MAX6916
SPI-Compatible RTC with Microprocessor
Supervisor, Alarm, and NV RAM Controller
______________________________________________________________________________________ 25
Battery monitoring is only a useful technique when test-
ing can be done regularly over the entire life of a lithium
battery. Because the MAX6916 only performs battery
monitoring when V
CC
is nominal, systems that are pow-
ered down for excessively long periods can completely
drain their lithium cells without receiving any advanced
warning. To prevent such an occurrence, systems
using the MAX6916 battery-monitoring feature should
be powered up periodically (at least every few months)
in order to perform battery testing. Furthermore, any-
time BATT_LO is activated on the first battery test after
a power-up, data integrity should be checked through
a checksum or other technique. Timekeeping data
would also be suspect and should be checked for
accuracy against an accurate known reference.
Freshness-Seal Mode
When the battery is first attached to the MAX6916 with-
out V
CC
power applied, the device does not immediate-
ly provide battery-backup power to V
OUT
(Figure 16).
Only after V
CC
exceeds V
RST
and later falls below both
V
RST
and V
BATT
does the MAX6916 leave freshness-
seal mode and provide battery-backup power. This
mode allows a battery to be attached during manufac-
turing but not used until after the system has been acti-
vated for the first time. As a result, no battery energy is
drained during storage and shipping.
t
BTCN
t
BTPW
t
BL
ONCE THE BATTERY IS DETECTED AS LOW,
THE PERIODIC BATTERY TESTING CEASES.
A BATTERY CHECK CAN BE INITIATED BY
WRITING TO THE REGISTER 0x0D.
V
RST
V
CC
V
BATT
BATTERY-
TEST ACTIVE
BATT_LO
V
BTP
(BATTERY TEST POINT)
Figure 15. Battery Test Timing Diagram
V
CC
V
BATT
0V
V
OUT
0V
V
RST
V
BATT
V
RST
V
RST
V
RST
EXIT FRESHNESS
SEAL MODE
FRESHNESS
SEAL RESET
V
BATT
CONNECTED TO V
OUT
V
CC
CONNECTED
TO V
OUT
V
BATT
CONNECTED
TO V
OUT
V
CC
CONNECTED
TO V
OUT
V
BATT
CONNECTED
TO V
OUT
V
BATT
FLOATING
V
BATT
FLOATING
BATTERY
ATTACH
BATTERY
DETACH
BATTERY
ATTACH
BATTERY
DETACH
Figure 16. Battery Switchover Diagram
MAX6916
SPI-Compatible RTC with Microprocessor
Supervisor, Alarm, and NV RAM Controller
26 ______________________________________________________________________________________
Battery-Test Control Register
and Other Test Options
There are two warning formats for the BATT_LO and
BATT_ON outputs. By setting D0 (BATT ON BLINK)
and/or D1 (BATT LO BLINK) in the control register to
one, the respective warning output toggles on every
0.5s and off every 0.5s when set to active low by the
internal MAX6916 logic. This setting allows a more
noticeable warning indicator in systems where an LED
is connected as a status or warning light for the end
user. The POR default settings of zero leave these out-
puts set to logic-low when they are active.
D5 (INT/EXT TEST) selects whether the battery test cir-
cuit is configured as internal or external (Table 1). If D5
is set to zero (default value), then the internal resistor-
divider is used between V
BATT
and GND to select the
battery-low trip point (Figure 14). The internal resistors,
R
SET+_INT
and R
SET-_INT
, are used to divide V
BATT
in
half, as well as to provide the battery-test-load resis-
tance of 0.91M (typ).
If D5 (INT/EXT TEST) is set to one, then the two external
resistors, R
SET+_EXT
and R
SET-_EXT
, are used to divide
V
BATT
down to the ratio for a trip point set at TRIP of
1.24V (V
TRIP
) (typ). R
SET+_EXT
plus R
SET-_EXT
in series
provide the load resistance used during the 1s every-
24hr-battery test. If additional load resistance is
desired, then an external load resistor, R
LOAD_EXT
, can
be placed between V
BATT
and the collector or drain of
the transistor driven by TEST. The equivalent load resis-
tance used to test the battery is then R
LOAD_EXT
in par-
allel with the series combination of R
SET+_EXT
plus
R
SET-_EXT
. In this mode, the internal resistors are
removed from TRIP and are not used as a load during
the battery-test pulse. TEST pulses high to perform the
battery test and remains low between tests.
