ICS85314AGI-11 REVISION F SEPTEMBER 16, 2013 4 ©2013 Integrated Device Technology, Inc.
ICS85314I-11 Data Sheet LOW SKEW, 1-TO-5 DIFFERENTIAL-TO-2.5V, 3.3V LVPECL FANOUT BUFFER
Absolute Maximum Ratings
NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device.
These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond
those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect product reliability.
DC Electrical Characteristics
Table 4A. Power Supply DC Characteristics, V
CC
= 2.375V to 3.8V; V
EE
= 0V, T
A
= -40°C to 85°C
Table 4B. LVCMOS/LVTTL DC Characteristics, V
CC
= 2.375V to 3.8V; V
EE
= 0V, T
A
= -40°C to 85°C
Table 4C. Differential DC Characteristics, V
CC
= 2.375V to 3.8V; V
EE
= 0V, T
A
= -40°C to 85°C
NOTE 1: V
IL
should not be less than -0.3V
NOTE 2: Common mode voltage is defined as V
IH
.
Item Rating
Supply Voltage, V
CC
4.6V
Inputs, V
I
-0.5V to V
CC
+ 0.5V
Outputs, I
O
Continuos Current
Surge Current
50mA
100mA
Package Thermal Impedance,
JA
20 Lead SOIC
20 Lead TSSOP
46.2C/W (0 lfpm)
73.2C/W (0 lfpm)
Storage Temperature, T
STG
-65C to 150C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
CC
Positive Supply Voltage 2.375 3.3 3.8 V
I
EE
Power Supply Current 80 mA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
IH
Input High Voltage 2 V
CC
+ 0.3 V
V
IL
Input Low Voltage -0.3 0.8 V
I
IH
Input High Current nCLK_EN, CLK_SEL V
CC
= V
IN
= 3.8V 150 µA
I
IL
Input Low Current nCLK_EN, CLK_SEL V
CC
= 3.8V, V
IN
= 0V -5 µA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
I
IH
Input
High Current
CLK0, CLK1 V
CC
= V
IN
= 3.8V 150 µA
nCLK0, nCLK1 V
CC
= V
IN
= 3.8V 5 µA
I
IL
Input
Low Current
CLK0, CLK1 V
CC
= 3.8V, V
IN
= 0V -5 µA
nCLK0, nCLK1 V
CC
= 3.8V, V
IN
= 0V -150 µA
V
PP
Peak-to-Peak Voltage; NOTE 1 0.15 1.3 V
V
CMR
Common Mode Range; NOTE 1, 2 0.5 V
CC
– 0.85 V
ICS85314AGI-11 REVISION F SEPTEMBER 16, 2013 5 ©2013 Integrated Device Technology, Inc.
ICS85314I-11 Data Sheet LOW SKEW, 1-TO-5 DIFFERENTIAL-TO-2.5V, 3.3V LVPECL FANOUT BUFFER
Table 4D. LVPECL DC Characteristics, V
CC
= 2.375V to 3.8V; V
EE
= 0V, T
A
= -40°C to 85°C
NOTE 1: Outputs termination with 50 to V
CC
– 2V.
AC Electrical Characteristics
Table 5. AC Characteristics, V
CC
= 2.375V to 3.8V; V
EE
= 0V, T
A
= -40°C to 85°C
NOTE: All parameters measured at ƒ
OUT
unless otherwise noted.
NOTE: The cycle-to-cycle jitter on the input will equal the jitter on the output. The part does not add jitter.
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature, same frequency and
with equal load conditions. Using the same type of inputs on each device, the outputs are measured at the differential cross points.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
OH
Output High Voltage; NOTE 1 V
CC
– 1.4 V
CC
– 0.9 V
V
OL
Output Low Voltage; NOTE 1 V
CC
– 2.0 V
CC
– 1.7 V
V
SWING
Peak-to-Peak Output Voltage Swing 0.6 1.0 V
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
OUT
Output Frequency 700 MHz
tp
LH
Propagation Delay, Low to High;
NOTE 1
ƒ 700MHz 1.0 1.4 1.8 ns
tsk(o) Output Skew; NOTE 2, 3 30 ps
tjit
Buffer Additive Phase Jitter,
RMS
156.25MHz,
Integration Range: 12kHz - 20MHz
0.170 0.200 ps
644.53125MHz,
Integration Range: 12kHz - 20MHz
0.060 0.200 ps
tsk(pp) Part-to-Part Skew; NOTE 3, 4 350 ps
t
S
Setup Time nCLK_EN to CLK 50 ps
t
H
Hold Time nCLK_EN to CLK 50 ps
t
R
/ t
F
Output Rise/Fall Time 20% to 80% 200 700 ps
odc Output Duty Cycle Skew ƒ 700MHz 45 55 %
ICS85314AGI-11 REVISION F SEPTEMBER 16, 2013 6 ©2013 Integrated Device Technology, Inc.
ICS85314I-11 Data Sheet LOW SKEW, 1-TO-5 DIFFERENTIAL-TO-2.5V, 3.3V LVPECL FANOUT BUFFER
156.25MHz Additive Phase Jitter
The spectral purity in a band at a specific offset from the fundamental
compared to the power of the fundamental is called the dBc Phase
Noise. This value is normally expressed using a Phase noise plot
and is most often the specified plot in many applications. Phase noise
is defined as the ratio of the noise power present in a 1Hz band at a
specified offset from the fundamental frequency to the power value of
the fundamental. This ratio is expressed in decibels (dBm) or a ratio
of the power in the 1Hz band to the power in the fundamental. When
the required offset is specified, the phase noise is called a dBc value,
which simply means dBm at a specified offset from the fundamental.
By investigating jitter in the frequency domain, we get a better
understanding of its effects on the desired application over the entire
time record of the signal. It is mathematically possible to calculate an
expected bit error rate given a phase noise plot.
As with most timing specifications, phase noise measurements have
issues relating to the limitations of the measurement equipment. The
noise floor of the equipment can be higher or lower than the noise
floor of the device. Additive phase noise is dependent on both the
noise floor of the input source and measurement equipment.
Measured using a Rohde & Schwarz SMA100 as the input source.
SSB Phase Noise dBc/Hz
Offset from Carrier Frequency (Hz)

85314AGI-11LF

Mfr. #:
Manufacturer:
IDT
Description:
Clock Buffer Low Skew 1-to-5 Diff -to-2.5V/3.3V LVPECL
Lifecycle:
New from this manufacturer.
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