6.42
13
IDT71P74804 (1M x 18-Bit) 71P74604 (512K x 36-Bit)
Advance Information
18 Mb QDR II SRAM Burst of 4 Commercial Temperature Range
IDT71P74804 (1M x 18-Bit) 71P74604 (512K x 36-Bit)
18 Mb QDR II SRAM Burst of 4 Commercial Temperature Range
Timing Waveform of Combined Read and Write Cycles
K
K
1
2
3
R
SA
Q
tKHCH
tKHKL
tKHIX
tIVKH
tKHAXtAVKH
C
C
CQ
CQ
tCHQX
tCHQX1
tKLKH
tCHCQV
tCHCQX
W
D
tDVKH
tDVKH
4
5
67
tKLKH
tKHKH
tKHKH
A2A1
A0
A3
tKHDX tKHDX
D10
D12
Qx3
tCHQV
tCHQV
tCHQX
tCQHQV
tKHCH
tKHKH
tKHKH
tKHKL
tCHCQX
tCHCQV
NOP Read A0
Write A1 Write A3Read A2 NOP
tKHIXtIVKH
D11
D13
D30
D32
D31
D33
Qx2
Q00
Q01
Q02 Q03 Q20 Q21 Q22 Q23
tCHQZ
NOP
6111 drw09
.
tCQHQX
6.4214
IDT71P74804 (1M x 18-Bit) 71P74604 (512K x 36-Bit)
18 Mb QDR II SRAM Burst of 4 Commercial Temperature Range
JTAG Block Diagram
JTAG Instruction Coding
IR2 IR1 IR0 Instruction TDO Output Notes
0 0 0 EXTEST Boundary Scan Register
0 0 1 IDCODE Identification register 2
0 1 0 SAMPLE-Z Boundary Scan Register 1
0 1 1 RESERVED Do Not Use 5
1 0 0 SAMPLE/PRELOAD Boundary Scan register 4
1 0 1 RESERVED Do Not Use 5
1 1 0 RESERVED Do Not Use 5
1 1 1 BYPASS Bypass Register 3
6111tbl 13
NOTES:
1. Places Qs in Hi-Z in order to sample all input data regardless of
other SRAM inputs.
2. TDI is sampled as an input to the first ID register to allow for the
serial shift of the external TDI data.
3. Bypass register is initialized to Vss when BYPASS instruction is
invoked. The Bypass Register also holds serially loaded TDI
when existing the Shift DR states.
4. SAMPLE instruction does not place output pins in Hi-Z.
5. This instruction is reserved for future use.
TAP Controller State Diagram
Test Logic Reset
Run Test Idle Select DR
Capture DR
Pause DR
Exit 2 DR
Update DR
Shift DR
Exit 1 DR
Select IR
Capture IR
Pause IR
Exit 2 IR
Update IR
Shift IR
Exit 1 IR
0
0
0
0
0
0
1
1
1
1
1
1
1
0
6111 drw 17
0
1
0
0
0
0
1
1
1
1
1
1
1
1
0
0
0
0
SRAM
CORE
BYPASS Reg.
Identification Reg.
Instruction Reg
.
Control Signal
s
TAP Controller
A,D
K,K
C,C
Q
CQ
CQ
TDI
TMS
TCK
TDO
6111 drw 18
S
IEEE 1149.1 TEST ACCESS PORT AND BOUNDARY SCAN-JTAG
This part contains an IEEE standard 1149.1 Compatible Test Ac-
cess Port (TAP). The package pads are monitored by the Serial Scan
circuitry when in test mode. This is to support connectivity testing during
manufacturing and system diagnostics. In conformance with IEEE 1149.1,
the SRAM contains a TAP controller, Instruction register, Bypass Regis-
ter and ID register. The TAP controller has a standard 16-state machine
that resets internally upon power-up; therefore, the TRST signal is not
required. It is possible to use this device without utilizing the TAP. To
disable the TAP controller without interfacing with normal operation of the
SRAM, TCK must be tied to VSS to preclude a mid level input. TMS and
TDI are designed so an undriven input will produce a response identical
to the application of a logic 1, and may be left unconnected, but they may
also be tied to VDD through a resistor. TDO should be left unconnected.
6.42
15
IDT71P74804 (1M x 18-Bit) 71P74604 (512K x 36-Bit)
Advance Information
18 Mb QDR II SRAM Burst of 4 Commercial Temperature Range
IDT71P74804 (1M x 18-Bit) 71P74604 (512K x 36-Bit)
18 Mb QDR II SRAM Burst of 4 Commercial Temperature Range
Part Instrustion
Register
Bypass
Register
ID
Register
Boundry
Scan
512Kx36 3 bits 1 bit 32 bits 107 bits
1Mx18 3 bits 1 bit 32 bits 107 bits
6111 tbl14
INSTRUCTION FIELD ALL DEVICES DESCRIPTION PART NUMBER
Revision Number (31:29) 0x0 Revision Number
Device ID (28:12)
0x0280
0x0281
512Kx36 QDRII BURST OF 4
1Mx18
71P74604S
71P74804S
IDT JEDEC ID CODE (11:1) 0x033
Allows unique identification of SRAM
vendor.
ID Register Presence Indicator (0) 1 Indicates the presence of an ID register.
6111 tbl 15
Scan Register Definition
Identification Register Definitions

IDT71P74604S250BQ8

Mfr. #:
Manufacturer:
Description:
IC SRAM 18M PARALLEL 165CABGA
Lifecycle:
New from this manufacturer.
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