AR0130CS
www.onsemi.com
21
Row−wise Noise Correction
Row (Line)−wise Noise Correction is handled
automatically by the image sensor. No adjustments are
provided except to enable or disable this feature. Clearing
R0x3044[10] disables the row noise correction. Default
setting is for row noise correction to be enabled.
Row−wise noise correction is performed by calculating an
average from a set of optically black pixels at the start of
each line and then applying each average to all the active
pixels of the line.
Column Correction
The AR0130 uses column parallel readout architecture to
achieve fast frame rate. Without any corrections, the
consequence of this architecture is that different column
signal paths have slightly different offsets that might show
up on the final image as structured fixed pattern noise.
AR0130 has column correction circuitry that measures
this offset and removes it from the image before output. This
is done by sampling dark rows containing tied pixels and
measuring an offset coefficient per column to be corrected
later in the signal path.
Column correction can be enabled/disabled via
R0x30D4[15]. Additionally, the number of rows used for
this offset coefficient measurement is set in R0x30D4[3:0].
By default this register is set to 0x7, which means that 8 rows
are used. This is the recommended value. Other control
features regarding column correction can be viewed in the
AR0130 Register reference. Any changes to column
correction settings need to be done when the sensor
streaming is disabled and the appropriate triggering
sequence must be followed as described below.
Column Correction Triggering
Column correction requires a special procedure to trigger
depending on which state the sensor is in.
Column Triggering on Startup
When streaming the sensor for the first time after
power−up, a special sequence needs to be followed to make
sure that the column correction coefficients are internally
calculated properly.
1. Follow proper power up sequence for power
supplies and clocks
2. Apply sequencer settings if needed
3. Apply frame timing and PLL settings as required
by application
4. Set analog gain to 1x and low conversion gain
5. Enable column correction and settings
6. Disable auto re−trigger for change in conversion
gain or col_gain, and enable column correction
always. (R0x30BA = 0x0008).
7. Enable streaming (R0x301A[2] = 1) or drive the
TRIGGER pin HIGH.
8. Wait 9 frames to settle. (First frame after coming
up from standby is internally column correction
disabled.)
9. Disable streaming (R0x301A[2] = 0) or drive the
TRIGGER pin LOW.
After this, the sensor has calculated the proper column
correction coefficients and the sensor is ready for streaming.
Any other settings (including gain, integration time and
conversion gain etc.) can be done afterwards without
affecting column correction.
Column Correction Retriggering Due to Mode Change
Since column offsets is sensitive to changes in the analog
signal path, such changes require column correction
circuitry to be retriggered for the new path. Examples of
such mode changes include: horizontal mirror, vertical
mirror, changes to column correction settings.
When such changes take place, the following sequence
needs to take place:
1. Disable streaming (R0x301A[2]=0) or drive the
TRIGGER pin LOW.
2. Enable streaming (R0x301A[2]=1) or drive the
TRIGGER pin HIGH.
3. Wait 9 frames to settle.
NOTE: The above steps are not needed if the sensor is
being reset (soft or hard reset) upon the mode
change.
Test Patterns
The AR0130 has the capability of injecting a number of
test patterns into the top of the datapath to debug the digital
logic. With one of the test patterns activated, any of the
datapath functions can be enabled to exercise it in a
deterministic fashion. Test patterns are selected by
Test_Pattern_Mode register (R0x3070). Only one of the test
patterns can be enabled at a given point in time by setting the
Test_Pattern_Mode register according to Table 7. When test
patterns are enabled the active area will receive the value
specified by the selected test pattern and the dark pixels will
receive the value in Test_Pattern_Green (R0x3074 and
R0x3078) for green pixels, Test_Pattern_Blue (R0x3076)
for blue pixels, and Test_Pattern_Red (R0x3072) for red
pixels.
NOTE: Turn off black level calibration (BLC) when
Test Pattern is enabled.
Table 7. TEST PATTERN MODES
Test_Pattern_Mode Test Pattern Output
0 No test pattern (normal operation)
1 Solid color test pattern
2 100% color bar test pattern
3 Fade−to−gray color bar test pattern
256 Walking 1s test pattern (12−bit)
Color Field
When the color field mode is selected, the value for each
pixel is determined by its color. Green pixels will receive the
value in Test_Pattern_Green, red pixels will receive the