One final battery-test feature of the MAX6916 is the
software write address/command of 0Dh that forces a
1s battery test to be performed every time it is sent.
Applications Information
Crystal Selection
Connect a 32.768kHz watch crystal directly to the
MAX6916 through pins 9 and 10 (X1, X2) (Figure 17).
Use a crystal with a specified load capacitance (C
L
) of
6pF. Refer to Applications Note 616: Considerations for
Maxim Real-Time Clock Crystal Selection from the
Maxim website (www.maxim-ic.com) for more informa-
tion regarding crystal parameters and crystal selection,
as well as a list of crystal manufacturers.
When designing the PC board, keep the crystal as close
to the X1 and X2 pins of the MAX6916 as possible. Keep
the trace lengths short and small to reduce capacitive
loading and prevent unwanted noise pickup. Place a
guard ring around the crystal and connect the ring to
ground to help isolate the crystal from unwanted noise
pickup. Keep all signals out from beneath the crystal and
the X1 and X2 pins to prevent noise coupling. Finally, an
additional local ground plane on an adjacent PC board
layer can be added under the crystal to shield it from
unwanted pickup from traces on other layers of the board.
This plane should be isolated from the regular PC board
ground, connected to the GND pin of the MAX6916, and
needs to be no larger than the perimeter of the guard ring.
Ensure that this ground plane does not contribute to sig-
nificant capacitance between the signal line and ground
on the connections that run from X1 and X2 to the crystal.
See Figure 18.
R
d
C
d
12pF
C
g
12pF
EXTERNAL
CRYSTAL
X1 X2
MAX6916
R
f
Figure 17. Oscillator Functional Schematic
*
*
*
*
*
*
*
*
*
**
**
**
X2
*
GUARD RING
GROUND PLANE
VIA CONNECTION
GROUND PLANE
VIA CONNECTION
SM WATCH CRYSTAL
*LAYER 1 TRACE
*
**LAYER 2 LOCAL GROUND PLANE
CONNECT ONLY TO PIN 8
GROUND PLANE VIA CONNECTION
MAX6916
X1
GROUND
PLANE VIA
CONNECTION
Figure 18. Crystal Layout
MAX6916
SPI-Compatible RTC with Microprocessor
Supervisor, Alarm, and NV RAM Controller
______________________________________________________________________________________ 27
For frequency stability over temperature, refer to the
Applications Note 617: Real-Time-Clock Selection and
Optimization from the Maxim website (www.maxim-ic.com.)
Chip Information
PROCESS: CMOS
20
19
18
17
16
15
14
13
1
2
3
4
5
6
7
8
V
BATT
V
CC
RESET
BATT_LOBATT_ON
TRIP
TEST
V
OUT
TOP VIEW
CE_OUT
ALM
SCLK
DOUTGND
WDI
MR
CE_IN
12
11
9
10
CS
DINX2
X1
MAX6916
QSOP
+
Pin Configuration
USER RESET
N
3.3V
3.3V 3.3V
3.3V
LED
N.C.
CRYSTAL
3.3V
0.1µF
0.1µF
3.0V
0.1µF
N.C.
N.C.
BATT_LO
BATT_ON
X1
X2
V
CC
V
BATT
MR
ALM
CS
DOUT
DIN
SCLK
RESET
CE_IN
WDI
TRIP
TEST
V
OUT
CE_OUT
MAX6916
GND
GND
CE
I/O
P1.0
RST
SCK
MOSI
MISO
SS
INTO
µC
GND
CMOS SRAM
Typical Application Circuit
PART SUPPLY VOLTAGE (V)
MAX6916EO30 3.0
MAX6916EO33 3.3
MAX6916EO50 5.0
Selector Guide

MAX6916EO50+T

Mfr. #:
Manufacturer:
Maxim Integrated
Description:
Real Time Clock Integrated Circuits (ICs)
Lifecycle:
New from this manufacturer.
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