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X45620V20I-2.7

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P20
4
FN8250.0
July 29, 2005
ABSOLUTE MAXIMUM RATINGS
Temperature under bias ................... -65°C to +135°C
Storage temperature ........................ -65°C to +150°C
Voltage on any pin with
respect to V
SS
...................................... -1.0V to +6V
D.C. output current
(all output pins except V
OUT
).............................5mA
D.C. output current V
OUT
....................................50mA
Lead temperature (soldering, 10 seconds)........ 300°C
COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only; functional operation of the
device (at these or any other conditions above those
listed in the operational sections of this specification) is
not implied. Exposure to absolute maximum rating con-
ditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
Temperature Min Max
Commercial 0°C 70°C
Industrial -40°C +85°C
Device Option Supply Voltage
-2.7 2.7V-5.5V
Blank 4.75V-5.5V
D.C. OPERATING CHARACTERISTICS
(Over recommended operating conditions unless otherwise specified)
Symbol Parameter
Limits
Unit Test ConditionsMin Typ (6) Max
I
CC1
V
CC
Supply Current (Active)
(Excludes I
OUT
) Read Memory array
(Excludes I
OUT
) Write nonvolatile
Memory
1.5
3.0
mA SCL = 400kHz
V
OUT
, RESET,
LOWLINE
= Open
Note 1
I
CC2
V
CC
Supply Current (Passive)
(Excludes I
OUT
) 50
µA SDA = V
CC
, Any Input =
V
SS
or V
CC
: V
OUT
,
RESET
, LOWLINE =
Open, Note 2
I
CC3
V
CC
Current (Battery Backup Mode)
(Excludes I
OUT
)
1µAV
BATT
= 2.8V, V
OUT
, RE-
SET = Open, Note 4, 1
I
BATT1
V
BATT
Current (Excludes I
OUT
)1µAV
OUT
= V
CC
,
Note 4
I
BATT2
V
BATT
Current (Excludes I
OUT
)
(Battery Backup Mode)
50 µA V
OUT
= V
BATT
,
V
BATT
=2.8V
V
OUT
, RESET = Open,
Note 4
V
OUT1
Output Voltage (V
CC
> V
BATT
+ 0.03V or
V
CC
> V
TRIP1
V
CC
– 0.05
V
CC
– 0.5
V
CC
– 0.02
V
CC
– 0.2
V
V
I
OUT
= -5mA
I
OUT
= -50mA
V
OUT2
Output Voltage (V
CC
< V
BATT
+ 0.03V
and V
CC
< V
TRIP1
) {Battery Backup}
V
BATT
– 0.2 V I
OUT
= -250µA
V
OLB
Output (BATT-ON) LOW Voltage 0.4 V I
OL
= 3.0mA (5V)
I
OL
= 1.0mA (3V)
V
BSH
Battery Switch Hysteresis
(V
CC
< V
TRIP1
)
30
-30
mV
mV
Power-up
Power-down,
Note 4
V
TRIP1
V
CC
Reset Trip Point Voltage 4.5
2.55
4.62
2.62
4.75
2.7
V X45620
X45620-2.7
V
TRIP2
V2MON Reset Trip Point Voltage 2.55
1.7
2.62
1.75
2.7
1.8
V X45620
X45620-2.7
X45620
5
FN8250.0
July 29, 2005
Notes: (1) The device enters the Active state after any start, and remains active until 9 clock cycles later if the Device Select Bits in the Slave
Address Byte are incorrect; 200ns after a stop ending a read operation; or t
WC
after a stop ending a write operation.
(2) The device goes into Standby: 200ns after any Stop, except those that initiate a high voltage write cycle; t
WC
after a stop that initiates a
high voltage cycle; or 9 clock cycles after any start that is not followed by the correct Device Select Bits in the Slave Address Byte.
(3) V
IL
min. and V
IH
max. are for reference only and are not tested.
