Mode, Log, and VPD Pages
Table 21: Supported Mode Pages
Mode Page Code Sub-Page Code Mode Page Name
01h Read-Write error recovery
02h Disconnect-reconnect
07h Verify error recovery
08h Caching
0Ah Control
19h Protocol specific port
1Ah 01h Power consumption
1Ch Informational exceptions control
Table 22: Supported Log and VPD Pages (Log Sense – 4Dh Command)
Log Page Code (Hex) Log Page Name
0F Application client log page
15 Background scan results log page
01 Buffer over-run/under-run page
37 Cache statistics page
3E Factory log page
2F Information exceptions log page
0B Last n differed errors or async event page
07 Last n error events page (07h)
06 Non-medium error page
00 Page support list
1A Power conditions transitions page
18 Protocol-specific port log page
03 Read error counter page
04 Read reverse error counter page
10 Selt-test results page
11 Solid state media log page
0E Start-stop cycle counter page
0D Temperature page
38 Vendor unique page
3C Vendor unique page
05 Verify error counter page
02 Write error counter page
Preliminary
S600DC Series 1.8-Inch SAS NAND Flash SSD
Mode, Log, and VPD Pages
PDF: 09005aef86470b9b
s600dc_series_1_8_sas_ssd.pdf - Rev. F 3/16 EN
19
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.
Table 23: Internal Drive Characteristics
Characteristic Decription
Memory type NAND Flash MLC
Emulated LBA size (bytes) 512
520
524
528
4096
4160
4192
4224
Native programmable Page size = 8192 user bytes
Map unit size = 4096
Default transfer Alignment offset = 0
Preliminary
S600DC Series 1.8-Inch SAS NAND Flash SSD
Mode, Log, and VPD Pages
PDF: 09005aef86470b9b
s600dc_series_1_8_sas_ssd.pdf - Rev. F 3/16 EN
20
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.
Reliability
A Micron SSD incorporates advanced technology for defect and error management, us-
ing various combinations of hardware-based error correction algorithms and firmware-
based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that the device reports as successfully programmed, but when read, the
data differs from what was programmed.
The following reliability specifications assume correct host and drive operational inter-
face, including all interface timings, power supply voltages, environmental require-
ments, and drive mounting constraints.
Table 24: Uncorrectable Bit Error Rate
Read Error Rates READ Operation
Less than 1 LBA in 10
17
bits transferred Unrecovered READ
Less than 1 LBA in 10
21
bits transferred Mis-corrected READ
Note:
1. Error rate specified with automatic retries and data correction with ECC enabled and all
flaws reallocated.
Mean Time Between Failures
SSD mean time to failure (MTTF) and mean time between failures (MTBF) are predicta-
ble based on component reliability data using methods referenced in the Telcordia
SR-332 reliability prediction procedures for electronic equipment.
Table 25: MTBF
Density MTBF (Million Hours) Failure Rate (% per-Year)
400GB 2.5 0.35
800GB 2.5 0.35
Preliminary
S600DC Series 1.8-Inch SAS NAND Flash SSD
Reliability
PDF: 09005aef86470b9b
s600dc_series_1_8_sas_ssd.pdf - Rev. F 3/16 EN
21
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2015 Micron Technology, Inc. All rights reserved.

MTFDJAA400MBS-1AN1ZABYY

Mfr. #:
Manufacturer:
Micron
Description:
SSD 400GB 1.8" MLC SATA III
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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