ADG406/ADG407/ADG426
Rev. B | Page 6 of 20
SINGLE SUPPLY
V
DD
= +12 V ± 10%, V
SS
= 0 V, GND = 0 V, unless otherwise noted.
Table 2.
Parameter
1
+25°C −40°C to +85°C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 to V
DD
V
R
ON
90 Ω typ V
D
= +3 V, +8.5 V, I
S
= −1 mA;
125 200 Ω max V
DD
= +10.8 V
LEAKAGE CURRENTS V
DD
= +13.2 V
Source Off Leakage I
S
(Off) ±0.5 ±20 nA max V
D
= 8 V/0.1 V, V
S
= 0.1 V/8 V; see Figure 26
Drain Off Leakage I
D
(Off) V
D
= 8 V/0.1 V, V
S
= 0.1 V/8 V; see Figure 27
ADG406, ADG426 ±1 ±20 nA max
ADG407 ±1 ±20 nA max
Channel On Leakage I
D
, I
S
(On) V
S
= V
D
= 8 V/0.1 V, see Figure 28
ADG406, ADG426 ±1 ±20 nA max
ADG407 ±1 ±20 nA max
DIGITAL INPUTS
Input High Voltage, V
INH
2.4 V min
Input Low Voltage, V
INL
0.8 V max
Input Current
I
INL
or I
INH
±1 µA max V
IN
= 0 or V
DD
C
IN
, Digital Input Capacitance 8 pF typ f = 1 MHz
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
180 ns typ R
L
= 300 Ω, C
L
= 35 pF; V
1
= 8 V/0 V, V
2
= 0 V/8 V; see Figure 29
220 350 ns max
Break Before Make Delay, t
OPEN
10 ns typ R
L
= 300 Ω, C
L
= 35 pF; V
S
= 5 V, see Figure 30
t
ON
(EN, WR)
180 ns typ R
L
= 300 Ω, C
L
= 35 pF;
240 350 ns max V
S
= +5 V, see Figure 31
t
OFF
(EN, RS)
135 ns typ R
L
= 300 Ω, C
L
= 35 pF; V
S
= 5 V, see Figure 31
180 220 ns max
ADG426 Only
t
W
, Write Pulse Width 100 ns min
t
S
, Address, Enable Setup Time 100 ns min
t
H
, Address, Enable Hold Time 10 ns min
t
RS
, Reset Pulse Width 100 ns min V
S
= +5 V
Charge Injection 5 pC typ V
S
= 6 V, R
S
= 0 Ω, C
L
= 1 nF; see Figure 34
Off Isolation −75 dB typ R
L
= 1 kΩ, f = 100 kHz; see Figure 35
Channel-to-Channel Crosstalk 85 dB typ R
L
= 1 kΩ, f = 100 kHz; see Figure 36
C
S
(Off) 8 pF typ f = 1 MHz
C
D
(Off) f = 1 MHz
ADG406, ADG426 80 pF typ
ADG407 40 pF typ f = 1 MHz
C
D
, C
S
(On)
ADG406, ADG426 100 pF typ
ADG407 50 pF typ
POWER REQUIREMENTS V
DD
= +13.2 V
I
DD
1 µA typ V
IN
= 0 V, V
EN
= 0 V
5 µA max
I
DD
100 µA typ V
IN
= 0 V, V
EN
= 2.4 V
200 500 µA max
1
Temperature range is −40°C to +85°C.
2
Guaranteed by design, not subject to production test.
