Performance
Measured performance can vary for a number of reasons. The major factors affecting
drive performance are the density of the drive and the interface of the host. Additional-
ly, overall system performance can affect the measured drive performance. When com-
paring drives, it is recommended that all system variables are the same, and only the
drive being tested varies.
Performance numbers will vary depending on the host system configuration.
Table 6: Drive Performance
Density 120GB 240GB 480GB 600GB 800GB 960GB Unit
Sequential read (128KB transfer) 420 420 420 420 420 420 MB/s
Sequential write (128KB transfer) 170 290 380 380 380 380 MB/s
Random read (4KB transfer) 63,000 63,000 63,000 65,000 65,000 65,000 IOPS
Random write (4KB transfer) 12,000 18,000 23,000 40,000 30,000 10,500 IOPS
READ latency (TYP) 0.50 0.50 0.50 0.50 0.50 0.50 ms
WRITE latency (TYP) 3.0 2.0 2.0 1.0 1.5 3.0 ms
Notes:
1. Typical I/O performance numbers as measured using Iometer with a queue depth of 32
and write cache disabled.
2. Iometer measurements are performed in the steady state region.
3. 4KB transfers used for READ/WRITE latency values.
4. System variations may affect measured results.
Reliability
Micron’s SSDs incorporate advanced technology for defect and error management.
They use various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
Table 7: Uncorrectable Bit Error Rate
Uncorrectable Bit Error Rate Operation
<1 sector per 10
16
bits READ
M510DC 2.5-Inch NAND Flash SSD
Performance
09005aef8633b239
M510DC_2_5_tcge.pdf - Rev. F 9/16 EN
24
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.
