25LCXXX
DS22131C-page 4 Preliminary © 2009 Microchip Technology Inc.
TABLE 1-2: AC CHARACTERISTICS
AC CHARACTERISTICS Extended (H): TA = -40°C to +150°C VCC = 2.5V to 5.5V
Param.
No.
Sym. Characteristic Min. Max. Units Test Conditions
1FCLK Clock Frequency —
—
5
3
MHz
MHz
4.5V ≤ Vcc ≤ 5.5V
2.5V ≤ Vcc < 4.5V
2TCSS CS Setup Time 100
150
—
—
ns
ns
4.5V ≤ Vcc ≤ 5.5V
2.5V ≤ Vcc < 4.5V
3TCSH CS Hold Time 200
250
—
—
ns
ns
4.5V ≤ Vcc ≤ 5.5V
2.5V ≤ Vcc < 4.5V
4TCSD CS Disable Time 50 — ns —
5 Tsu Data Setup Time 20
30
—
—
ns
ns
4.5V ≤ Vcc ≤ 5.5V
2.5V ≤ Vcc < 4.5V
6T
HD Data Hold Time 40
50
—
—
ns
ns
4.5V ≤ Vcc ≤ 5.5V
2.5V ≤ Vcc < 4.5V
7TR CLK Rise Time — 2 μs (Note 1)
8T
F CLK Fall Time — 2 μs (Note 1)
9T
HI Clock High Time 100
150
—
—
ns
ns
4.5V ≤ Vcc ≤ 5.5V
2.5V ≤ Vcc < 4.5V
10 TLO Clock Low Time 100
150
—
—
ns
ns
4.5V ≤ Vcc ≤ 5.5V
2.5V ≤ Vcc < 4.5V
11 TCLD Clock Delay Time 50 — ns —
12 T
CLE Clock Enable Time 50 — ns —
13 T
V Output Valid from Clock
Low
—
—
100
160
ns
ns
4.5V ≤ Vcc ≤ 5.5V
2.5V ≤ Vcc < 4.5V
14 THO Output Hold Time 0 — ns (Note 1)
15 T
DIS Output Disable Time —
—
80
160
ns
ns
4.5V ≤ Vcc ≤ 5.5V(Note 1)
2.5V ≤ Vcc ≤ 4.5V(Note 1)
16 THS HOLD Setup Time 40
80
—
—
ns
ns
4.5V ≤ Vcc ≤ 5.5V
2.5V ≤ Vcc < 4.5V
17 T
HH HOLD Hold Time 40
80
—
—
ns
ns
4.5V ≤ Vcc ≤ 5.5V
2.5V ≤ Vcc < 4.5V
18 THZ HOLD Low to Output
High-Z
60
160
—
—
ns
ns
4.5V ≤ Vcc ≤ 5.5V(Note 1)
2.5V ≤ Vcc < 4.5V(Note 1)
19 THV HOLD High to Output
Valid
60
160
—
—
ns
ns
4.5V ≤ Vcc ≤ 5.5V
2.5V ≤ Vcc < 4.5V
20 TWC Internal Write Cycle Time — 6 ms (Note 2)
21 — Endurance 1,000,000 — E/W
Cycles
Page Mode, 25°C, V
CC = 5.5V (Note 3)
Note 1: This parameter is periodically sampled and not 100% tested.
2: T
WC begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle
is complete.
3: This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from our web site:
www.microchip.com.
