MTFDDAK960MBP-1AN16ABYY Datasheet MTFDDAK120MBP-1AN16ABYY, MTFDDAK240MBP-1AN16ABYY, MTFDDAK480MBP-1AN16ABYY | P25-P27

Mean Time to Failure

Mean time to failure (MTTF) for the SSD can be predicted based on the component reli-

ability data using the methods referenced in the Telcordia SR-332 reliability prediction

procedures for electronic equipment.

Table 8: MTTF

Density MTTF (Operating Hours)

120GB 2.0 million

240GB 2.0 million

480GB 2.0 million

600GB 2.0 million

800GB 2.0 million

960GB 2.0 million

Note:

1. The product achieves a MTTF of 2.0 million hours based on population statistics not rele-

vant to individual units.

Endurance

Endurance for the SSD can be predicted based on the usage conditions applied to the

device, the internal NAND component cycles, the write amplification factor, and the

wear-leveling efficiency of the drive. Total bytes written measured with 55°C case tem-

perature within the total bytes written values listed in this document. The table below

shows the drive lifetime for each SSD density based on predefined usage conditions.

Table 9: Drive Lifetime

Density Drive Lifetime (Total Bytes Written)

120GB 460TB

240GB 920TB

480GB 1850TB

600GB 3800TB

800GB 2500TB

960GB 1140TB

Note:

1. Total bytes written were calculated assuming drive is 100% full (user capacity) and a

workload of 100% random, aligned 4KB writes.

M510DC 2.5-Inch NAND Flash SSD

Reliability

09005aef8633b239

M510DC_2_5_tcge.pdf - Rev. F 9/16 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Electrical Characteristics

Stresses greater than those listed may cause permanent damage to the device. This is a

stress rating only, and functional operation of the device at these or any other condi-

tions above those indicated in the operational sections of this specification is not im-

plied. Exposure to absolute maximum rating conditions for extended periods may affect

reliability.

Table 10: SATA Power Consumption

Density Idle Average

Sequential Write Max

(128KB transfer)

Sequential Read Max

(128KB transfer)

120GB 1.2W 4W <4W

240GB 1.2W 5W <5W

480GB 1.2W 6W <6W

600GB 1.2W 6.3W <6.3W

800GB 1.2W 6.3W <6.3W

960GB 1.2W 6.3W <6.3W

Notes:

1. Data taken at 25°C using a 6 Gb/s SATA interface.

2. Sequential power measured during Iometer with 128KB transfer, RMS average over a

500ms window.

Table 11: Maximum Ratings

Parameter/Condition Symbol Min Max Unit

Voltage input V5 4.5 5.5 V

Operating temperature T

0 70 °C

Non-operating temperature – –40 85 °C

Rate of temperature change – – 20 °C/hour

Relative humidity (non-condensing) – 5 95 %

Table 12: Shock and Vibration

Parameter/Condition Specification

Operating shock 1500G/0.5ms

Operating vibration 10–500Hz at 3.1G

M510DC 2.5-Inch NAND Flash SSD

Electrical Characteristics

09005aef8633b239

M510DC_2_5_tcge.pdf - Rev. F 9/16 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Compliance

Micron SSDs comply with the following:

• RoHS

• CE (Europe): EN55022, 2006 + A1:2007 and EN55024, 1998 + A1:2001 + A2:2003

• FCC: CFR Title 47, Part 15 Class A

• UL/cUL: approval to UL-60950-1, 2nd Edition, IEC 60950-1:2005 (2nd Edition); Am

1:2009, EN 60950-1 (2006) + A11:2009+ A1:2010 + A12:2011

• BSMI (Taiwan): approval to CNS 13438

• C-TICK (Australia, New Zealand): approval to AS/NZS CISPR22

• KCC RRL (Korea): approval to KCC-REM-MU2-P400m25

• W.E.E.E.: Compliance with EU WEEE directive 2002/96/EC. Additional obligations

may apply to customers who place these products in the markets where WEEE is en-

forced

• TUV (Germany): approval to IEC60950/EN60950

• V

CCI

• IC (Canada):

– This Class B digital apparatus complies with Canadian ICES-003.

– Cet appareil numérique de la classe B est conforme à la norme NMB-003 du Cana-

da.

FCC Rules

This equipment has been tested and found to comply with the limits for a Class A digital

device, pursuant to part 15 of the FCC Rules. These limits are designed to provide rea-

sonable protection against harmful interference when the equipment is operated in a

commercial environment. This equipment generates, uses, and can radiate radio fre-

quency energy and, if not installed and used in accordance with the instruction manual,

may cause harmful interference to radio communications. Operation of this equipment

in a residential area is likely to cause harmful interference in which case the user will be

required to correct the interference at his own expense.

M510DC 2.5-Inch NAND Flash SSD

Compliance

09005aef8633b239

M510DC_2_5_tcge.pdf - Rev. F 9/16 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

P1-P3 P4-P6 P7-P9 P10-P12 P13-P15 P16-P18 P19-P21 P22-P24 P25-P27 P28-P30

MTFDDAK960MBP-1AN16ABYY

Mfr. #:

Buy MTFDDAK960MBP-1AN16ABYY

Manufacturer:

Micron

Description:

Solid State Drive 2.5in SATA 960Gbyte 6Gbps 420Mbps 380Mbps 2000000h

Lifecycle:

New from this manufacturer.

Delivery:

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MTFDDAK960MBP-1AN16ABYY

MTFDDAK960MBP-1AN16ABYY

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