8308I Data Sheet
©2015 Integrated Device Technology, Inc December 10, 20157
TABLE 5C. AC CHARACTERISTICS, V
DD
= V
DDO
= 2.5V±5%, TA = -40° TO 85°
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
OUT
Output Frequency 350 MHz
t
PD
Propagation Delay;
CLK, nCLK;
NOTE 1
ƒ ≤ 350MHz
1.5 4.2 ns
LVCMOS_CLK;
NOTE 2
ƒ ≤ 350MHz
1.7 4.4 ns
tsk(o) Output Skew; NOTE 3, 7 Measured on rising edge @V
DDO
/2 160 ps
tsk(pp) Part-to-Part Skew; NOTE 4, 7 Measured on rising edge @V
DDO
/2 2 ns
t
R
/ t
F
Output Rise/Fall Time 0.6V to 1.8V 0.2 1.0 ns
odc Output Duty Cycle
ƒ ≤ 150MHz, Ref = CLK, nCLK
40 60 %
t
PZL
, t
PZH
Output Enable Time; NOTE 5 5ns
t
PLZ
, t
PHZ
Output Disable Time; NOTE 5 5ns
t
S
Clock Enable
Setup Time;
NOTE 6
CLK_EN to CLK,
nCLK
1ns
CLK_EN to LVC-
MOS_CLK
0ns
t
H
Clock Enable
Hold Time;
NOTE 6
CLK, nCLK to
CLK_EN
0ns
LVCMOS_CLK
to CLK_EN
1ns
NOTE: Electrical parameters are guaranteed over the specifi ed ambient operating temperature range, which is established when the
device is mounted in a test socket with maintained transverse airfl ow greater than 500 lfpm. The device will meet specifi cations after
thermal equilibrium has been reached under these conditions.
NOTE 1: Measured from the differential input crossing point to V
DDO
/2 of the output.
NOTE 2: Measured from V
DD
/2 of the input to V
DDO
/2 of the output.
NOTE 3: Defi ned as skew between outputs at the same supply voltage and with equal load conditions.
Measured at V
DDO
/2.
NOTE 4: Defi ned as skew between outputs on different devices operating at the same supply voltages and with
equal load conditions. Using the same type of inputs on each device, the outputs are measured at V
DDO
/2.
NOTE 5: These parameters are guaranteed by characterization. Not tested in production.
NOTE 6: Setup and Hold times are relative to the rising edge of the input clock.
NOTE 7: This parameter is defi ned in accordance with JEDEC Standard 65.