(4) This parameter is guaranteed by characterization.
CAPACITANCE T
A
= +25°C, f = 1MHz, V
CC
= 5V
EQUIVALENT A.C. LOAD CIRCUIT AT 5V V
CC
A.C. TEST CONDITIONS
V
OLR
Output (RESET, LOWLINE, WDO,
V2FAIL
) LOW Voltage
0.4 V I
OL
= 3.0mA (5V)
I
OL
= 1.0mA (3V)
Two Wire Interface
V
IL
Input (SDA, S0, S1, SCL, WP) LOW
Voltage
-0.5 V
CC
x 0.3 V Note 3
V
IH
Input (SDA, S0, S1, SCL, WP) HIGH
Voltage
V
CC
x 0.7 V
CC
+ 0.5 V Note 3
I
LI
Input Leakage Current (SDA, S1, S0,
SCL, WP)
±10 µA
V
OLS
Output (SDA) LOW Voltage 0.4 V I
OL
= 3.0mA (5V)
I
OL
= 1.0mA (3V), Note 4
D.C. OPERATING CHARACTERISTICS (CONTINUED)
(Over recommended operating conditions unless otherwise specified)
Symbol Parameter
Limits
Unit Test ConditionsMin Typ (6) Max
Symbol Test Max Unit Conditions
C
OUT
Output Capacitance (SDA, RESET, V2FAIL, LOWLINE, BATT-ON, WDO)8pFV
OUT
= 0V,
Note 1, 4
C
IN
Input Capacitance (SDA, SCL, S0, S1, WP) 6 pF V
IN
= 0V,
Note 1, 4
V
CC
SDA
30pF
1.53kΩ
V
CC
1.53kΩ
30pF
BATT-ON
RESET
4481Ω
V2FAIL
LOWLINE
WDO
Input pulse levels V
CC
x 0.1 to V
CC
x 0.9
Input rise and fall times 10ns
Input and output timing level V
CC
x 0.5
X45620
6
FN8250.0
July 29, 2005
A.C. CHARACTERISTICS (Over recommended operating conditions, unless otherwise specified)
Read & Write Cycle Limits
Serial Output Timing
POWER-UP TIMING
(5)
Notes: (5) t
PUR
and t
PUW
are the delays required from the time V
CC
is stable until the specified operation can be initiated. These parameters are
not 100% tested.
(6) Typical values are for T
A
= 25°C and nominal supply voltage (5V)
(7) Cb = total capacitance of one bus line in pF.
Bus Timing
Symbol Parameter Min Max Unit Test Conditions
f
SCL
SCL clock frequency 400 kHz
t
IN
Pulse width suppression time at inputs 50 ns Note 4
t
AA
SCL LOW to SDA Data Out Valid 0.1 0.9 µs Note 4
t
BUF
Time the bus must be free before a new transmission can start 1.3 µs Note 4
t
LOW
Clock LOW period 1.3 µs Note 4
t
HIGH
Clock HIGH period 0.6 µs Note 4
t
SU:STA
Start condition setup time 0.6 µs
t
HD:STA
Start condition hold time 0.6 µs
t
SU:DAT
Data in setup time 100 ns Note 4
t
HD:DAT
Data in hold time 0 µs Note 4
t
SU:STO
Stop condition setup time 0.6 µs Note 4
t
DH
Data output hold time 50 ns Note 4
Symbol Parameter Min Max Unit Test Conditions
t
R
SDA and SCL rise time 20 + .1Cb 300 ns Note 4
t
F
SDA and SCL fall time 20 + .1Cb 300 ns Note 4
t
SU:S0, S1, WP
S0, S1, and WP Setup Time 0.6 ns Note 4
t
HD:S0, S1, WP
S0, S1, and WP Hold Time 0 ns Note 4
Cb Capacitive load for each bus line 400 pF Note 4, 7
Symbol Parameter Max Unit Test Conditions
t
PUR
Power-up to Read Operation 1 ms Note 4
t
PUW
Power-up to Write Operation 5 ms Note 4
t
SU:STA
t
HD:STA
t
HD:DAT
t
SU:DAT
t
LOW
t
SU:STO
t
R
t
BUF
SCL
SDA IN
SDA OUT
t
DH
t
AA
t
F
t
HIGH
X45620
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P20

X45620V20I-2.7

Mfr. #:
Buy X45620V20I-2.7
Manufacturer:
Renesas / Intersil
Description:
IC VOLT MON DUAL SW EEPR 20TSSOP
Lifecycle:
New from this manufacturer.
Delivery:
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