6.42
IDT70824S/L
High-Speed 4K x 16 Sequential Access Random Access Memory Military and Commercial Temperature Ranges
5
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range
(1,2,8)
(VCC = 5.0V ± 10%)
Data Retention Characteristics Over All Temperature Ranges
(L Version Only)
(VLC < 0.2V, VHC > VCC - 0.2V)
NOTES
1. 'X' in part number indicates power rating (S or L).
2. V
CC = 5V, TA = +25°C; guaranteed by device characterization but not production tested.
3. At f = f
MAX, address, control lines (except Output Enable), and SCLK are cycling at the maximum frequency read cycle of 1/tRC.
4. f = 0 means no address or control lines change.
5. SCE may transition, but is Low (SCE=V
IL) when clocked in by SCLK.
6. SCE may be - 0.2V, after it is clocked in, since SCLK=V
IH must be clocked in prior to powerdown.
7. If one port is enabled (either CE or SCE = LOW) then the other port is disabled (SCE or CE = HIGH, respectively). CMOS HIGH
> Vcc - 0.2V and LOW < 0.2V, and
TTL HIGH = V
IH and LOW = VIL.
8. Industrial temperature: for specific speeds, packages and powers contact your sales office.
NOTES :
1. T
A = +25°C, VCC = 2V; guaranteed by device characterization but not production tested.
2. t
RC = Read Cycle Time
3. This parameter is guaranteed by device characterization, but is not production tested.
4. To initiate data retention, SCE = V
IH must be clocked in.
70824X20
Com'l Only
70824X25
Com'l Only
70824X35
Com'l &
Military
70824X45
Com'l &
Military
Symbol Parameter Test Condition Version Typ.
(2)
Max. Typ.
(2)
Max. Typ.
(2)
Max. Typ.
(2)
Max. Unit
I
CC
Dynamic Operating
Current
(Both Ports Active)
CE
L
and CE
R
= V
IL
,
Outputs Disabled
SC E = V
IL
(5)
f = f
MAX
(3)
COM'L S
L
180
180
380
330
170
170
360
310
160
160
340
290
155
155
340
290
mA
MIL &
IND
S
L
____
____
____
____
____
____
____
____
160
160
400
340
155
155
400
340
I
SB1
Standby Current
(Both Ports - TTL
Level Inputs)
SC E and CE = V
IH
(7)
CMD = V
IH
f = f
MAX
(3)
COM'L S
L
25
25
70
50
25
25
70
50
20
20
70
50
16
16
70
50
mA
MIL &
IND
S
L
____
____
____
____
____
____
____
____
20
20
85
65
16
16
85
65
I
SB2
Standby Current
(One Port - TTL
Level Inputs)
CE or SCE = V
IH
Active Port Outputs Disabled,
f=f
MAX
(3)
COM'L S
L
115
115
260
230
105
105
250
220
95
95
240
210
90
90
240
210
mA
MIL &
IND
S
L
____
____
____
____
____
____
____
____
95
95
290
250
90
90
290
250
I
SB3
Full Standby Current
(Both Ports -
CMOS Level Inputs)
Both Ports CE and
SC E >
V
CC
- 0.2V
(6)
V
IN
> V
CC
- 0.2V or
V
IN
< 0.
2V,
f = 0
(4)
COM'L S
L
1.0
0.2
15
5
1.0
0.2
15
5
1.0
0.2
15
5
1.0
0.2
15
5
mA
MIL &
IND
S
L
____
____
____
____
____
____
____
____
1.0
0.2
30
10
1.0
0.2
30
10
I
SB4
Full Standby Current
(One Port -
CMOS Level Inputs)
One Port CE or
SC E >
V
CC
- 0.2V
(6,7)
Outputs Disabled (Active Port)
f = f
MAX
(3)
V
IN
> V
CC
- 0.2V or V
IN
< 0.2V
COM'L S
L
110
110
240
200
100
100
230
190
90
90
220
180
85
85
220
180
mA
MIL &
IND
S
L
____
____
____
____
____
____
____
____
90
90
260
215
85
85
260
215
3099 tbl 08
Symbol Parameter Test Condition Min. Typ.
(1 )
Max. Unit
V
DR
V
CC
for Data Retention V
CC
= 2V 2.0
___ ___
V
I
CCDR
Data Retention Current
CE = V
HC
V
IN
= V
HC
or = V
LC
MIL. & IND.
___
100 4000
µA
COM'L.
___
100 1500
t
CD R
(3 )
Chip Deselect to Data Retention Time
SCE = V
HC
(4 )
when SCLK = u
CMD >
V
HC
___ ___ ___
V
t
R
(
3)
Operation Recovery Time t
RC
(2 )
___ ___
V
3099 tbl 09
