Electrical specifications VNQ5027AK-E
10/31 Doc ID 12730 Rev 7
Table 8. Current Sense (8V<V
CC
<16V)
Symbol Parameter Test conditions Min. Typ. Max. Unit
K
0
I
OUT
/I
SENSE
I
OUT
= 0.5A;
V
SENSE
= 0.5 V; V
CSD
=0 V;
T
j
= -40°C...150°C
1680 2910 4120
dK
0
/K
0
(1)
Current sense ratio drift
I
OUT
= 0.5A; V
SENSE
= 0.5V;
V
CSD
= 0V;
T
J
= -40 °C to 150 °C
-12 12 %
K
1
I
OUT
/I
SENSE
I
OUT
= 2A;
V
SENSE
= 4 V; V
CSD
=0 V;
T
j
= -40°C...150°C
T
j
= 25°C...150°C
2050
2190
2700
2700
3410
3210
dK
1
/K
1
(1)
Current sense ratio drift
I
OUT
= 2A; V
SENSE
= 4V;
V
CSD
= 0V;
T
J
= -40 °C to 150 °C
-10 10 %
K
2
I
OUT
/I
SENSE
I
OUT
= 3A;
V
SENSE
= 4 V; V
CSD
=0 V;
T
j
= -40°C...150°C
T
j
= 25°C...150°C
2260
2350
2690
2690
3160
3030
dK
2
/K
2
(1)
Current sense ratio drift
I
OUT
= 3A; V
SENSE
= 4V;
V
CSD
= 0V;
T
J
= -40 °C to 150 °C
-7 7 %
K
3
I
OUT
/ I
SENSE
I
OUT
= 10A;
V
SENSE
= 4 V; V
CSD
= 0 V;
T
j
= -40°C...150°C
T
j
= 25°C...150°C
2490
2590
2700
2700
2870
2800
dK
3
/K
3
(1)
Current sense ratio drift
I
OUT
= 10A; V
SENSE
= 4 V;
V
CSD
= 0V;
T
J
= -40 °C to 150 °C
-4 4 %
I
SENSE0
Analog sense leakage current
I
OUT
= 0A; V
SENSE
= 0V;
V
CSD
= 5V; V
IN
= 0V;
T
j
= -40°C...150°C
V
CSD
= 0V; V
IN
= 5V;
T
j
= -40°C...150°C
I
OUT
= 2A; V
SENSE
= 0V;
V
CSD
= 5V; V
IN
= 5V;
T
j
= -40°C...150°C
0
0
0
1
2
1
µA
µA
µA
I
OL
open load on-state current
detection threshold
V
IN
= 5V, I
SENSE
= 5 µA 5 30 mA
V
SENSE
Max analog sense
output voltage
I
OUT
= 3A; V
CSD
= 0V 5 V
VNQ5027AK-E Electrical specifications
Doc ID 12730 Rev 7 11/31
V
SENSEH
Analog sense output voltage in
over temperature condition
V
CC
= 13V; R
SENSE
= 3.9KΩ 9V
I
SENSEH
Analog sense output current in
over temperature condition
V
CC
= 13V; V
SENSE
= 5V 8 mA
t
DSENSE1H
Delay response time from
falling edge of CS_DIS pin
V
SENSE
<4V, 0.5A<Iout<10A
I
SENSE
= 90% of I
SENSE
max
(see Figure 4.)
50 100 µs
t
DSENSE1L
Delay response time from
rising edge of CS_DIS pin
V
SENSE
<4V, 0.5A<Iout<10A
I
SENSE
=10% of I
SENSE
max
(see Figure 4.)
520µs
t
DSENSE2H
Delay response time from
rising edge of INPUT pin
V
SENSE
<4V, 0.5A<Iout<10A
I
SENSE
=90% of I
SENSE
max
(see Figure 4.)
70 300 µs
Δ
t
DSENSE2H
Delay response time between
rising edge of output current
and rising edge of current
sense
V
SENSE
<4V,
I
SENSE
= 90% of I
SENSEMAX,
I
OUT
= 90% of I
OUTMAX
I
OUTMAX
=2A (see Figure 5)
200 µs
t
DSENSE2L
Delay response time from
falling edge of input pin
V
SENSE
<4V, 0.5A<Iout<10A
I
SENSE
=10% of I
SENSE
max
(see Figure 4.)
100 250 µs
1. Parameter guaranteed by design; it is not tested.
Table 8. Current Sense (8V<V
CC
<16V) (continued)
Symbol Parameter Test conditions Min. Typ. Max. Unit
Table 9. Protection
(1)
1. To ensure long term reliability under heavy overload or short circuit conditions, protection and related
diagnostic signals must be used together with a proper software strategy. If the device is subjected to
abnormal conditions, this software must limit the duration and number of activation cycles.
Symbol Parameter Test conditions Min. Typ. Max. Unit
I
limH
DC short circuit current
V
CC
=13V
5V<V
CC
<36V
29 42 59
59
A
A
I
limL
Short circuit current
during thermal cycling
V
CC
=13V; T
R
<T
j
<T
TSD
16 A
T
TSD
Shutdown temperature 150 175 200 °C
T
R
Reset temperature T
RS
+ 1 T
RS
+ 5 °C
T
RS
Thermal reset of
STATUS
135 °C
T
HYST
Thermal hysteresis
(T
TSD
-T
R
)
C
V
DEMAG
Turn-off output voltage
clamp
I
OUT
= 2A; V
IN
=0; L=6mH V
CC
-41 V
CC
-46 V
CC
-52 V
V
ON
Output voltage drop
limitation
I
OUT
=0.2A; T
j
=-40°C...150°C
(see Figure 9.)
25 mV
Electrical specifications VNQ5027AK-E
12/31 Doc ID 12730 Rev 7
Figure 4. Current sense delay characteristics
Table 10. Logic input
Symbol Parameter Test conditions Min. Typ. Max. Unit
V
IL
Input low level voltage 0.9 V
I
IL
Low level input current V
IN
= 0.9V 1 µA
V
IH
Input high level voltage 2.1 V
I
IH
High level input current V
IN
= 2.1V 10 µA
V
I(hyst)
Input hysteresis voltage 0.25 V
V
ICL
Input clamp voltage
I
IN
= 1mA
I
IN
= -1mA
5.5
-0.7
7V
V
V
CSDL
CS_DIS low level voltage 0.9 V
I
CSDL
Low level CS_DIS current V
CSD
=0.9V 1 µA
V
CSDH
CS_DIS high level voltage 2.1 V
I
CSDH
High level CS_DIS current V
CSD
=2.1V 10 µA
V
CSD(hyst)
CS_DIS hysteresis voltage 0.25 V
V
CSCL
CS_DIS clamp voltage
I
CSD
= 1mA
I
CSD
= -1mA
5.5
-0.7
7V
V
SENSE CURRENT
INPUT
LOAD CURRENT
CS_DIS
t
DSENSE2H
t
DSENSE2L
t
DSENSE1L
t
DSENSE1H

VNQ5027AK-E

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
Gate Drivers Quad Ch HiSide Drivr
Lifecycle:
New from this manufacturer.
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