Philips Semiconductors Preliminary data
P89C51RA2/RB2/RC2/RD2xx80C51 8-bit Flash microcontroller family
8KB/16KB/32KB/64KB ISP/IAP Flash with 512B/512B/512B/1KB RAM
2002 Jul 18
61
V
CC
–0.5
0.45V
0.2V
CC
+0.9
0.2V
CC
–0.1
NOTE:
AC inputs during testing are driven at V
CC
–0.5 for a logic ‘1’ and 0.45V for a logic ‘0’.
Timing measurements are made at V
IH
min for a logic ‘1’ and V
IL
max for a logic ‘0’.
SU00717
Figure 47. AC Testing Input/Output
V
LOAD
V
LOAD
+0.1V
V
LOAD
–0.1V
V
OH
–0.1V
V
OL
+0.1V
NOTE:
TIMING
REFERENCE
POINTS
For timing purposes, a port is no longer floating when a 100mV change from
load voltage occurs, and begins to float when a 100mV change from the loaded
V
OH
/V
OL
level occurs. I
OH
/I
OL
±20mA.
SU00718
Figure 48. Float Waveform
4 8 12 16 20 24 28 32 36
60
50
40
30
20
10
Frequency at XTAL1 (MHz, 12-clock mode)
I
CC
(mA)
MAXIMUM IDLE
SU01631
TYPICAL I
CC
ACTIVE
89C51RA2/RB2/RC2/RD2
MAXIMUM I
CC
ACTIVE
TYPICAL IDLE
Figure 49. I
CC
vs. FREQ
Valid only within frequency specifications of the device under test
Philips Semiconductors Preliminary data
P89C51RA2/RB2/RC2/RD2xx80C51 8-bit Flash microcontroller family
8KB/16KB/32KB/64KB ISP/IAP Flash with 512B/512B/512B/1KB RAM
2002 Jul 18
62
V
CC
–0.5
0.45V
0.2V
CC
+0.9
0.2V
CC
–0.1
NOTE:
AC inputs during testing are driven at V
CC
–0.5 for a logic ‘1’ and 0.45V for a logic ‘0’.
Timing measurements are made at V
IH
min for a logic ‘1’ and V
IL
max for a logic ‘0’.
SU00010
Figure 50. AC Testing Input/Output
V
LOAD
V
LOAD
+0.1V
V
LOAD
–0.1V
V
OH
–0.1V
V
OL
+0.1V
NOTE:
TIMING
REFERENCE
POINTS
For timing purposes, a port is no longer floating when a 100mV change from load voltage occurs,
and begins to float when a 100mV change from the loaded V
OH
/V
OL
level occurs. I
OH
/I
OL
±20mA.
SU00011
Figure 51. Float Waveform
Philips Semiconductors Preliminary data
P89C51RA2/RB2/RC2/RD2xx80C51 8-bit Flash microcontroller family
8KB/16KB/32KB/64KB ISP/IAP Flash with 512B/512B/512B/1KB RAM
2002 Jul 18
63
V
CC
P0
EA
RST
XTAL1
XTAL2
V
SS
V
CC
V
CC
V
CC
I
CC
(NC)
CLOCK SIGNAL
P89C51RA2xx
P89C51RB2xx
P89C51RC2xx
P89C51RD2xx
SU01478
Figure 52. I
CC
Test Condition, Active Mode, T
amb
= 25 °C.
All other pins are disconnected
V
CC
P0
RST
XTAL1
XTAL2
V
SS
V
CC
V
CC
I
CC
(NC)
CLOCK SIGNAL
EA
SU01479
P89C51RA2xx
P89C51RB2xx
P89C51RC2xx
P89C51RD2xx
Figure 53. I
CC
Test Condition, Idle Mode, T
amb
= 25 °C.
All other pins are disconnected
V
CC
–0.5
0.5V
t
CHCL
t
CLCL
t
CLCH
t
CLCX
t
CHCX
SU01297
Figure 54. Clock Signal Waveform for I
CC
Tests in Active
and Idle Modes.
t
CLCL
= t
CHCL
= 10 ns
V
CC
P0
RST
XTAL1
XTAL2
V
SS
V
CC
V
CC
I
CC
(NC)
EA
SU01480
P89C51RA2xx
P89C51RB2xx
P89C51RC2xx
P89C51RD2xx
Figure 55. I
CC
Test Condition, Power Down Mode.
All other pins are disconnected; V
CC
= 2 V to 5.5 V

P89C51RD2BBD/01,55

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
IC MCU 8BIT 64KB FLASH 44LQFP
Lifecycle:
New from this manufacturer.
Delivery:
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