6.42
IDT71V65603, IDT71V65803, 256K x 36, 512K x 18, 3.3V Synchronous SRAMS with
ZBT
™™
™™
™ Feature, 3.3V I/O, Burst Counter, and Pipelined Outputs Commercial and Industrial Temperature Ranges
15
1
2
3
4
20 30 50 100 200
ΔtCD
(Typical, ns)
Capacitance (pF)
80
5
6
5304 drw 05
•
•
•
•
•
,
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range
(VDD = 3.3V +/-5%)
Figure 2. Lumped Capacitive Load, Typical Derating
AC Test Conditions
(VDDQ = 3.3V)
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range
(1)
(VDD = 3.3V +/-5%)
Figure 1. AC Test Load
AC Test Load
NOTE:
1. The LBO pin will be internally pulled to VDD if it is not actively driven in the application and the ZZ pin will be internally pulled to Vss if not actively driven.
NOTES:
1. All values are maximum guaranteed values.
2. At f = fMAX, inputs are cycling at the maximum frequency of read cycles of 1/tCYC; f=0 means no input lines are changing.
3. For I/Os VHD = VDDQ – 0.2V, VLD = 0.2V. For other inputs VHD = VDD – 0.2V, VLD = 0.2V.
Symbol Parameter Test Conditions Min. Max. Unit
|I
LI
| Input Leakage Current V
DD
= Max., V
IN
= 0V to V
DD
___
5µA
|I
LI
|
LBO Input Leakage Current
(1)
V
DD
= Max., V
IN
= 0V to V
DD
___
30 µA
|I
LO
| Output Leakage Current V
OUT
= 0V to V
DDQ
, Device Deselected
___
5µA
VO
L
Output Low Voltage I
OL
= +8mA, V
DD
= Min.
___
0.4 V
V
OH
Output High Voltage I
OH
= -8mA, V
DD
= Min. 2.4
___
V
5304 tbl 21
Symbol Parameter Test Conditions
150MHz 133MHz 100MHz Unit
Com'l Ind Com'l Ind Com'l Ind
I
DD
Operating Power
Supply Current
Device Selected, Outputs Open,
ADV/LD = X, V
DD
= Max.,
V
IN
> V
IH
or < V
IL
, f = f
MAX
(2 )
325 345 300 320 250 270
mA
I
SB1
CMOS Standby Power
Supply Current
Device Deselected, Outputs Open,
V
DD
= Max., V
IN
> V
HD
or < V
LD
,
f = 0
(2,3)
40 60 40 60 40 60
mA
I
SB2
Clock Running Power
Supply Current
Device Deselected, Outputs Open,
V
DD
= Max., V
IN
> V
HD
or < V
LD
,
f = f
MAX
(2.3)
120 140 110 130 100 120
mA
I
SB3
Idle Power
Supply Current
Device Selected, Outputs Open,
CEN >
V
IH
, V
DD
= Max.,
V
IN
> V
HD
or < V
LD
, f = f
MAX
(2,3)
40 60 40 60 40 60
mA
I
ZZ
Full Sleep Mode
Supply Current
Device Selected, Outputs Open
CEN ≤ V
IL
, V
DD
= Max., ZZ ≥ V
HD
V
IN
≥
V
HD
or
≤
V
LD
, f = fMax
(2, 3)
40 60 40 60 40 60 mA
5304 tbl 22
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Timing Reference Levels
AC Test Load
0 to 3V
2ns
1.5V
1.5V
See Figure 1
5304 tbl 23
V
DDQ
/2
50
Ω
I/O
Z
0
=50
Ω
5304 drw 04
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