETURN
DIGITAL
GROUND
POINT
DIGITAL SUPPLY
RETURN +3V TO +5V
DGND
DVDD
MAX1304–MAX1306
MAX1308–MAX1310
MAX1312–MAX1314
ANALOG
GROUND
POINT
Figure 17. Power-Supply Grounding and Bypassing
MAX1304–MAX1306/MAX1308–MAX1310/MAX1312–MAX1314
8-/4-/2-Channel, 12-Bit, Simultaneous-Sampling ADCs
with ±10V, ±5V, and 0 to +5V Analog Input Ranges
______________________________________________________________________________________ 33
Gain Error
Gain error is a figure of merit that indicates how well the
slope of the actual transfer function matches the slope
of the ideal transfer function. For the MAX1304–
MAX1306/MAX1308–MAX1310/MAX1312–MAX1314, the
gain error is the difference of the measured full-scale
and zero-scale transition points minus the difference of
the ideal full-scale and zero-scale transition points.
For the unipolar devices (MAX1304/MAX1305/
MAX1306), the full-scale transition point is from 0xFFE
to 0xFFF and the zero-scale transition point is from
0x000 to 0x001.
For the bipolar devices (MAX1308/MAX1309/MAX1310/
MAX1312/MAX1313/MAX1314), the full-scale transition
point is from 0x7FE to 0x7FF and the zero-scale transi-
tion point is from 0x800 to 0x801.
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error). The ideal, theoretical
minimum analog-to-digital noise is caused by quantiza-
tion error only and results directly from the ADC’s reso-
lution (N bits):
SNR
dB[max]
= 6.02
dB
× N + 1.76
dB
In reality, there are other noise sources such as thermal
noise, reference noise, and clock jitter.
For these devices, SNR is computed by taking the ratio
of the RMS signal to the RMS noise. RMS noise
includes all spectral components to the Nyquist fre-
quency excluding the fundamental, the first five har-
monics, and the DC offset.
Signal-to-Noise Plus Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS signal
to the RMS noise plus distortion. RMS noise plus distor-
tion includes all spectral components to the Nyquist fre-
quency excluding the fundamental and the DC offset.
Effective Number of Bits (ENOB)
ENOB specifies the dynamic performance of an ADC at
a specific input frequency and sampling rate. An ideal
ADC’s error consists of quantization noise only. ENOB for
a full-scale sinusoidal input waveform is computed as:
Total Harmonic Distortion (THD)
THD is the ratio of the RMS sum of the first five harmon-
ics to the fundamental itself. This is expressed as:
where V
1
is the fundamental amplitude, and V
2
through
V
6
are the amplitudes of the 2nd- through 6th-
order harmonics.
Spurious-Free Dynamic Range (SFDR)
SFDR is the ratio of the RMS amplitude of the fundamen-
tal (maximum signal component) to the RMS value of the
next largest spurious component, excluding DC offset.
SFDR is specified in decibels relative to the carrier (dBc).
Channel-to-Channel Isolation
Channel-to-channel isolation indicates how well each
analog input is isolated from the others. The channel-to-
channel isolation for these devices is measured by
applying DC to channel 1 through channel 7 while an
AC 500kHz, -0.4dBFS sine wave is applied to channel
0. An FFT is taken for channel 0 and channel 1 and the
difference (in dB) of the 500kHz magnitudes is reported
as the channel-to-channel isolation.
Aperature Delay
Aperture delay (t
AD
) is the time delay from the CONVST
rising edge to the instant when an actual sample is taken.
THD x
VVVVV
V
=
++++
20
2
2
3
2
4
2
5
2
6
2
1
log
ENOB
SINAD
=
176
602
.
.
SINAD dB x
SIGNAL
NOISE DISTORTION
RMS
() log
()
=
+
20
RRMS

MAX1304ECM+

Mfr. #:
Manufacturer:
Maxim Integrated
Description:
Analog to Digital Converters - ADC 12-Bit 8Ch 1.075Msps 3V Precision ADC
Lifecycle:
New from this manufacturer.
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